Fei xl30
The FEI XL30 is a scanning electron microscope (SEM) used for high-resolution imaging of small-scale samples. It is capable of producing detailed images of the surface and internal structure of a wide range of materials, including metals, ceramics, and biological samples.
9 protocols using fei xl30
Biomechanical Evaluation of Dental Dentin
Immunostained Colon Analyzed by SEM
Bioflocculant Characterization by SEM
Acoustofluidic Device Separation Benchmarking
Electrospun Fiber Scaffold Characterization
Microstructural Analysis of Material Samples
Bone Powder Microstructure and Elemental Analysis
Sperm Cell Cryopreservation Protocol
Comprehensive Characterization of Ion Exchange Media
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