Leo 1450
The LEO 1450 is a scanning electron microscope (SEM) designed and manufactured by Zeiss. It is a versatile and user-friendly instrument capable of high-resolution imaging of a wide range of samples. The LEO 1450 is equipped with essential features for analytical applications, including electron beam control and sample handling capabilities.
Lab products found in correlation
13 protocols using leo 1450
Scanning Electron Microscopy Protocol for Particle Size Analysis
SEM Analysis of EPS Morphology
Fungal Spore Morphology Analysis
Galvanostatic Polarization for Corrosion Analysis
Based on the polarization results, samples with currents of 0.010, 0.030, and 0.080 A·cm−2 were selected for product characterization. The surface morphologies of corrosion scales were observed by scanning electron microscopy (SEM, LEO-1450, Zeiss, Jena, Gernamy), and their composition was investigated by X-ray photoelectron spectroscopy (XPS, AXIS ULTRADLD, Kratos, Manchester, UK).
For all samples, according to the ISO 8407: 2010 standard [21 ], the rust was eliminated by successive cleaning in hydrochloric acid aqueous solution (500 mL deionized water + 500 mL concentrated hydrochloric acid + 5 g hexamethylenetetramine). The coupons were washed with acetone and dried by air blast. Then, the corrosion rate was calculated.
Nanocellulose Characterization by Electron Microscopy
High-Resolution SEM Imaging Protocols
Magnetic Permeability Measurement of Fe-Si-Cr SMCs
where μe is the effective permeability, L is the inductance of sample core, and Le is the mean flux density path of the ring sample. N is the number of turns of the coil (N = 25), Ae is the area of cross-section.
The microstructure of uncoated and coated Fe-Si-Cr powder was characterized by scanning electron microscopy (SEM, LEO1450, CARL ZEISS, Oberkochen, Germany) equipped with the energy dispersive X-ray spectrometry (EDS, Quanta-200, CARL ZEISS, Oberkochen, Germany). FTIR was used to verify the phosphating effect and the coating effect of PI (Thermo Scientific Nicolet iS5, Thermo Fisher Scientific, Waltham, MA, USA). XRD was used to characterize the structure of the powder and SMCs (Rigaku Ultima IV, Rigaku Corporation, Tokyo, Japan). The kinetics of thermal decomposition of PI was investigated using synchronous thermal analyzer (TG-DSC, Q600, METTLER-TOLEDO, DE, USA). LCR bridge tester (TH2829C, Agitek, Xi‘an, China) is used to measure the inductance of SMCs, the core loss was measured by an auto testing system for SMCs (IWATSU SY-943, IWATSU ELECTRIC, Tokyo, Japan) in the frequency range of 100 kHz−1 MHz, and the magnetic flux density was set to 50 mT.
Scanning Electron Microscopy of Cryogenic Plant Samples
Morphological and Chemical Characterization of Titanosilicates
The chemical composition of mineral samples has been studied by wavelength-dispersive spectrometry using a Cameca MS-46 electron microprobe (Geological Institute, Kola Science Centre of the Russian Academy of Sciences, Apatity) operating at 20 kV, 20–30 nA and 5 μm beam diameter.
Ultrastructural Analysis of Trichinella ventricosa
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