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21 protocols using xe 100 afm

1

Atomic Force Microscopy Analysis of Membrane Roughness

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The surface morphology and roughness of the membranes were analysed using an AFM XE-100 (Park Systems, USA). The measurements were taken at ambient conditions and the membranes were dried at room temperature prior to analysis. Membrane samples were cut into approximately 1 cm2 sizes and each sample was secured on the top of a scanner tube with carbon tape, followed by scanning with the laser beam reflected by the cantilever, within a scanning area of 10 µm × 10 µm. Generally, three measurements are conventionally used to define roughness: the mean roughness (Ra), the root mean square roughness (Rq), and the average difference in the heights between the highest and the lowest points (Rz). In this study, Rq was used as the evaluation measurement to compare the roughness of the membranes produced and was the defined roughness parameter studied using the AFM XE Data Acquisition program in non-contact mode. Mathematically, Rq is defined as the average value of the surface relative to the central plane for which the volumes enclosed by the images above and below the plane were equal, as represented in Equation (1): Rq=[1S0a0b{f(x,y)zm}2dxdy]12
where f(x,y) is the height in the specified area, S is the specified area, a and b are the length of the sample, and Zm is the mean height value.
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2

Characterizing Cell Surface Roughness by AFM

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In the cell-cell coculture model, 12 h and 24 h coculture and monococulture samples were collected and observed under Axioskop 40 pol optical microscope (Zeiss). The samples were collected from 3 biological replicates and at least 20 images were taken for each sample. For the determination of cell surface roughness, the samples were firstly scraped with a sterile blade to expose the substrate. Afterwards, the probe was used to approach and make contact with the cells and the substrate using AFM XE-100 (Park Systems). AFM performed in non-contact mode was used to characterize the morphology of individual cells in air (38 (link)). Silicon cantilever (PPP-NCHR, Nanosensors) with spring constant of 42 N/m and resonance frequency of 330 kHz was used. The scan rate was 0.5 Hz and the image resolution was 256 pixels × 256 pixels. Data were recorded for at least 10 fields of view per sample and results represent typical observation in each field. Surface roughness was determined using XEI software.
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3

Characterizing Cell Surface Roughness by AFM

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In the cell-cell coculture model, 12 h and 24 h coculture and monococulture samples were collected and observed under Axioskop 40 pol optical microscope (Zeiss). The samples were collected from 3 biological replicates and at least 20 images were taken for each sample. For the determination of cell surface roughness, the samples were firstly scraped with a sterile blade to expose the substrate. Afterwards, the probe was used to approach and make contact with the cells and the substrate using AFM XE-100 (Park Systems). AFM performed in non-contact mode was used to characterize the morphology of individual cells in air (38 (link)). Silicon cantilever (PPP-NCHR, Nanosensors) with spring constant of 42 N/m and resonance frequency of 330 kHz was used. The scan rate was 0.5 Hz and the image resolution was 256 pixels × 256 pixels. Data were recorded for at least 10 fields of view per sample and results represent typical observation in each field. Surface roughness was determined using XEI software.
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4

Characterizing Surface Properties via AFM and SEM

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Atomic Force Microscopy (AFM) (XE 100 AFM, Park Systems company, Suwon, Korea) measurements were performed in non-contact mode. Samples were sputter-coated with gold and observed by the FEI Inspect-S scanning electron microscope at an accelerating voltage between 5 and 20 kV in order to analyse the topography of the samples. The elements analysis of the coatings was conducted by the same Scanning Electron Microscopy (SEM) instrument equipped with energy-dispersive X-ray spectroscopy (EDX) system.
The contact angle measurements were performed by the sessile drop method using an optical measuring system (CAM101, KSV, Biolin Surface, Finland) with deionised water. Three drops of the liquid (9 μL) were examined on each substratum, and the contact angle was measured 3 s after the positioning of the drop.
Surface free energy (SFE) was determined based on the contact angle measurement of two wetting agents: water and di-iodomethane. This calculation was conducted using the concept of polar and dispersion components using the Owens, Wendt, Rabel, and Kaelble (OWRK) method for calculation [34 (link),35 (link),36 ].
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5

