ION-TOF
30 cited products
286 protocol citations
ION-TOF is a leading manufacturer of advanced mass spectrometry instrumentation and software solutions.
Their product portfolio includes time-of-flight (TOF) mass spectrometers, secondary ion mass spectrometry (SIMS) systems, and complementary data analysis tools.
These cutting-edge technologies enable researchers across diverse fields, such as materials science, life sciences, and semiconductor manufacturing, to conduct in-depth chemical analysis and characterization of samples at the micro- and nano-scale.
ION-TOF's instruments are widely used in published research, as reflected in the extensive citation data available on PubCompare.ai.
Researchers can explore usage trends, find the latest studies featuring ION-TOF solutions, and quickly identify relevant research leveraging the company's advanced analytical capabilities.
Their product portfolio includes time-of-flight (TOF) mass spectrometers, secondary ion mass spectrometry (SIMS) systems, and complementary data analysis tools.
These cutting-edge technologies enable researchers across diverse fields, such as materials science, life sciences, and semiconductor manufacturing, to conduct in-depth chemical analysis and characterization of samples at the micro- and nano-scale.
ION-TOF's instruments are widely used in published research, as reflected in the extensive citation data available on PubCompare.ai.
Researchers can explore usage trends, find the latest studies featuring ION-TOF solutions, and quickly identify relevant research leveraging the company's advanced analytical capabilities.
30 products from ION-TOF
Sourced in Germany
The TOF.SIMS 5 is a time-of-flight secondary ion mass spectrometer (TOF-SIMS) instrument designed for high-resolution surface analysis. It provides detailed chemical information about the composition and structure of solid surfaces and thin films at the nanoscale level.
Sourced in Germany
The TOF.SIMS 5 is a time-of-flight secondary ion mass spectrometry (TOF-SIMS) instrument designed for high-resolution surface analysis. It provides detailed information about the chemical composition and structure of a sample's surface and subsurface layers.
Sourced in Germany
The ToF-SIMS IV is a time-of-flight secondary ion mass spectrometer that provides high-resolution chemical analysis of solid surfaces and thin films. It uses a pulsed primary ion beam to generate secondary ions from the sample surface, which are then detected and analyzed by the time-of-flight mass spectrometer.
Sourced in Germany, United States
SurfaceLab 6 software is the analysis and data processing interface for ION-TOF's time-of-flight secondary ion mass spectrometry (ToF-SIMS) instruments. It provides tools for data acquisition, processing, and visualization of surface analysis data.
Sourced in Germany
The ToF-SIMS IV is a time-of-flight secondary ion mass spectrometry (ToF-SIMS) instrument designed for high-resolution surface analysis. It is capable of providing detailed information about the chemical composition and structure of surfaces at the nanometer scale.
Sourced in Germany
SurfaceLab 7 is a software suite for the control and analysis of time-of-flight secondary ion mass spectrometry (ToF-SIMS) data. It provides a comprehensive set of tools for the acquisition, processing, and visualization of surface analysis data.
Sourced in Germany
Surface Lab software is a comprehensive data analysis tool developed by ION-TOF for its surface analysis instruments. It provides a suite of functionalities for the processing, visualization, and interpretation of surface analysis data obtained from ION-TOF's analytical equipment.
Sourced in Germany
The ToF-SIMS 5-100 is a time-of-flight secondary ion mass spectrometry (ToF-SIMS) instrument designed for surface analysis. It is capable of determining the chemical composition and molecular structure of a sample's surface with high sensitivity and high spatial resolution.
Sourced in Germany
The ToF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) is an analytical instrument designed to provide detailed information about the chemical composition and structure of a sample surface. It operates by bombarding the sample with a focused primary ion beam, which causes the emission of secondary ions from the sample's surface. These secondary ions are then analyzed by a time-of-flight mass spectrometer, allowing for the identification and quantification of the elements and compounds present on the sample's surface.
Sourced in Germany
The ToF-SIMS V spectrometer is a time-of-flight secondary ion mass spectrometry (ToF-SIMS) instrument designed for surface analysis. It utilizes a pulsed primary ion beam to generate secondary ions from the sample surface, which are then detected and analyzed by a time-of-flight mass analyzer to determine the chemical composition and structure of the sample.
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