Assimilation rates of carbon and ammonia by individual cable bacterium filaments were quantified by stable isotope probing combined with nano-scale secondary ion mass spectrometry (nanoSIMS). Parallel sediment cores with an active cable bacteria population were injected with a combination of 13C-bicarbonate (13C-DIC) and 15N-ammonia (15NH4+) to target assimilation of inorganic carbon and ammonia, and with a combination of 13C-propionate and 15NH4+ to target assimilation of organic carbon and ammonia. After 24 h of incubation, individual filaments were hand-picked from the oxic and suboxic zone of the sediment cores and analyzed by nanoSIMS. The nanoSIMS data were processed by Look@NanoSIMS (40 (link)) to determine the 13C-enrichment, 15N-enrichment, and relative phosphorus content (quantified as the 31P/[12C+13C] ion count ratio) of the individual cable bacteria. Additionally, porewater from the sediment cores was extracted and analyzed for the DIC and NH4+ concentrations and for the 13C-labeling of the DIC pool. Using modeling, these data were finally converted to the assimilation rates of inorganic and organic carbon.
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Spectrometry, Mass, Secondary Ion
Spectrometry, Mass, Secondary Ion
Spectrometry, Mass, Secondary Ion is a powerful analytical technique used to study the composition and structure of materials at the atomic and molecular level.
It involves the use of a focused beam of charged particles, typically ions, to bombard a sample surface, causing the ejection of secondary ions that are then analyzed by a mass spectrometer.
This method provides highly sensitive and specific information about the chemical makeup and distribution of elements, molecules, and isotopes within a sample, making it a valuable tool for a wide range of research applications, including materials science, biology, and geology.
The technique's ability to provide detailed, high-resolution data on complex samples has made it an indispensable part of many scientific disciplines.
It involves the use of a focused beam of charged particles, typically ions, to bombard a sample surface, causing the ejection of secondary ions that are then analyzed by a mass spectrometer.
This method provides highly sensitive and specific information about the chemical makeup and distribution of elements, molecules, and isotopes within a sample, making it a valuable tool for a wide range of research applications, including materials science, biology, and geology.
The technique's ability to provide detailed, high-resolution data on complex samples has made it an indispensable part of many scientific disciplines.
Most cited protocols related to «Spectrometry, Mass, Secondary Ion»
Ammonia
Bacteria
Carbon
Cytoskeletal Filaments
Ion, Bicarbonate
Isotopes
Phosphorus
Propionate
Spectrometry, Mass, Secondary Ion
Time of flight secondary ion mass spectrometry was performed on a TOF.SIMS 5 (ION-TOF, Germany) instrument. 25 kV Bi+ and Bi3++ were used as primary ions in different operation modes. The novel CBA mode and the related CBA-burst mode are compared to the BA and BA-burst mode. In both burst modes, 8 ion pulses were analyzed. Areas of 12 μm × 12 μm to 150 μm × 150 μm were investigated using a raster of 256 × 256 or 512 × 512 measured points. Negative secondary ions were analyzed and detailed information on the settings is provided with the particular application examples. For depth profiling and ablation of the surface, 2 kV Cs+ ions (500 μm × 500 μm, ca. 120 nA) were employed. For charge compensation, a low energy electron flood gun (20 V) was used.
Electrons
Floods
Ions
Pulses
Spectrometry, Mass, Secondary Ion
Fresh, glassy samples of magmatic tephra were collected at regular intervals during the Holuhraun eruption. The ten samples selected for this study span the entire course of the eruption (Fig. 1 ; Table 1 ). Nine samples consist of proximal tephra fall collected near the main eruptive vent, and are known to have erupted within 2 days of the date of collection. The tenth sample consists of glassy scoria clasts from the flanks of Baugur that were likely deposited up to 2 weeks prior to the date of collection.
