Jsm 6380 la instrument

The particle size of the obtained TiO₂ was quantified using Malvern Zetasizer Nano S model. To perform the particle size analysis, 1 µg of sample was added to 50 mL of water which was further diluted 10 times. The resulting solution was used to detect the particle size of titanium dioxide catalyst. XRD patterns were recorded on Bruker AXS X-ray diffractometer using Cu-kα radiation of λ = 1.5406 A^o at room temperature. The diffraction patterns for TiO₂ catalyst were recorded at different 2θ angles in the range of 0-75°. The Scherrer equation used for estimation of the crystal size is represented as follows: $\mathrm{D}=\frac{K\lambda }{\beta \mathrm{C}\mathrm{o}\mathrm{s}\theta }$ where D is average crystal size, K is dimensionless shape factor with value ranging between 0.9 and 0.94, $\theta$ is Bragg angle, $\beta$ is the corrected line broadening at half the maximum intensity, and $\lambda$ is the wavelength of X-ray.
The surface morphological characteristics of TiO₂ catalyst were analyzed using scanning electron microscope (JEOL – JSM 6380 LA instrument). For functional group determination, Perkin Elmer Spectrum 100 FTIR has been used. The spectra were recorded in the infrared region of 4000–400 cm⁻¹, using KBr pellets at a resolution of 4 cm⁻¹.