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Spectrum 100 ftir atr

Manufactured by PerkinElmer
Sourced in United States

The Spectrum 100 FTIR/ATR is a Fourier Transform Infrared (FTIR) spectrometer with Attenuated Total Reflection (ATR) capabilities. It is a versatile lab equipment designed for infrared spectroscopy analysis.

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4 protocols using spectrum 100 ftir atr

1

Determination of Degree of Cure in Composite Resins

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The DC of bottom surfaces (n = 5) was obtained by Fourier Transformed Infrared Spectroscopy (FTIR – Spectrum 100 FTIR/ATR; Perkin Elmer, Waltham, MA, USA). All spectra were obtained in 650–4000 cm−1 with 32 scans and 4 cm−1 resolutions. Baseline correction was performed in region between 1590 and 1660 cm-1. The percentage of unreacted carbon–carbon double bonds (C=C) was determined from the ratio of absorbance intensities of aliphatic vinyl bonds of methacrylate C=C (peak at 1638 cm−1) against the internal standard (aromatic bisphenol C=C, peak at 1608 cm−1) for non-polymerized and polymerized composite resin. The non-polymerized composite resin was used as a reference. The DC was determined by the following formula: , where R = ratio by band height at 1638 cm−1/band height at 1608 cm−1.
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2

FTIR-ATR Analysis of Algal Biomass

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A Fourier transform infrared spectrometer equipped with an attenuated total re ection (Perkin-Elmer Spectrum 100 FTIR-ATR) was used to characterize surface structures of algal biomass exposed to or not exposed to Pb 2+ in various conditions.
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3

Characterization of Copolymer Films by FT-IR

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The structure was confirmed by FT-IR spectra of the copolymer films which were recorded with a Perkin-Elmer Spectrum-100 ATR-FTIR instrument by scanning in the range of 600–4000 cm−1.
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4

FTIR and EDXRF Analysis of PANI-Integrated Fabric

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The FTIR spectra were studied with a Perkin Elmer Spectrum 100 ATR–FTIR. The analysis was performed at room temperature with ambient humidity. The spectra were recorded from 450 cm−1 to 4000 cm−1 at a frequency of 20 kHz, using a resolution of 16 cm−1. Each spectrum was recorded using a mirrored diamond surface under spectroscopic circumstances. The spectra were analysed with BIO–RAD WIN–IR PRO software (version 10, Perkin Elmer, Ltd., London, UK) in order to identify the functional group components within the PANI-integrated fabric. Meanwhile, EDXRF (model: Epsilon 3XLE–EDXRF spectrometer, Malvern Panalytical Ltd., Cambridge, UK) analysis was performed to measure the elemental composition of the PANI fabric. K X–rays were used to irradiate the fabric three (3) times, with the average value recorded; the voltage used was 50 kV. Nitrogen (N) and sulfur (S) were specifically selected as elements of interest.
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