Volatile (H2O, F, and Cl), light lithophile, trace and rare-earth elements were analysed in 99 melt inclusion glasses (88 hosted in plagioclase, 7 in olivine, and 4 in clinopyroxene), 2 glassy embayments, and 13 matrix glasses (Table1 ) by secondary ion mass spectrometry (SIMS) using the Cameca ims-4f instrument at the University of Edinburgh. CO2 was also measured prior to performing the trace element analyses. Precision and accuracy for the trace element analyses were monitored by repeat analyses of standards NIST-SRM610, BCR-2G, KL2-G, and GSD-1G. 1σ accuracy was consistently 10% or better. Precision was generally better than ± 2% for trace elements in high abundance (e.g., La, Sr, and Zr) and ± 10% for trace elements in low abundance (e.g., Yb and Lu). Following SIMS analyses, major, minor, and volatile (S and Cl) elements in the same inclusions were measured by electron microprobe (EPMA) using the Jeol JXA-8230 Superprobe at the University of Iceland. Volatile systematics and degassing behaviour of the Holuhraun magma are discussed in detail by Bali et al. (2018 ). Full details of analytical methods and compositional data are provided as supplementary material.
Tephra samples from the 2014–2015 Holuhraun eruption analysed in this study
| Sample | Date of collection | Host macrocrysts | Melt inclusions | Embayments | Matrix glasses |
|---|---|---|---|---|---|
| H14 | 31 Aug 2014 | plg, olv | 39 (+ 5) | 1 (+ 1) | 3 (+ 2) |
| JG-040914-02 | 04 Sep 2014 | plg | 3 | 1 | |
| WM-1498-1 | 08 Sep 2014 | plg | 8 | 1 | |
| JAS-130914-001 | 13 Sep 2014 | plg, olv, cpx | 13 (+ 3) | 1 | 1 |
| AH-170914 | 17 Sep 2014 | plg | 3 | 2 | |
| CJG-230914-01 | 23 Sep 2015 | plg | 6 | ||
| ÞÞJIJ-081014-02 | 08 Oct 2014 | plg | 8 | 1 | |
| MSR-291014-3 | 20 Oct 2014 | plg | 2 | ||
| MSR-121114 | 12 Nov 2014 | plg | 4 | 1 | |
| EI-220115-01 | 22 Jan 2015 | plg, olv | 15 | 1 | |
| Total | 99 (+ 8) | 2 (+ 1) | 13 (+ 2) |
For each sample, the melt inclusion-bearing host macrocryst phases are indicated alongside the number of melt inclusions, embayments and matrix glasses analysed by SIMS. Numbers in parentheses show repeat analyses used to assess melt inclusion homogeneity and monitor analytical reproducibility
Volatile (H2O, F, and Cl), light lithophile, trace and rare-earth elements were analysed in 99 melt inclusion glasses (88 hosted in plagioclase, 7 in olivine, and 4 in clinopyroxene), 2 glassy embayments, and 13 matrix glasses (Table
Electrons
Epoxy Resins
Exanthema
Eyeglasses
Inclusion Bodies
Light
Metals, Rare Earth
olivine
plagioclase
sodium polymetaphosphate
Spectrometry, Mass, Secondary Ion
Trace Elements
Two phytoplankton species (T. pseudonana and Synechococcus sp. WH8102) were grown axenically in the laboratory under enriched Na213CO3 conditions in artificial seawater F/2 media without unlabeled inorganic carbon. The F/2 media was sparged overnight with N2, autoclave sterilized, and amended with algal vitamins (40 mg thiamine-HCl, 20 mg biotin, and 20 mg cobalamin per 250 mL). A total of 1 mL stock culture of each phytoplankton was transferred to a 250-mL culture flask of medium with either Na213CO3 or unlabeled Na2CO3 (used to monitor growth) added to the F/2 medium via stirring to 3-mM final concentration. Diatom and cyanobacterial cells were grown at 22 °C with the bottle sealed from the atmosphere under continuous light until late exponential phase (optical density at 600 nm of 0.2 and 0.1 after 150 and 200 h, respectively), whereupon the 13C-labeled cultures were centrifuged at 5,000 × g for 15 min. Supernatant was collected and sparged by bubbling with air, filter sterilized at 0.1 µm, and frozen at –80 °C (exudate). Cell pellets were rinsed and resuspended in sterile distilled and deionized water, freeze-thawed three times, sonicated, then centrifuged at 5,000 × g for 15 min. Supernatant was collected and frozen at –80 °C (lysate). Phytoplankton cells from the labeled cultures were confirmed to be >80% 13C using Lawrence Livermore National Lab’s nanoscale secondary ion mass spectrometry (nanoSIMS). In order to amend equal carbon mass to all treatments, DOM carbon content was measured by adding 250 to 750 µL exudate or lysate to 25-mm glass fiber filter membranes (baked for 4 h at 450 °C), allowing to dry overnight, then adding 250 µL 10% HCl to each filter and again drying overnight. Nutrient and elemental (CHN) analysis of DOM on filters was conducted by the Marine Science Institute (University of California, Santa Barbara). No measures of molecular weight or stoichiometric composition could be made on DOM, as the total exudate and lysate 13C-biomass was required to amend to mesocosms.
