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Jem 2100f

Manufactured by Thermo Fisher Scientific
Sourced in United Kingdom, Japan

The JEM-2100F is a high-performance transmission electron microscope (TEM) designed for advanced materials characterization. It features a field emission gun (FEG) source, which provides high-brightness and high-resolution imaging capabilities. The JEM-2100F is capable of achieving a resolution of up to 0.19 nm, making it suitable for a wide range of applications in materials science, nanotechnology, and life sciences research.

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26 protocols using jem 2100f

1

Characterization of Silver Nanocrystals

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The phase
purity and electronic structure analyses of the synthesized silver
NCs were performed by using X-ray diffraction (XRD) analysis (Rigaku,
Smartlab) and Fourier transform infrared (FTIR) spectroscopy using
a Bruker Tensor 27. The UV–visible absorption spectra were
recorded using a PerkinElmer Lambda 950 spectrophotometer. The assembly
of silver NCs studies was characterized by HRTEM using JEM-2100F—200
kV and FEI-Tecnai G2, F30—300 kV microscopes. Thermogravimetric
analysis (TGA) was performed under inert (N2 flow) conditions
at the heating rate of 10 °C min–1 (up to 800
°C) by using a PerkinElmer Pyris 6 thermogravimetric analyzer.
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2

Characterization of Nanoparticle Morphology

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The size and morphology of the nanostructures made using different synthesis conditions were assessed by using a JEOL JEM-2100F and a FEI Titan TEM, at the acceleration voltage of 200 kV and 300 kV respectively. Negative staining of the nanoparticles was performed using 2% (w/v) solution of uranyl acetate to reveal the presence of a transferrin corona on the surface of the nanoparticle drop-cast on 300 mesh copper grids (Agar Scientific), coated with holey carbon film. The nanoparticles' hydrodynamic diameter was measured in suspension by Dynamic Light Scattering (DLS, Malvern Zetasizer Nano) at 25 °C.
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3

Multi-Technique Characterization of Materials

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Differential scanning calorimetry thermogravimetric (DSC/TG) curves were obtained in air at a heating rate of 10 °C min−1 using a NETZSCH STA 449C thermal analyzer. The crystal phase composition of the product was analyzed by X-ray diffraction (XRD, Rigaku D/Max-2400) with an energy dispersive spectrometer (EDS) using CuKα radiation. Transmission electron microscopy (TEM, JEM-2100F), and high resolution transmission electron microscopy (HR-TEM, FEI, Tecnai G2 F20). And the atomic information in the crystal was collected to X-ray photoelectron spectroscopy (XPS, Thermo VG ESCALAB 250), Raman microscope (voltage: 100–240 V, power: 150 W; RENISHAW Invia, UK), BET surface-area and pore-size analyzer (Quantachrome Autosorb-6B).
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4

Comprehensive Characterization of Materials

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Scanning electron microscopy (SEM) was carried out using a field emission scanning electron micro-analyzer (FEI Magellan 400), and transmission electron microscopy (TEM) images were taken by JEM-2100F. Raman spectra were collected on a DXR Raman Microscope (Thermal Scientific Co., USA) with 532 nm excitation length. Nitrogen adsorption–desorption isotherms were measured at liquid nitrogen temperature (77 K) with an ASAP 2010 Accelerated Surface Area and Pore Size Analyzer System (Micrometitics, Norcross, GA). During measuring procedures, the samples were treated at 300 °C overnight under vacuum. The specific surface areas were calculated with the Brunauer–Emmett–Teller (BET) method. The total pore volume was calculated from the amount of nitrogen adsorbed at a relative pressure of 0.99. The pore size distribution curves were calculated by means of the desorption branch of the isotherms using the quenched solid density functional theory (QSDFT). X-ray photoelectron spectroscopy (XPS) measurements were taken using an ESCALAB 250 X-ray photoelectron spectrometer using Al (hv = 1486.6 eV) radiation to analyze the surface of the obtained samples.
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5

Multimodal Characterization of Multifunctional Metal-Organic Frameworks

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The structures and compositions of MGT were characterized by SEM, TEM, XRD, FTIR, XPS, and Raman spectroscopy. TEM images were obtained using a JEM2100 transmission electron microscope operated at an accelerating voltage of 200 kV. HR-TEM images were taken using a JEM-2100F transmission electron microscope with an accelerating voltage of 200 kV. SEM measurements were performed using a field emission SEM (FEI Helios G4 UC) operated under UC (UniColore) mode at 1 kV + 1000 V UC. XRD patterns were measured by a D/max2550VB3+/PC x-ray diffractometer using Cu (40 kV, 100 mA). FTIR spectra were recorded on a Nicolet iS10 infrared spectrometer (Thermo Fisher Scientific, USA). XPS data were performed on an XPS (AXIS Ultra DLD, Japan) equipped with an Al Kα (1486.6-eV photons). SERS was performed on a Thermo Fisher Scientific DXR Raman microscope with a 10× [numerical aperture (NA), 0.4] microscope and a 10-mW laser power for SERS measurements.
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6

