The largest database of trusted experimental protocols

Nova nanosem 450

Manufactured by JEOL

The Nova NanoSEM 450 is a high-performance field emission scanning electron microscope (FE-SEM) designed for advanced imaging and analysis. It features a large specimen chamber, high resolution, and a range of detection systems for various applications in materials science, nanotechnology, and life sciences research.

Automatically generated - may contain errors

6 protocols using nova nanosem 450

1

Walnut-Derived Carbon Characterization

Check if the same lab product or an alternative is used in the 5 most similar protocols
The different carbon
samples synthesized from walnut shells were examined by X-ray powder
diffraction using the Philips X’Pert PRO diffractometer with
nickel-filtered Cu Kα radiation. Raman spectroscopy was performed
using Lab RAMHR800 from JY Horiba. Transmission electron microscopy
(TEM) was performed using a JEOL JEM-2200FS field emission (FE)-TEM
operating at 200 kV. FE-scanning electron microscopy (SEM) was performed
with the help of Nova Nano SEM 450. The surface area values for all
the samples were determined by the Brunauer–Emmett–Teller
(BET) adsorption method (Quadrasorb automatic volumetric instrument).
Cyclic voltammetry and impedance measurements were performed using
a BioLogic VMP3 multichannel potentiogalvanostat. Charge–discharge
measurements were performed with the help of an MTI Corp. multichannel
battery testing system.
+ Open protocol
+ Expand
2

Comprehensive Structural Characterization of Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
The morphologies and microstructures of the samples were examined using scanning electron microscope (SEM, FEI Nova NanoSEM 450) and transmission electron microscopy (TEM, JEOL JEM-2100F). The pore structure was measured at 77 K using a Quadrasorb SI analyzer (Quantachrome Instrument Crop) and the corresponding pore size distribution was obtained by the density functional theory (DFT model). X-ray diffraction (XRD) measurements were recorded on a Rigaku D/max 2550 diffractometer using Cu Kα radiation. X-ray photoelectron spectroscopy (XPS) measurements were carried out on an Axis Ultra DLD spectrometer with Al Kα radiation. NH3-temperature programmed desorption (NH3-TPD) was performed on a TP-5080 adsorption analyzer (Xianquan Co.) with a thermal conductivity detector (TCD). Before the NH3-TPD experiment, 0.1 g sample was pretreated in He flow at 300 °C for 30 min, followed by cooling down to 100 °C. Afterwards, the He flow was switched to a stream containing 5 vol% NH3/He to adsorb NH3 for 60 min at 100 °C and then purged with He at the same temperature. Finally, the temperature was increased to 800 °C in He flow at a heating rate of 10 °C min−1.
+ Open protocol
+ Expand
3

Nanomaterial Characterization Techniques

Check if the same lab product or an alternative is used in the 5 most similar protocols
Scanning electron microscopy (SEM) images were collected using either a Nova NanoSEM 450 or a JEOL 6701F electron microscope operating at an accelerating voltage of 10 kV. UV-vis spectra were obtained using a Lambda 750S spectrometer. Matrix-assisted laser desorption-ionization time-of flight (MALDI-TOF) mass spectra were recorded with a Biflex III (Bruker Daltonics Inc., Germany) mass spectrometer using 1,1,4,4-tetraphenyl-1,3-butadiene as matrix in a positive ion linear mode. Cyclic voltammogram (CV) and differential pulse voltammogram (DPV) were measured in 1,2-dichlorobenzene (o-DCB) with 0.1 M of (n-Bu)4NPF6 as supporting electrolyte at a Pt working electrode with a CHI660E workstation.
+ Open protocol
+ Expand
4

Structural Analysis of PDI-O Microribbons

Check if the same lab product or an alternative is used in the 5 most similar protocols
The morphology of the PDI-O microribbons was characterized by SEM (FEI Nova NanoSEM 450), TEM (JEOL JEM-1011), and AFM (Bruker Multimode 8). The crystal structure of the PDI-O microribbons was examined by SAED (JEOL JEM-1011) and XRD (PANalytical Empyrean).
+ Open protocol
+ Expand
5

Characterization of Composite Materials

Check if the same lab product or an alternative is used in the 5 most similar protocols
The phase structure of the as-obtained composites was measured by X-ray diffraction (XRD, Bruker D8) with Cu Kα radiation. Chemical composition and valence state of the products were studied using X-ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific). The surface morphology of the samples was characterized using a scanning electron microscope (SEM, Nova nanoSEM 450) equipped with an X-ray energy dispersive spectroscope (EDS) and a transmission electron microscopy (TEM, JEOL JEM-2100). The preparation process of the TEM sample was as follows: Firstly, the active materials were scraped off with a knife. Then the materials were dispersed in ethanol with ultrasonic vibration. Finally, the dispersed materials were dripped on copper mesh supported carbon film.
+ Open protocol
+ Expand
6

Comprehensive Structural Characterization

Check if the same lab product or an alternative is used in the 5 most similar protocols
The morphology and atomic structure were characterized by scanning electron microscopy (SEM, FEI Nova NanoSEM 450) and transmission electron microscopy (TEM, JEOL JEM-F200 Multi-Purpose FEG-S/TEM) equipped with an energy dispersive spectroscopy detector (EDS, Bruker SDD-EDS detector). X-ray diffraction (XRD) measurement was recorded with MPD (PANalytical) Xpert Multipurpose X-ray Diffraction System with Cu Kα radiation. Raman spectra were measured by Renishaw inVia Raman Microscope, excited with 532 nm wavelength argon-ion laser. Raman spectroscopy was calibrated with Si single crystal before measurement. The composition and chemical bonding were analyzed by ThermoScientific ESCALAB 250i X-ray photoelectron spectroscopy (XPS). The binding energies were calibrated by the C 1s peak at 284.86 eV.
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!