Atmosphere
Biotin
Carbon
Cell Culture Techniques
Cells
Culture Media, Conditioned
Cyanobacteria
Diatoms
Exudate
Freezing
Light
Marines
Nutrients
Pellets, Drug
Phytoplankton
Spectrometry, Mass, Secondary Ion
Sterility, Reproductive
Synechococcus
thiamine hydrochloride
Tissue, Membrane
Vision
Vitamin B12
Vitamins
A phylogenetic microarray designed to target San Francisco Bay microbial communities (Figure S3 , Table S1 ) included probes specific to ribosomal RNA operational taxonomic units (OTUs) as well as more general probes targeting the three domains of life (Bacteria, Archaea, Eukarya), two abundant marine bacterial orders (Alteromonadales and Rhodobacterales) and the genus Polaribacter[21] . Due to the variability in 16S diversity in different parts of the 16S phylogeny, there was no standard % similarity or taxonomic classification (genus, species, strain, etc.) that we could use to describe the lowest phylogenetic level targeted by the array. In general, taxa were targeted at the lowest possible phylogenetic level, subordinate to the genus level. To synthesize the microarrays, glass slides coated with indium-tin oxide (ITO; Sigma-Aldrich, St. Louis, MO, USA) were coated with silane Super Epoxy 2 (Arrayit Corporation, Sunnyvale, CA, USA) to provide a starting matrix for DNA synthesis. Custom-designed microarrays (spot size = 17 µm) were synthesized using a photolabile deprotection strategy [22] on the LLNL Maskless Array Synthesizer (Roche Nimblegen, Madison, WI, USA). Reagents for synthesis were delivered through an Expedite system (PerSeptive Biosystems, Framingham, MA, USA). For array hybridization, RNA samples (1 µg) in 1X Hybridization buffer (Roche Nimblegen, Madison, WI, USA) were placed in Nimblegen X4 mixer slides and incubated inside a Maui hybridization system (BioMicro Systems, Salt Lake City, UT, USA) for 18 hrs at 42°C and subsequently washed according to the manufacturer’s instructions (Roche Nimblegen, Madison, WI, USA). Arrays with fluorescently labeled RNA were imaged with a Genepix 4000B fluorescence scanner (Molecular Devices, Sunnyvale, CA, USA) at pmt = 650 units. Secondary ion mass spectrometry (SIMS) analysis of microarrays hybridized with 15N rRNA was performed at LLNL with a Cameca NanoSIMS 50 (Cameca, Gennevilliers, France). A Cs+ primary ion beam was used to enhance the generation of negative secondary ions. Nitrogen isotopic ratios were determined by electrostatic peak switching on electron multipliers in pulse counting mode, measuring 12C14N− and 12C15N− simultaneously. More details of the instrument parameters are provided elsewhere [21] . Ion images were stitched together and processed to generate isotopic ratios with custom software (LIMAGE, L. Nittler, Carnegie Institution of Washington). Isotopic ratios were converted to delta (permil) values using δ = [(Rmeas/Rstandard) –1]×1000, where Rmeas is the measured ratio and Rstandard is the ratio measured in unhybridized locations of the sample. All fluorescence and NanoSIMS data have been deposited to NCBI’s Gene Expression Omnibus archive under record number GSE56119.