Comprehensive Characterization of Photoanode Materials

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X-ray photoelectron spectroscopy (XPS) was measured on an RBD upgraded PHI-5000C ESCA system (Perkin Elmer). The morphology images were obtained by scanning electron microscope (SEM) (FEI Sirion 200 scanning electron microscope) and transmission electron microscopy (TEM) (JEM-2100F). X-ray diffraction (XRD) patterns were recorded on a Bruker D8 Advance (Cu Kα radiation 0.154 nm). Raman spectra were recorded by a LabRam-1B Raman microspectrometer at 514.5 nm (Horiba Jobin Yvon, France). The BET surface areas were measured on a Nova 100 by using N2 as the adsorption gas. Photocurrent measurements were performed on a CHI 660D electrochemical analyzer (Shanghai CH Instrument Company, China). The JV curves were recorded by a PGSTAT 30 potentiostat (Netherlands). The incident photon-to-current conversion efficiency (IPCE) profiles were recorded on a Newport 1918-c power meter. The loading amount of the indoline was calculated by the concentration difference of the dye in the solution before and after adsorption by the photoanode (adsorption time is 24 h). The concentration of dye in the solution is proportional to the integral area of the adsorption peak measured by the UV-visible spectrometer (the adsorption signal was located at ∼510 nm).43,44 (link)
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7

Comprehensive Characterization of Composites

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Thermogravimetric analysis (TGA, NETZSCH STA449F3), X-ray photoelectron spectroscopy (XPS a K-alpha 1063), X-ray diffraction (XRD, Bruker D8 diffractometer, Cu Kα radiation), transmission electron microscopy (TEM, JEM-2100F), scanning electron microscopy (SEM, FEI Quanta 200) and Raman spectroscopy (Renishaw inVia, UK, the wavelength of 0.1542 nm) were used to analyse the composites.
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8

Comprehensive Material Characterization Protocol

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Powder X-ray diffraction (XRD) analysis is conducted using a D8 ADVANCE instrument with Cu Kα radiation (40 kV, 60 mA). The morphologies are characterized from scanning electron microscopy (SEM) images obtained using a field emission scanning electron micro-analyzer (FEI Magellan 400), and transmission electron microscopy (TEM; JEM-2100F). Raman spectra are obtained with a DXR Raman Microscope (Thermal Scientific Co., USA) with an excitation length of 532 nm. Two spectra are obtained for each sample to ensure accuracy. Nitrogen adsorption–desorption isotherms are measured at − 196  °C using an ASAP 2010 accelerated surface area and pore size analyzer system (Micrometitics, Norcross, GA). The specific surface areas are obtained following the multipoint Brunauer–Emmett–Teller (BET) method. The pore-size distribution curves, pore volume, and pore diameter are calculated using the adsorption branch of the isotherms following the Barrett–Joyner–Halenda (BJH) method. X-ray photoelectron spectroscopy (XPS) measurements are used to analyze the surface of the samples with an ESCALAB 250 X-ray photoelectron spectrometer and Al Kα ( = 1486.6 eV) radiation.
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9

Characterization of Adsorbent Materials

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The values of surface area (BET) were decided by N2 adsorption-desorption isotherms (Micromeritic TriStarII 3020, Norcross, GA, USA). The morphology was observed by scanning electron microscope (SEM) (FEI, Phenom, Hillsboro, OR, USA) and transmission electron microscopy (TEM) (JEM-2100F, Tokyo, Japan). X-ray Diffraction (XRD, D8 Advance, Bruker, Karlsruhe, Germany) analysis was applied to investigate the crystallization and phase. Functional groups were identified by Fourier transform infrared (FT-IR) spectrophotometry (Thermo, Nicolet-6700, Waltham, MA, USA). Magnetic strength was compared by vibrating sample magnetometry (VSM) (Quantum design, PPMS-9, San Diego, CA, USA). Elements compositions were confirmed by energy-dispersive spectrometry (EDS) and X-ray photoelectron spectroscopy (XPS) (Thermo Scientific, 250Xi, Waltham, MA, USA). The concentration of Hg2+ ions at any time t (min) was quantified using ICP-OES.
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10

Structural Characterization of Samples

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Structural characterization of the samples was carried out using SEM (Verios 460, FEI). HR-TEM (JEM-2100F, FEI) was conducted for detailed analysis. EDS was utilized in HR-TEM (EDS, Aztec, Oxford). XRD (D/Max2000, Rigaku) was carried out for the powder analysis using Cu-Ka radiation, a scan range of 10–90°, a step size of 0.005°, and a counting time of 5 min. Rietveld profile refinements were performed using the GSAS suite of programs. HAADF-STEM images were obtained with aberration-corrected JEM-2100F electron microscopes operated at 160 kV using a convergence semi-angle of 22 mrad. The HAADF inner and outer collection semi-angle was 54 mrad and 220 mrad, respectively. Simulated HAADF/ABF-STEM image and FFT pattern were obtained by using Dr.probe46 (link) and CrysTbox47 (link) program.
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