For the experiments
reported, we used a copper 100 Mesh PELCO grid. The grid was tilted
by 45° with respect to the
z direction (parallel
to the TEM column axis) in order to expose the corner of a rectangular
copper rod with a cross section of ∼50 × 25 μm
2 (see
Figure S1 in SI). The edge
of the rod corner exhibited a radius of curvature of 4 μm, as
estimated from SEM micrographs. The sample was positioned such that
only one of the edges of the rectangular rod was illuminated by the
laser pulse.
To generate the charged plasma, we irradiated the
copper rod with near-infrared laser pulses of 1.55 eV central photon
energy (800 nm) and 50 fs temporal duration at a repetition rate of
100 kHz, which corresponds to ≃2.5 TW/cm
2. In the
reported experiments, light polarization was vertical (i.e., along
the propagation direction of the probe electron). Light entered the
microscope through the zero-angle port and was focused under normal
incidence on the copper rod via an external plano-convex lens. In
such a geometry, the light beam was also perpendicular with respect
to the electron propagation direction.
The dynamics of the photoemitted
electrons was then probed by means
of electron pulses with a temporal duration of about 600 fs and with
a controlled delay between electron and laser pulses. All the experiments
were performed in a modified JEOL 2100 TEM microscope at an acceleration
voltage of 200 kV.
42 (link),43 (link) The probe electrons were generated
by illuminating a LaB
6 cathode with third-harmonics UV
light at 4.65 eV photon energy.
Our transmission electron microscope
was equipped with EELS capabilities
coupled to real-space imaging. Energy-resolved spectra were recorded
using a Gatan-Imaging-Filter (GIF) camera operated with a 0.05 eV-per-channel
dispersion setting and typical exposure times of the CCD sensor from
30 to 60 s. For the acquisition of space-energy maps (see
Figure 3), special care was
devoted to sample alignment. The copper rod was adjusted to be parallel
to the energy dispersion direction and placed at the edge of the spectrometer
entrance aperture.
The acquired position-dependent spectra were
analyzed as a function
of delay between the laser and electron pulses, with the time zero
being determined as the peak of PINEM signal observed within 100 nm
close to the sample surface at relatively low fluence (≃50
mJ/cm
2). Camera noise and signal from cosmic events were
reduced by applying median filtering. Distortions of the spectrometer
were corrected by aligning the spectrum according to the negative
delay energy-space spectrographs (−2 ps). The first and second
moments of the spectrum were calculated in a reduced energy window,
which was taken 10 eV larger than the region in which the electron
signal was above 10% of the peak value (i.e., the maximum value among
all delays and positions measured for a given fluence). This procedure
helped to reduce contributions from the CCD background noise.
Regarding sample stability, special care was taken to ensure experimentally
reproducible results and a controlled environment. Standard TEM grids
from the same batch were used for all the experiments. The oxide layer
was removed from the surface by washing the grids in acetic acid for
approximately 5 min. Among other reasons, relatively fine-pitch grids
were selected to avoid resonant vibrations due to a large periodic
thermal load. In experiments, the smearing of the sample edge did
not exceed the resolution of ≃50 nm defined by the magnification
settings and aberrations in the photoelectron mode of TEM operation.
At the highest measured fluence, we observed a degradation of the
signal of the order of ≃10% of the peak acceleration over 2
h of experimental time. We made sure to expose a fresh part of the
sample to laser illumination at least every 60 min. Sample edge images
were realigned for each measurement during data analysis. At fluences
above 500 mJ/cm
2, we observed ablation of the sample on
a time scale of several minutes.
Madan I., Dias E.J., Gargiulo S., Barantani F., Yannai M., Berruto G., LaGrange T., Piazza L., Lummen T.T., Dahan R., Kaminer I., Vanacore G.M., García de Abajo F.J, & Carbone F. (2023). Charge Dynamics Electron Microscopy: Nanoscale Imaging of Femtosecond Plasma Dynamics. ACS Nano, 17(4), 3657-3665.