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Rigaku

890 cited products 9 897 protocol citations
Rigaku is a leading manufacturer of advanced analytical instrumentation for scientific research and industrial applications.
The company's product portfolio includes X-ray diffraction (XRD), X-ray fluorescence (XRF), and other specialized analytical systems designed to meet the evolving needs of researchers and laboratories across diverse fields, such as materials science, geology, chemistry, and life sciences.
Rigaku's instruments are widely used in academic and industrial settings, supporting a wide range of analytical techniques and applications, as evidenced by their extensive citation and adoption across PubCompare's database of scientific protocols.
The company's commitment to innovation and continuous product development ensures that its customers have access to cutting-edge technologies and solutions to optimize their scientific workflows and advance their research endeavors.

890 products from Rigaku

Cited in 822 protocols
Sourced in Japan, United States, Germany, China
The Rigaku Ultima IV is a compact and versatile X-ray diffractometer designed for a wide range of analytical applications. It features a high-performance X-ray generator, advanced optics, and a sophisticated detector system to provide reliable and accurate data. The Ultima IV is capable of performing various types of X-ray diffraction analyses, including phase identification, structural characterization, and quantitative analysis.
Cited in 701 protocols
Sourced in Japan, United States, Germany, United Kingdom, China
The SmartLab is a versatile X-ray diffractometer designed for materials analysis. It features automated alignment and data collection capabilities, providing efficient and reliable performance for a wide range of sample types and research applications.
Cited in 657 protocols
Sourced in Japan, United States, Germany, United Kingdom
The MiniFlex 600 is a benchtop X-ray diffractometer designed for powder X-ray diffraction (XRD) analysis. It is capable of identifying and quantifying various crystalline phases in solid samples. The instrument features a 600 W X-ray source and a high-performance semiconductor detector, providing efficient and reliable data collection.
Cited in 375 protocols
Sourced in Japan, United States
The D/MAX-2500 is a high-performance X-ray diffractometer designed for advanced materials analysis. It features a powerful X-ray source, precise goniometer, and advanced detector technology to provide accurate and reliable data for a wide range of applications.
Cited in 290 protocols
Sourced in Japan, United Kingdom, United States, Germany, China
The Miniflex II is a compact, benchtop X-ray diffractometer (XRD) designed for powder and thin-film sample analysis. It operates using a 600 W X-ray source and provides a 2-theta measurement range of 5-70 degrees. The Miniflex II is capable of conducting qualitative and quantitative phase analysis, as well as crystallite size and lattice parameter determination.
Sourced in Japan, United States
The SmartLab X-ray diffractometer is a versatile laboratory instrument designed for materials analysis. It utilizes X-ray diffraction techniques to provide detailed information about the crystal structure, composition, and physical properties of a wide range of materials. The instrument's core function is to collect and analyze X-ray diffraction data, enabling users to identify unknown materials, quantify the phases present, and study structural changes in samples.
Cited in 194 protocols
Sourced in Japan, United States
The D/MAX-2500/PC is a powerful X-ray diffractometer designed for advanced materials analysis. It features a high-intensity X-ray source and a precision goniometer for accurate sample positioning. The instrument is capable of performing a wide range of X-ray diffraction techniques, including powder and single-crystal analysis, thin-film characterization, and in-situ studies.
Cited in 188 protocols
Sourced in Japan, United States, United Kingdom, Germany
An X-ray diffractometer is a laboratory instrument used to analyze the atomic and molecular structure of materials. It works by directing a beam of X-rays at a sample and measuring the angles and intensities of the diffracted X-rays. This information can be used to determine the crystalline structure of the material.
Cited in 187 protocols
Sourced in United Kingdom, Japan
CrysAlis PRO is a comprehensive software platform designed for X-ray crystallography data collection and processing. It provides a wide range of tools and features to facilitate the analysis of crystal structures, including data collection, integration, and reduction.
Cited in 157 protocols
Sourced in Japan, United States, Germany
The Miniflex is a compact and versatile X-ray diffractometer (XRD) designed for a wide range of applications. It features a small footprint and is capable of performing qualitative and quantitative phase analysis of crystalline materials. The Miniflex provides accurate and reliable data for research, development, and quality control purposes.

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