Acid Hybridizations, Nucleic
Anabolism
Archaea
Bacteria
Buffers
DNA Replication
Electrons
Electrostatics
Epoxy Resins
Eukaryota
Fluorescence
Gene Expression
indium tin oxide
Isotopes
Marines
Medical Devices
Microarray Analysis
Microbial Community
Nitrogen Isotopes
Pulse Rate
Ribosomal RNA
Silanes
Sodium Chloride
Spectrometry, Mass, Secondary Ion
Strains
Most recents protocols related to «Spectrometry, Mass, Secondary Ion»
Scanning electron microscopy (SEM) images were taken on a Hitachi S4800 field emission system at the acceleration voltage of 3 kV. X-ray diffraction (XRD) was measured on an X’Pert PRO diffractometer (PANalytical) using Cu Kα1 radiation with an X-ray wavelength of 1.5406 Å. Raman spectroscopy was performed using a confocal Raman microscope (Senterra, BRUKER) and a Renishaw Invia system with a 532-nm laser. A focused ion beam (Helios 450HP FIB) was used to prepare cross-sectional samples for transmission electron microscopy (TEM) examination. TEM images were acquired on a Hitachi H-9500 instrument operating at 300 kV. X-ray photoelectron spectroscopy (XPS) was performed with a PHI 5000C ESCA System operated at 14.0 kV, and all binding energies were referenced to the C 1 s neutral carbon peak at 284.6 eV. Scanning tunneling microscopy (STM) experiments were carried out in an ultrahigh vacuum (UHV) low-temperature (~ 77 K) STM system (UNISOKU USM-1500S). The STM topography was typically taken with a sample bias V = − 100 mV and a setpoint current I = 200 pA. Scanning transmission electron microscopy (STEM) and energy-dispersive X-ray mapping (EDX) were taken using a spherical aberration-corrected transmission electron microscope (Titan Chemi STEM). Wide-angle X-ray scattering (WAXS) and small-angle X-ray scattering (SAXS) measurements were carried out in the 14b beamline of the Shanghai Synchrotron Radiation Facility in Shanghai, Republic of China. Thin-film samples were transferred to silicon wafer substrates for measurement. The water contact angle was measured by a contact angle and surface tension measuring instrument (1008360Q). Thermogravimetric Analysis (TGA) was carried out in air or nitrogen at the heating rate of 10 °C min−1 (Perkin-Elmer Pyris). Electron mobilities were determined using a Hall effect measurement system (Lakeshore 7604). The time-of-flight secondary ion mass spectrometry (ToF–SIMS) characterization was tested by PHI nanoTOF II Time-of-Flight SIMS equipped with GCIB Gun to sputter. The Fourier transform infrared (FTIR) spectrometer was tested by Nicolet 6700.
The electrical properties, such as temperature coefficient of resistance, were measured using a current source (Keithley 6221) and an oscilloscope (Tektronix DPO 3052 Digital Phosphor Oscilloscope). A Janis closed cycle refrigerator (CCR) system was employed to provide a stable and reliable environmental temperature from 320 to 7 K. Hall mobility was tested on a Nanometrics HL5500 Hall system using a van der Pauw configuration at room temperature. Thermal conductivity was measured using Netzsch NanoFlash LFA 467 instrument.
The electrical properties, such as temperature coefficient of resistance, were measured using a current source (Keithley 6221) and an oscilloscope (Tektronix DPO 3052 Digital Phosphor Oscilloscope). A Janis closed cycle refrigerator (CCR) system was employed to provide a stable and reliable environmental temperature from 320 to 7 K. Hall mobility was tested on a Nanometrics HL5500 Hall system using a van der Pauw configuration at room temperature. Thermal conductivity was measured using Netzsch NanoFlash LFA 467 instrument.
