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Digital Instruments

58 cited products 348 protocol citations
Digital Instruments is a leading provider of research equipment, consumables, reagents, and software solutions for a wide range of scientific applications.
The company's innovative products are used across diverse fields, including life sciences, material science, environmental analysis, and analytical chemistry.
Digital Instruments specializes in the development and manufacture of high-performance instruments, such as spectroscopy systems, microscopes, and chromatography equipment.
Their portfolio also includes a comprehensive range of reagents, standards, and other consumables tailored to support various experimental protocols.
Additionally, Digital Instruments offers advanced data analysis software and bioinformatics tools, including PubCompare.ai, which helps researchers identify citations for the company's products in publications, preprints, and patents.
This provides valuable insights into the impact and applications of Digital Instruments' solutions within the scientific community.
With a focus on quality, reliability, and technical excellence, Digital Instruments' products are trusted by researchers and scientists around the world to obtain accurate, reproducible results and drive scientific discovery.

58 products from Digital Instruments

Sourced in United States, Italy
The Nanoscope IIIa is a scanning probe microscope that uses atomic force microscopy (AFM) to image and analyze surfaces at the nanoscale. It provides high-resolution topographical information about a sample's surface features.
Cited in 29 protocols
Sourced in United States
The Nanoscope III is a scanning probe microscope that allows for high-resolution imaging and analysis of nanoscale surfaces and structures. It utilizes a cantilever-based detection system to measure the interactions between a sharp probe tip and the sample surface, enabling the acquisition of topographical and material property data at the nanometer scale.
Sourced in United States
The Nanoscope IIIa controller is a core component of Digital Instruments' scanning probe microscopy systems. It provides precise control and data acquisition for scanning probe microscopes, enabling high-resolution imaging and analysis of nanoscale surfaces and structures.
Cited in 17 protocols
Sourced in United States
The Nanoscope V is a scanning probe microscope designed for high-resolution imaging and analysis of surfaces at the nanoscale. It utilizes advanced sensor technology to capture detailed topographical data and provide users with a powerful tool for materials science, nanotechnology, and related fields of research and development.
Sourced in United States
The Nanoscope V controller is a specialized piece of laboratory equipment designed for use with scanning probe microscopes. It serves as the central control unit, providing the necessary power, signals, and data acquisition capabilities to operate the microscope. The Nanoscope V is responsible for managing the scanning and feedback mechanisms that enable high-resolution imaging and analysis of samples at the nanoscale level.
Cited in 12 protocols
Sourced in United States
The Multimode AFM is a versatile scanning probe microscope capable of imaging and characterizing a wide range of samples at the nanoscale. It utilizes atomic force microscopy (AFM) technology to provide high-resolution topographical and material property information.
Sourced in United States
The Nanoscope III controller is a core component of the Nanoscope scanning probe microscopy system. It serves as the central control unit, responsible for synchronizing the various components of the system and managing the scanning and imaging processes. The Nanoscope III controller is designed to provide precise and reliable performance in a wide range of scanning probe microscopy applications.
Sourced in United States
The Dimension 3100 is a scanning probe microscope that provides high-resolution imaging and analysis of surface features at the nanoscale. It is capable of operating in a variety of modes, including atomic force microscopy (AFM) and scanning tunneling microscopy (STM).
Sourced in United States
The Nanoscope IIIa Multimode AFM is a high-resolution scanning probe microscope designed for topographic and nanoscale characterization of surfaces. It utilizes atomic force microscopy (AFM) technology to provide detailed imaging and analysis of samples at the nanometer scale. The core function of this instrument is to enable users to acquire precise, high-quality surface data without interpretation or extrapolation.
Sourced in United States
The Multimode Scanning Probe Microscope is a highly versatile instrument designed for high-resolution imaging and analysis of surface topography. It utilizes a probe to scan the surface of a sample, generating detailed three-dimensional representations of the sample's surface features. The instrument is capable of operating in various scanning modes, enabling users to capture a wide range of data and surface information.
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