Measuring Surface Area Ratio of TiN Films

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While optimizing the IBAD TiN deposition process, an atomic force microscope (XE-100 AFM, Park Systems) equipped with an ACTA probe (AppNano; radius of curvature, 6 nm) was used for measuring the effective surface area ratio (SAR). An area of 1 μm × 1 μm was measured in intermittent mode for each sample. XEI analysis software (Park Systems) was used for calculating the SAR as per the formula
where AG is the plain geometric area and AS is the total surface area of the corresponding region. The result was finally given as a mean of two areas measured from the same sample. In addition, the software was used to calculate the root-mean-square roughness Rq.
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6

Atomic Force Microscopy of GQD Sample

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The GQD sample was prepared on a silicon wafer and was measured by XE-100 AFM (Park Systems, Suwon, Republic of Korea) by noncontact mode. The image size of 25 μm2 was obtained at a scan rate of 0.8 Hz.
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7

Analyzing BHJ Active Layer Morphology

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For the detailed analysis of the phase-separated morphology of the BHJ active layer, we extracted the domain size by image-analysis of the 2D distribution of the orientation angle of the phase (ϕ) measured by AFM. The tapping-mode phase images of the active layers were obtained using an XE-100 AFM (Park Systems). Considering that the difference in the phase angle is proportional to the compositional difference, it is instructive to quantify the spatial scale of the composition distribution using the pair-correlation function, g(r). This function, defined by

allows for a determination of the long-range order of the system. In equation (1)r is the 2D coordinates in the system, the bracket denotes values averaged over the system, and , where ϕavg denotes the average value of ϕ. The obtained quantitative measure for the long-range order corresponds to the average domain size in the ith direction (i=x or y), Lcor,i, which can be obtained by calculating the smallest value of r satisfying g(x)=0 and g(y)=0, respectively. Then, the overall average domain size, Hinter, can be obtained using the reciprocal relationship .
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8

Atomic Force Microscopy Tapping Mode

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AFM measurements (XE-100 AFM,
Park Systems) were performed in tapping mode using NSG30 AFM probes
(spring constant of ∼40 N/m) below the resonance frequency
(typically, 320 kHz) under ambient conditions at room temperature.
The resulting images were processed by using Gwyddion software.
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9

Atomic-Force Microscopy of Silicon Diatoms

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Atomic-force microscopy (AFM) imaging of silicon diatoms was performed using a XE-100 AFM (Park Systems). Surface imaging was obtained in non-contact mode using silicon/aluminum-coated cantilevers (PPP-NCHR 10 M; Park Systems) 125-μm long with a resonance frequency of 200 to 400 kHz and nominal force constant of 42 N/m. Images, with a resolution of 256 × 256 pixels, were acquired with a set point of 15.8 nm and a sampling frequency of 0.5 Hz. Electric force microscopy (EFM) was performed at bias voltages of 0 V and 10 V.
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10

Characterization of Bare DNPs by AFM and DLS

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Morphology of bare DNPs was investigated by atomic force microscopy (AFM). A XE-100 AFM (Park Systems) was used for the imaging of DNPs deposited on silicon substrate. Surface imaging was obtained in noncontact mode using silicon/aluminum-coated cantilevers (PPP-NCHR 10 M; Park Systems) 125 μm long with a resonance frequency of 200–400 kHz and a nominal force constant of 42 N/m. The scan frequency was typically 1 Hz per line.
The size and surface charge measurements of DNPs dispersed in water (pH 7) were investigated by dynamic light scattering (DLS) using a Zetasizer Nano ZS (Malvern Instruments, UK) equipped with a He–Ne laser (633 nm, fixed scattering angle of 173°C, 25°C).
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