Park Systems
58 cited products
470 protocol citations
Park Systems is a leading provider of advanced scientific instruments and solutions for cutting-edge research and development.
The company's product portfolio includes high-performance atomic force microscopes (AFMs), scanning probe microscopes (SPMs), and related accessories and software.
Park Systems' equipment is widely used in academic and industrial research across diverse fields, including materials science, nanotechnology, life sciences, and semiconductor development.
Their innovative products enable researchers to analyze surface topography, measure physical and chemical properties, and perform nanoscale imaging and characterization with exceptional precision and resolution.
Researchers can explore the citation data and track the documented impact of Park Systems' solutions in scientific publications, patents, and other cutting-edge research applications through the PubCompare.ai platform.
The company's product portfolio includes high-performance atomic force microscopes (AFMs), scanning probe microscopes (SPMs), and related accessories and software.
Park Systems' equipment is widely used in academic and industrial research across diverse fields, including materials science, nanotechnology, life sciences, and semiconductor development.
Their innovative products enable researchers to analyze surface topography, measure physical and chemical properties, and perform nanoscale imaging and characterization with exceptional precision and resolution.
Researchers can explore the citation data and track the documented impact of Park Systems' solutions in scientific publications, patents, and other cutting-edge research applications through the PubCompare.ai platform.
58 products from Park Systems
Sourced in United States, Japan, Germany
The XE-100 is a microscope system designed for high-resolution imaging and surface analysis. It features advanced scanning probe microscopy technology to provide detailed topographical and material property data for a wide range of samples.
Sourced in Denmark, United States
The XEI software is a data acquisition and analysis software developed by Park Systems. It is designed to work seamlessly with Park Systems' atomic force microscopes (AFMs) and provides a user-friendly interface for controlling the instrument, acquiring data, and analyzing the results.
Sourced in United States
The XE-70 is an atomic force microscope (AFM) designed and manufactured by Park Systems. It is a versatile and high-performance instrument used for surface analysis and imaging at the nanoscale level.
The NX10 AFM is an atomic force microscope (AFM) developed by Park Systems. It is a versatile and high-performance instrument designed for nanoscale imaging, measurement, and analysis. The NX10 AFM utilizes a cantilever-based scanning probe technology to provide detailed topographical information about sample surfaces.
Sourced in United States
The XE-100 AFM is an atomic force microscope (AFM) designed and manufactured by Park Systems. It is a powerful tool for high-resolution surface imaging and analysis at the nanoscale level. The XE-100 AFM utilizes a cantilever-based detection system to measure the topography and properties of a sample's surface with angstrom-level precision.
The PPP-NCHR is a lab equipment product from Park Systems. It is a non-contact, high-resolution atomic force microscope (AFM) that can measure nanoscale surface topography and properties.
Sourced in Cameroon
The Park NX10 is a versatile atomic force microscope (AFM) designed for high-resolution surface imaging and analysis. Its core function is to provide nanoscale topographical and material property information about a wide range of sample types.
The XE-150 is an atomic force microscope (AFM) designed for high-resolution imaging and surface analysis. It features a compact and user-friendly design, making it suitable for a variety of research and industrial applications.
The XE-Bio is a versatile laboratory equipment designed for a range of applications. It is capable of performing high-resolution imaging and analysis of biological samples. The core function of the XE-Bio is to enable detailed examination and characterization of various biological specimens.
The NX10 Atomic Force Microscope is a high-resolution imaging and measurement device that uses a sharp probe to scan the surface of a sample. It provides nanoscale topographical and property information about the sample's surface.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!