NT-MDT
78 cited products
389 protocol citations
NT-MDT is a leading manufacturer of advanced scientific instrumentation and software solutions for materials analysis and characterization.
The company's product portfolio includes a wide range of scanning probe microscopes (SPMs), such as atomic force microscopes (AFMs), scanning tunneling microscopes (STMs), and related accessories and consumables.
These cutting-edge instruments are widely used in research across various fields, including nanotechnology, materials science, life sciences, and semiconductor technology.
In addition to its hardware offerings, NT-MDT also provides specialized software for data acquisition, analysis, and visualization, enabling researchers to gain deeper insights into the structure and properties of their samples.
The company's products are extensively cited across scientific publications, preprints, and patents, underscoring their scientific significance and impact within the research community.
By leveraging PubCompare.ai, users can quickly identify the specific NT-MDT products utilized in relevant research and track citation trends over time, facilitating informed decision-making and collaboration opportunities.
The company's product portfolio includes a wide range of scanning probe microscopes (SPMs), such as atomic force microscopes (AFMs), scanning tunneling microscopes (STMs), and related accessories and consumables.
These cutting-edge instruments are widely used in research across various fields, including nanotechnology, materials science, life sciences, and semiconductor technology.
In addition to its hardware offerings, NT-MDT also provides specialized software for data acquisition, analysis, and visualization, enabling researchers to gain deeper insights into the structure and properties of their samples.
The company's products are extensively cited across scientific publications, preprints, and patents, underscoring their scientific significance and impact within the research community.
By leveraging PubCompare.ai, users can quickly identify the specific NT-MDT products utilized in relevant research and track citation trends over time, facilitating informed decision-making and collaboration opportunities.
78 products from NT-MDT
Sourced in United Kingdom
NTEGRA Spectra is a multi-functional scanning probe microscope (SPM) system designed for advanced materials characterization. The instrument combines atomic force microscopy (AFM), near-field scanning optical microscopy (NSOM), and Raman spectroscopy in a single platform, enabling comprehensive analysis of sample topography, optical properties, and molecular composition.
Sourced in Russian Federation, United States
NTEGRA Prima is a high-performance scanning probe microscope (SPM) system designed for advanced materials research and nanoscale imaging. It offers a comprehensive set of measurement capabilities, including atomic force microscopy (AFM), scanning tunneling microscopy (STM), and advanced spectroscopy techniques. The NTEGRA Prima provides a versatile and reliable platform for researchers to investigate the topography, mechanical, electrical, and magnetic properties of a wide range of samples at the nanoscale.
Solver PRO is a scanning probe microscope (SPM) designed for high-resolution imaging and analysis of surfaces at the nanoscale. It provides precise control and measurement of surface topography, electrical, magnetic, and other properties with atomic-level resolution. The Solver PRO is a versatile instrument suitable for a wide range of applications in materials science, nanotechnology, and life sciences.
The NSG01 is a scanning probe microscope (SPM) designed for high-resolution imaging and analysis of surfaces at the nanoscale. It is capable of operating in various SPM modes, including atomic force microscopy (AFM) and scanning tunneling microscopy (STM), to provide detailed topographical and electronic information about the sample.
NTEGRA is a high-performance scanning probe microscope (SPM) system designed for advanced research and development applications. It offers a modular and flexible platform that can be configured with various SPM modes, including atomic force microscopy (AFM), magnetic force microscopy (MFM), and scanning tunneling microscopy (STM). The core function of NTEGRA is to provide researchers with a versatile tool for high-resolution imaging, surface characterization, and nanoscale analysis.
The NSG 10 is a compact and versatile atomic force microscope (AFM) designed for high-resolution imaging of surfaces at the nanoscale. It features an intuitive user interface and is capable of operating in a variety of imaging modes, including contact, non-contact, and tapping modes. The NSG 10 is well-suited for various applications, including materials science, nanotechnology, and life sciences research.
Sourced in United States, Germany, Russian Federation
The NTEGRA prima AFM is a high-performance atomic force microscope (AFM) designed for advanced surface analysis. It features a modular platform that allows for the integration of various complementary techniques, enabling comprehensive characterization of sample surfaces.
Sourced in Russian Federation
NTEGRA Prima setup is a modular scanning probe microscope (SPM) system designed for high-resolution imaging and analysis of surface structures. It provides a versatile platform for various scanning probe techniques, including atomic force microscopy (AFM) and scanning tunneling microscopy (STM). The NTEGRA Prima setup offers a flexible and customizable solution for nanoscale investigations across a wide range of applications.
Nova software is a data acquisition and processing platform developed by NT-MDT. It serves as the control interface for various NT-MDT laboratory equipment, enabling users to collect, analyze, and manage data generated by these instruments.
The NTEGRA prima atomic force microscope is a research-grade instrument designed for high-resolution imaging and analysis of surface topography at the nanoscale. It utilizes the principles of atomic force microscopy to provide detailed information about the physical characteristics of a wide range of materials and samples.
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