where f(x,y) is the height in the specified area, S is the specified area, a and b are the length of the sample, and Zm is the mean height value.
Xe 100 afm
The XE-100 AFM is an atomic force microscope (AFM) designed and manufactured by Park Systems. It is a powerful tool for high-resolution surface imaging and analysis at the nanoscale level. The XE-100 AFM utilizes a cantilever-based detection system to measure the topography and properties of a sample's surface with angstrom-level precision.
Lab products found in correlation
21 protocols using xe 100 afm
Atomic Force Microscopy Analysis of Membrane Roughness
where f(x,y) is the height in the specified area, S is the specified area, a and b are the length of the sample, and Zm is the mean height value.
Characterizing Cell Surface Roughness by AFM
Characterizing Cell Surface Roughness by AFM
Characterizing Surface Properties via AFM and SEM
The contact angle measurements were performed by the sessile drop method using an optical measuring system (CAM101, KSV, Biolin Surface, Finland) with deionised water. Three drops of the liquid (9 μL) were examined on each substratum, and the contact angle was measured 3 s after the positioning of the drop.
Surface free energy (SFE) was determined based on the contact angle measurement of two wetting agents: water and di-iodomethane. This calculation was conducted using the concept of polar and dispersion components using the Owens, Wendt, Rabel, and Kaelble (OWRK) method for calculation [34 (link),35 (link),36 ].
Measuring Surface Area Ratio of TiN Films
where AG is the plain geometric area and AS is the total surface area of the corresponding region. The result was finally given as a mean of two areas measured from the same sample. In addition, the software was used to calculate the root-mean-square roughness Rq.
Atomic Force Microscopy of GQD Sample
Analyzing BHJ Active Layer Morphology
allows for a determination of the long-range order of the system. In
Atomic Force Microscopy Tapping Mode
Park Systems) were performed in tapping mode using NSG30 AFM probes
(spring constant of ∼40 N/m) below the resonance frequency
(typically, 320 kHz) under ambient conditions at room temperature.
The resulting images were processed by using Gwyddion software.
Atomic-Force Microscopy of Silicon Diatoms
Characterization of Bare DNPs by AFM and DLS
The size and surface charge measurements of DNPs dispersed in water (pH 7) were investigated by dynamic light scattering (DLS) using a Zetasizer Nano ZS (Malvern Instruments, UK) equipped with a He–Ne laser (633 nm, fixed scattering angle of 173°C, 25°C).
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