The chemical composition of hybrid composite (Ag-AgCl)NPs/biosilica was characterized using scanning electron microscopy (LEO 1430 VP, Electron Microscopy Ltd., Cambridge, UK) coupled with energy-dispersive X-ray (detector XFlash 4010, Bruker AXS, Bremen, Germany).
Xflash 4010
Manufactured by Bruker
Sourced in Germany
The XFlash 4010 is an energy-dispersive X-ray spectrometer (EDS) designed for elemental analysis in scanning electron microscopes (SEM) and other analytical instruments. It provides fast and accurate detection and quantification of elements from beryllium to uranium. The XFlash 4010 features a high-resolution silicon drift detector (SDD) with a compact design and integrated electronics.
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Lab products found in correlation
Tecnai f20 x twin, by Thermo Fisher Scientific (2 mentions)
S 4800, by Hitachi (2 mentions)
Xl30 esem, by Bruker (1 mentions)
Esprit, by Bruker (1 mentions)
Jsm 7001f, by JEOL (1 mentions)
Smartlab 3 kw, by Rigaku (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Dektak 150, by Veeco (1 mentions)
Smartlab 9 kw, by Rigaku (1 mentions)
Versalab, by Quantum Design (1 mentions)
12 protocols using xflash 4010
1
Characterization of Hybrid Composite (Ag-AgCl)NPs/Biosilica
2
Nanomaterial Characterization via ESEM-EDS
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A FEI XL30 ESEM with Bruker XFlash 4010 EDS detector was used for the characterization (primary voltage, 20 keV; working distance, 15 mm).
3
Multimodal SEM Imaging and FIB-TEM Sample Preparation
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We used a Zeiss Ultra 55 field emission gun SEM operated at 2 to 15 kV at IMPMC, Paris. Backscattered electron (BSE) mode was used to investigate chemical heterogeneities using an Angle Selective Backscattered Detector (AsB, working distance 7.5 mm) or an energy selective backscattered detector (EsB). Morphology imaging was performed using an InLens detector (working distance 2–3 mm). Energy dispersive X-ray spectrometry (EDXS) maps were acquired using an EDXS QUANTAX system equipped with a silicon drift detector XFlash 4010 (Bruker). Data were processed with the software Esprit (Bruker). Focused ion beam (FIB) milling was used to produce ultra-thin sample sections (Fig. 5d ) on a Zeiss neon EesB40 FIB/FEG-SEM system (IMPMC, Paris). A FIB-assisted Pt deposit was first made. A 30 kV Ga+ beam operated at ca 5 nA was then used for the initial milling steps, consisting in rough excavations from both sides of the thin foil. An in situ micromanipulator was attached to the foil by FIB-assisted platinum deposition before separation of the foil (at ca 100 pA). The thin foil was transferred to a TEM grid and welded to it. The thinning of the ultra-thin foil was performed with the beam operated at a ca 100 pA current. A last cleaning step was performed at low acceleration tension (ca 3 kV).
4
Characterization of Silver-Casein Complexes
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Distribution of silver-casein complexes size was investigated by transmission electron microscopy (FEI Tecnai F20 X-Twin, Hillsboro, OR, USA) and scanning electron microscopy (LEO 1430 VP) coupled with energy dispersive X-ray detector (XFlash 4010, Bruker AXS, Berlin, Germany). The samples for TEM analysis were dropped on the carbon-coated grid and the excess solution was removed, while for SEM analysis the powdered samples were used.
5
Characterization of LCLB56-AgCs nanoparticles
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The size of synthesized LCLB56-AgCs size was measured using transmission electron microscopy (TEM, FEI Tecnai F20 X-Twin) and scanning electron microscopy (SEM, LEO 1430VP) in tandem with EDX detector (XFlash 4010, Bruker AXS). A sample solution was applied to a carbon-coated copper grid. Then, the sample was subjected to drying. X-ray analysis diffraction (XRD) was used for determination and characterization of the crystal structure. The LCLB56-AgCs sample was deposited onto the glass slide and then recorded by X-ray diffractometer (X’Pert Pro Analytical Phillips) equipped with Ni filter and Cu Kα (λ = 1.54056 Å) radiation source.