Acceleration
Carbon
Cold Temperature
Electricity
Electrons
Fingers
Microscopy, Confocal
Microscopy, Scanning Tunneling
Nitrogen-10
Phosphorus
Radiation
Radiography
Range of Motion, Articular
Scanning Electron Microscopy
Scanning Transmission Electron Microscopy
Silicon
Spectrometry, Mass, Secondary Ion
Spectrum Analysis, Raman
Surface Tension
Transmission Electron Microscopy
Vacuum
X-Ray Diffraction
X-Ray Photoelectron Spectroscopy
As shown in Figure 1 , an Al2O3 film was deposited on a Si substrate at 275 °C using PEALD. Substrate included moderately doped p-type Si (1–30 Ω·cm, (100)) with a doping concentration of ~1.3 × 1016 cm−3. Prior to deposition of the Al2O3 layer, Si substrates were cleaned by dipping in a NH4OH:H2O2:H2O mixture (1:1:5 by volume), known as Standard Clean 1 (SC1), for 10 min at 70 °C, followed by dipping in dilute HF (100:1) for 1 min to remove native oxides. For deposition of Al2O3 dielectric, a commercial 200 mm wafer plasma-enhanced vapor deposition (PECVD; Quros Plus 200) was used. As a precursor, Trimethylaluminum (TMA, Al(CH3)3) (Up chemical co. Ltd., Pyeongtaek, Gyeonggi-do, Republic of Korea; 99.9999%) was supplied. For sequential surface reactions, O2 plasma was supplied with TMA. The O2 plasma exposure times were 3 and 7 s. During the deposition, an Al(CH3)3 container temperature of 25 °C, an Ar purge flow rate of 500 sccm, an O2 flow rate of 100 sccm and a chamber pressure of 0.4 mTorr were used. Al electrode with a diameter of 300 µm and an area of 7.06 × 104 µm2 was deposited on the Al2O3 dielectric using an e-beam evaporator. The thickness of the Al2O3 film was measured using transmission electron microscopy (TEM; JEM-2100F; JEOL KOREA LTD., Seoul, Republic of Korea) and ellipsometry (M-2000; J. A. Woollam Co., Anyang, Gyeonggi-do, Republic of Korea). After Al2O3 deposition, H2 plasma treatment and PMA were performed separately depending on the sample (Table 1 ). H2 plasma treatment was performed with a H2 gas flow rate ratio {[H2] = ([H2] + [Ar])} of 0.89 in a PECVD chamber for 15 min. PMA was performed at 400 °C under a N2 gas flow in a furnace for 30 min. The N2 gas flow rate {[N2] = ([N2] + [H2])} was 0.95 (gas pump: 100 sccm; pressure: 0.7 atm). Under the N2 gas flow, the temperature increased from 25 °C to 400 °C in 1 h and then decreased from 400 °C to 25 °C in 2 h. Secondary ion mass spectrometry (SIMS) measurements were conducted on a circular area with a diameter of 33 µm using the Cs+ software. Selective area diffraction pattern (SADP) analysis was carried out to determine crystallinity of the Al2O3 film. The capacitance and conductance were measured using a B1520A multifrequency capacitance measurement unit at various frequencies (1 kHz–1 MHz). The leakage current and breakdown field were measured using a Keithley 4200-SCS instrument (Tektronix KOREA, Seoul, Republic of Korea). Dit (≈2.5(qA)−1( )max) was calculated following the well-known conductance method [15 (link)]:
where q = 1.6 × 1019 C; A is the area of the electrode; ( )max is the normalized parallel conductance peak; is the capacitance in strong accumulation; is the measured capacitance; and is the measured conductance.
where q = 1.6 × 1019 C; A is the area of the electrode; ( )max is the normalized parallel conductance peak; is the capacitance in strong accumulation; is the measured capacitance; and is the measured conductance.
