Strong structure factors at low spatial frequencies can lead to CTF determination bias. Direct CTF determination at high frequency using the ‘1S2R’ procedure might fail in the case of large astigmatism due to severe oscillation of CTF. Two options are provided to deal with CTF determination at near-atomic resolution for micrographs that have very large astigmatism. They both make the ‘1S2R’ procedure more robust in such challenging case. One option is ‘resolution–extension (RE)’ and the other is ‘Bfactor-switch (BS)’. In the first method, Gctf determines initial CTF parameters using a relatively lower resolution ring (e.g. 50–10 Å by default). These parameters are passed as input to the next step of CTF refinement using a higher range (e.g. 15–4 Å). In the second method, Gctf uses a larger Bfactor (e.g. 500 Å2) to significantly down-weight high frequency for initial CTF determination. Then it switches to a smaller Bfactor (e.g. 50 Å2) to refine the previously determined CTF parameters. Either method shows its power to deal with some challenging cases (detailed results in Section 3.5 ). The combination (‘REBS’) can even work slightly better in certain cases.
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