Cameca
47 cited products
268 protocol citations
Cameca is a leading manufacturer of advanced scientific instrumentation and analytical solutions.
The company's product portfolio includes a wide range of electron microscopes, ion probes, and other specialized equipment used in materials science, geology, biology, and a variety of other research disciplines.
Cameca's instruments are renowned for their high performance, precision, and reliability, enabling scientists and researchers to conduct cutting-edge analyses and experiments.
In addition to its hardware offerings, the company also provides complementary software and consumables to support its customers' workflows.
Cameca's technologies have been extensively utilized in academic publications, preprints, and patents, as documented on the PubCompare.ai platform, demonstrating the impact and versatility of the company's research tools across diverse scientific domains.
The company's product portfolio includes a wide range of electron microscopes, ion probes, and other specialized equipment used in materials science, geology, biology, and a variety of other research disciplines.
Cameca's instruments are renowned for their high performance, precision, and reliability, enabling scientists and researchers to conduct cutting-edge analyses and experiments.
In addition to its hardware offerings, the company also provides complementary software and consumables to support its customers' workflows.
Cameca's technologies have been extensively utilized in academic publications, preprints, and patents, as documented on the PubCompare.ai platform, demonstrating the impact and versatility of the company's research tools across diverse scientific domains.
47 products from Cameca
Sourced in France
The NanoSIMS 50L is a high-resolution secondary ion mass spectrometer designed for nanoscale elemental and isotopic analysis. It provides high spatial resolution and high sensitivity detection of a wide range of elements and isotopes. The core function of the NanoSIMS 50L is to enable precise and quantitative analysis of the chemical composition of materials at the nanometer scale.
Sourced in Germany, France
The SX100 is an electron microprobe (EPMA) manufactured by Cameca. It is a versatile and high-performance instrument designed for the analysis of solid materials at the micro-scale. The SX100 provides quantitative elemental analysis and mapping capabilities, allowing for the precise characterization of a wide range of samples.
Sourced in United States
The LEAP 4000X HR is a high-resolution atom probe instrument developed by Cameca. It is designed for advanced materials characterization, providing atomic-scale insights into the composition and structure of various materials.
Sourced in United States
The LEAP 4000X Si is an atom probe tomography instrument designed for high-resolution 3D imaging and chemical analysis of materials at the atomic scale. It utilizes a pulsed laser to evaporate atoms from the surface of a specimen, which are then detected and identified using a time-of-flight mass spectrometer. The instrument provides quantitative, three-dimensional information about the chemical composition and distribution of elements within a sample.
Sourced in France
The LEAP 5000 XR is a state-of-the-art atom probe tomography (APT) system designed for advanced materials analysis. It provides high-resolution, three-dimensional imaging and chemical composition mapping of materials at the atomic scale. The LEAP 5000 XR utilizes a pulsed laser to evaporate and ionize sample atoms, which are then detected and recorded, enabling the reconstruction of the original sample's 3D structure and chemical composition.
Sourced in France
The SX50 electron microprobe is an analytical instrument designed for the elemental analysis of solid materials. It utilizes a focused electron beam to excite characteristic X-rays from the sample, which are then detected and analyzed to determine the chemical composition of the material. The SX50 provides high-resolution imaging and quantitative analysis of a wide range of materials, including metals, ceramics, and geological samples.
IVAS 3.8.4 is a software application developed by Cameca. It provides advanced analysis and visualization capabilities for materials characterization data. The core function of IVAS 3.8.4 is to process and analyze data from various analytical techniques, such as atom probe tomography and electron microscopy.
Sourced in France
The NanoSIMS 50 is a highly sensitive secondary ion mass spectrometry (SIMS) instrument designed for nanoscale elemental and isotopic analysis. It provides high-resolution imaging and quantification of a wide range of elements and their isotopes, with a spatial resolution down to 50 nanometers. The NanoSIMS 50 is capable of delivering precise and accurate data for a variety of applications, including materials science, geochemistry, and life sciences research.
The SX100 electron microprobe is a versatile analytical instrument manufactured by Cameca. It is designed to perform quantitative elemental analysis and mapping of solid samples with high spatial resolution. The SX100 utilizes a focused electron beam to generate X-rays from the sample, which are then analyzed by wavelength-dispersive spectrometers to determine the elemental composition of the material.
Sourced in Netherlands, France
The LEAP 3000X HR is a high-resolution atom probe microscope designed for advanced materials analysis. It provides atomic-scale characterization of the composition and structure of materials. The LEAP 3000X HR enables precise, three-dimensional imaging and chemical analysis of sample volumes at the nanometer scale.
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