Catabolism
Oxides
Peroxide, Hydrogen
Plasma
Pressure
Spectrometry, Mass, Secondary Ion
Technique, Dilution
Transmission Electron Microscopy
A methanol-based standard mixture of furan and 10 derivatives (each at a concentration of 1 ppm) was added to 10 mL of deionized water, for the evaluation of the separation efficiency by both the HP-WAX and HP-5MS columns. A triple-quadrupole tandem mass spectrometer was employed for the detection by electron-impact ionization mode with the ion source temperature at 230 °C and voltage at 70 eV. With multiple reaction monitoring (MRM) mode, the molecular weight of each furan and its derivatives was set as the precursor ion, while nitrogen was the collision gas at a flow rate of 1.5 mL/min for secondary-ion mass spectroscopy. The molecular ion producing the strongest signal was selected to be the quantitation ion, whereas that producing the second strongest signal was chosen to be the confirmation ion. The first and second quadrupoles of the mass spectrometer were maintained at 150 °C.
derivatives
Electrons
furan
Methanol
Nitrogen
Spectrometry, Mass, Secondary Ion
The Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS) technique was used to perform the molecular analysis of the materials extreme surface studied in this work. The samples analyzed by ToF-SIMS method were: disinfectant solution deposited on aluminum substrate (noted D), pure copper (Cu), Former alloy and New alloy after polishing (0 h) and after 72 h of immersion in the disinfectant solution (D). The purpose of ToF-SIMS analysis was to determine the nature of the chemical compounds present at the extreme surface of the samples. The approach conducted was semi-quantitative. The measurements were performed using a ToF-SIMS IV ION-TOF instrument with a pulsed bismuth (Bi3+, 25 keV) primary ion source at a pressure of ~10−9 mbar controlled by SurfaceLab 6.7 software.
The positive and negative mass spectra of the surface chemical components were collected on a surface of 200 × 200 μm2, with analysis depth of 1–2 nm (the first molecular layer), in three positions. Data acquisition and post-processing were conducted using surface Lab 6.7 software.
The positive and negative mass spectra of the surface chemical components were collected on a surface of 200 × 200 μm2, with analysis depth of 1–2 nm (the first molecular layer), in three positions. Data acquisition and post-processing were conducted using surface Lab 6.7 software.
Alloys
Aluminum
Bismuth
Copper
Mass Spectrometry
Pressure
Spectrometry, Mass, Secondary Ion
Submersion
CZTS powder was synthesized using a mechanochemical method with elemental precursors of Cu, Zn, Sn, and S. First, the CZTS powder was mixed with anhydrous ethanol and ball-milled for 72 h to create a paste with a 20% solid coating. Then, the paste was coated on a substrate using the doctor-blade method and dried. For the densification process, a roll-press machine (WCRP-1015G, Wellcos Corp., Rep. Korea) was used to pass the dried CZTS coating through a pre-gap (resolution: 1 μm) at a speed of 0.2 m/s without heating. The roll compression of the CZTS coating was performed by setting the point where the substrate was not broken to 0 and changing it to the desired thickness (Figure 1 ).
Next, heating was performed at a rate of 2 °C/min to 570 °C and maintained at 570 °C for 30 min in a 2% H2/N2 gas environment. Se vapor was supplied during the heating by placing a mixture of Se and Al2O3 powder in the same chamber for the selenization of CZTS [9 (link)]. A solar cell had a device structure of soda lime glass (SLG)/Mo/CZTSe/CdS/i-ZnO/ZnO:Al/Ni/Al in a sequence. A Mo back electrode layer (~500 nm) was sputtered, and a CdS layer (50 nm) was deposited on the CZTSe film using a chemical bath method. i-ZnO and ZnO:Al layers (50 and 600 nm, respectively) were sputtered, and Ni/Al grid (50 and 500 nm) was thermally evaporated.
Scanning electron microscopy (SEM) images were obtained using Inspect F (FEI, USA) scanning electron microscope with an acceleration voltage of 15 kV, and X-ray diffraction patterns were obtained using D8 Advanced (Brucker Corporation, USA) diffractometer. The depth profiles of unpressed and pressed ZnO/CdS/CZTSe/Mo were analyzed using dynamic secondary ion mass spectrometry (SIMS, IMS 4FE7, Cameca) with a Cs+ ion gun (impact energy of 5.5 keV). Optical bandgaps were measured using UV/Vis transmission spectroscope (Cary 5000). After calibration, the current−voltage (j−V) curves were obtained using a class-AAA solar simulator (Yamashita Denso, YSS-50S). After calibration, external quantum efficiencies (EQEs) were measured using an incident photon-to-current conversion efficiency measurement system (PV Measurements, Inc., Boulder, CO, USA).