6
Multimodal Characterization of Thin Films
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The crystal structure and macroscopic crystallographic features were analyzed by temperature-dependent X-ray diffractometer using Cu-Kα radiation (λ = 0.15406 nm) (Rigaku Smartlab 9 kW, Tokyo, Japan) and a four-circle X-ray diffractometer (Rigaku Smartlab 3 kW, Tokyo, Japan), respectively. A stylus profiler (Veeco DEKTAK 150, Plainview, NY, USA) was employed to measure the film thickness. The microstructures and chemical composition were examined by scanning electron microscopy (SEM, JEOL-JSM 7001F, Tokyo, Japan) and energy dispersive spectrometry (EDS, Bruker XFlash 4010, Berlin, Germany), respectively. The cross-sectional microstructures at nano and atomic scale were characterized by transmission electron microscopy (JEOL JEM 2100F, Tokyo, Japan) working at 200 kV. The cross-sectional sample for TEM characterization was prepared using the focused-ion beam (FIB, FEI Helios nanolab, Hillsboro, OR, USA) lift-out technique. Temperature-dependent magnetization curves and magnetic hysteresis loops were measured by Versalab (Quantum Design, San Diego, CA, USA).
7
Elemental Composition Analysis of CPB
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To determine the chemical elements composing CPB, we pipetted a few drops of the CPB solution on a double sided adhesive conductive carbon tape, dried it for 2 h at 37 °C, sputter coated with carbon (CA7625, Emitech), and performed an elemental analysis by energy-dispersive X-ray spectroscopy (XFlash® 4010, Bruker). For each sample, we defined three quadrants where CPB were clearly observed, and then calculated the average atomic percent for each element. All calculations were performed after the carbon correction to avoid the misinterpretation of the result.
8
Microstructural Analysis of Hydrated BEC
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Secondary electron observations were carried out to analyze the changes in the microstructure of the unhydrated and hydrated BEC material surfaces after EPT, as well as the formation of calcium phosphate compounds after bioactivity tests. These observations were complemented by chemical analysis using energy-dispersive X-ray analysis. A Hitachi S-4800 (Tokyo, Japan) microscope, at accelerating voltage of 2 kV, was used for this study. Energy-dispersive X-ray (EDX) analysis was performed at 20 kV with an EDX Bruker XFlash 4010 (Berlin, Germany) detector.
9
XPS and SEM Analysis of Plasma-Treated Quinoa Seeds
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Quinoa seeds were analyzed by XPS in a PHOIBOS spectrometer using the Mg Kα as excitation source and working in the pass energy constant mode. Binding energy scale of the spectra was referred to the the main C1s signal peak attributed to C-C and C-H bonds taken at 284.5 eV. Spectra were recorded for untreated and plasma treated seeds for different times and for these latter seeds taken out from the spectrometer and exposed to air saturated with water vapor at room temperature for 24 h in a close container under the conditions described above for weight increase experiments. Note that prior to recording the spectra, samples had to be kept in the prechamber of the spectrometer up to reach the base pressure required to collect the spectrum.This conditioning time under ultrahigh vacuum conditions lasted for about 24 hours. For the XPS analysis a variable number of seeds were piled up to completely cover the porthole sample, thus avoiding any contribution from this latter to the recorded signals.
The surface morphology of the Quinoa seeds was also examined by means of a HITACHI 4800 scanning electron microscope working at 2 kV. EDX maps were adquired with a Bruker-X Flash-4010 working at 20 kV (aprox. depth analysis of 1 micron).
The surface morphology of the Quinoa seeds was also examined by means of a HITACHI 4800 scanning electron microscope working at 2 kV. EDX maps were adquired with a Bruker-X Flash-4010 working at 20 kV (aprox. depth analysis of 1 micron).
10
X-ray Absorption Spectroscopy of Phosphorous
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The samples were transferred into costume-made plastic cells and sealed with Ultralene R foil under glovebox conditions. The X-ray absorption spectroscopy (XAS) was performed at the BESSY II light source at the KMC-1 beamline (Helmholtz-Zentrum Berlin). 34 A four-bounce scanning Si(111) monochromator was used and the phosphorous K-edge was probed. The measurements were performed in fluorescence geometry with a XFlash 4010 detector (Bruker). The data from a single scan was used in this study.
Multiple scans showed identical spectra, indicating that the sample was not degenerated under the impact of the beam. XANES spectra were normalized as a function of IT/I0.
Multiple scans showed identical spectra, indicating that the sample was not degenerated under the impact of the beam. XANES spectra were normalized as a function of IT/I0.
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