Next, heating was performed at a rate of 2 °C/min to 570 °C and maintained at 570 °C for 30 min in a 2% H2/N2 gas environment. Se vapor was supplied during the heating by placing a mixture of Se and Al2O3 powder in the same chamber for the selenization of CZTS [9 (link)]. A solar cell had a device structure of soda lime glass (SLG)/Mo/CZTSe/CdS/i-ZnO/ZnO:Al/Ni/Al in a sequence. A Mo back electrode layer (~500 nm) was sputtered, and a CdS layer (50 nm) was deposited on the CZTSe film using a chemical bath method. i-ZnO and ZnO:Al layers (50 and 600 nm, respectively) were sputtered, and Ni/Al grid (50 and 500 nm) was thermally evaporated.
Scanning electron microscopy (SEM) images were obtained using Inspect F (FEI, USA) scanning electron microscope with an acceleration voltage of 15 kV, and X-ray diffraction patterns were obtained using D8 Advanced (Brucker Corporation, USA) diffractometer. The depth profiles of unpressed and pressed ZnO/CdS/CZTSe/Mo were analyzed using dynamic secondary ion mass spectrometry (SIMS, IMS 4FE7, Cameca) with a Cs+ ion gun (impact energy of 5.5 keV). Optical bandgaps were measured using UV/Vis transmission spectroscope (Cary 5000). After calibration, the current−voltage (j−V) curves were obtained using a class-AAA solar simulator (Yamashita Denso, YSS-50S). After calibration, external quantum efficiencies (EQEs) were measured using an incident photon-to-current conversion efficiency measurement system (PV Measurements, Inc., Boulder, CO, USA).
Absolute Alcohol
Acceleration
Bath
Cells
Copper
Medical Devices
Paste
Physicians
Powder
Scanning Electron Microscopy
soda lime
Spectrometry, Mass, Secondary Ion
Spectrum Analysis
Transmission, Communicable Disease
Vision
X-Ray Diffraction
Top products related to «Spectrometry, Mass, Secondary Ion»
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The TOF.SIMS 5 is a time-of-flight secondary ion mass spectrometer (TOF-SIMS) instrument designed for high-resolution surface analysis. It provides detailed chemical information about the composition and structure of solid surfaces and thin films at the nanoscale level.
Sourced in Germany
The ToF-SIMS IV is a time-of-flight secondary ion mass spectrometer that provides high-resolution chemical analysis of solid surfaces and thin films. It uses a pulsed primary ion beam to generate secondary ions from the sample surface, which are then detected and analyzed by the time-of-flight mass spectrometer.
Sourced in Germany
The TOF.SIMS 5 is a time-of-flight secondary ion mass spectrometry (TOF-SIMS) instrument designed for high-resolution surface analysis. It provides detailed information about the chemical composition and structure of a sample's surface and subsurface layers.
Sourced in United States
WincadenceN is a software application developed by Physical Electronics for data analysis and visualization. The core function of the software is to process and display data obtained from various analytical instruments and techniques.
Sourced in France
The IMS-7f is a secondary ion mass spectrometry (SIMS) instrument designed for high-resolution analysis of solid samples. It provides quantitative elemental and isotopic information with high sensitivity and spatial resolution. The instrument features a primary ion beam, secondary ion extraction, and a mass analyzer to detect and identify the elements present in a sample.
Sourced in United States
The Eksigent nanoLC system is a liquid chromatography instrument designed for high-performance separations of complex samples at nanoscale flow rates. It features precise flow control, high sensitivity, and compatibility with a variety of detection methods.
The ADEPT-1010 is a high-performance analytical instrument designed for surface analysis. It provides comprehensive data on the chemical composition and structure of material surfaces. The ADEPT-1010 utilizes advanced electron beam technology to generate and analyze X-rays, enabling detailed characterization of the sample's elemental content and molecular structure.
Sourced in Germany
The ToF-SIMS 5-100 is a time-of-flight secondary ion mass spectrometry (ToF-SIMS) instrument designed for surface analysis. It is capable of determining the chemical composition and molecular structure of a sample's surface with high sensitivity and high spatial resolution.
Sourced in United States
The NanoToF instrument is a high-performance time-of-flight secondary ion mass spectrometer (ToF-SIMS) designed for nanoscale surface analysis. The core function of the NanoToF is to provide detailed information about the elemental and molecular composition of a sample's surface with high spatial resolution.
Sourced in Germany
The ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) is an analytical instrument designed to provide detailed information about the chemical composition and structure of a sample surface. It operates by bombarding the sample with a focused primary ion beam, which causes the emission of secondary ions from the sample's surface. These secondary ions are then analyzed by a time-of-flight mass spectrometer, allowing for the identification and quantification of the elements and compounds present on the sample's surface.
More about "Spectrometry, Mass, Secondary Ion"
Secondary Ion Mass Spectrometry (SIMS) is a powerful analytical technique that provides highly sensitive and specific information about the chemical composition and structure of materials at the atomic and molecular level.
The technique involves the use of a focused beam of charged particles, typically ions, to bombard a sample surface, causing the ejection of secondary ions that are then analyzed by a mass spectrometer.
SIMS, also known as Time-of-Flight SIMS (ToF-SIMS), is widely used in a variety of research applications, including materials science, biology, and geology.
The technique's ability to provide detailed, high-resolution data on complex samples has made it an indispensable part of many scientific disciplines.
The TOF.SIMS 5 and ToF-SIMS IV are two popular SIMS instruments that offer advanced capabilities for material analysis.
The TOF.SIMS 5 instrument, for example, features a high-resolution mass analyzer and the ability to perform depth profiling and 3D imaging of samples.
The WincadenceN software is often used in conjunction with these instruments to analyze and visualize the data.
Another relevant instrument is the IMS-7f, which is a magnetic sector-based SIMS system that provides high mass resolution and sensitivity for the analysis of trace elements and isotopes.
The Eksigent nanoLC system can be integrated with SIMS instruments to enable the analysis of small, complex samples, such as those found in biological applications.
The ADEPT-1010 is a dedicated SIMS instrument designed for the analysis of semiconductor materials, while the ToF-SIMS 5-100 and NanoToF instruments offer high-performance solutions for nanoscale analysis and imaging.
Overall, Secondary Ion Mass Spectrometery (SIMS) is a powerful and versatile analytical technique that continues to be an essential tool in a wide range of scientific disciplines.
By understanding the capabilities and applications of SIMS, researchers can unlock new insights and identify the optimal protocols and products for their research needs.
The technique involves the use of a focused beam of charged particles, typically ions, to bombard a sample surface, causing the ejection of secondary ions that are then analyzed by a mass spectrometer.
SIMS, also known as Time-of-Flight SIMS (ToF-SIMS), is widely used in a variety of research applications, including materials science, biology, and geology.
The technique's ability to provide detailed, high-resolution data on complex samples has made it an indispensable part of many scientific disciplines.
The TOF.SIMS 5 and ToF-SIMS IV are two popular SIMS instruments that offer advanced capabilities for material analysis.
The TOF.SIMS 5 instrument, for example, features a high-resolution mass analyzer and the ability to perform depth profiling and 3D imaging of samples.
The WincadenceN software is often used in conjunction with these instruments to analyze and visualize the data.
Another relevant instrument is the IMS-7f, which is a magnetic sector-based SIMS system that provides high mass resolution and sensitivity for the analysis of trace elements and isotopes.
The Eksigent nanoLC system can be integrated with SIMS instruments to enable the analysis of small, complex samples, such as those found in biological applications.
The ADEPT-1010 is a dedicated SIMS instrument designed for the analysis of semiconductor materials, while the ToF-SIMS 5-100 and NanoToF instruments offer high-performance solutions for nanoscale analysis and imaging.
Overall, Secondary Ion Mass Spectrometery (SIMS) is a powerful and versatile analytical technique that continues to be an essential tool in a wide range of scientific disciplines.
By understanding the capabilities and applications of SIMS, researchers can unlock new insights and identify the optimal protocols and products for their research needs.