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Tecnai g2 f20 s twin d573

Manufactured by Thermo Fisher Scientific

The Tecnai G2 F20 s-twin D573 is a transmission electron microscope (TEM) designed for high-resolution structural analysis of biological and materials samples. It features a field emission gun (FEG) source, a post-column Gatan imaging filter, and a dual-tilt specimen holder. The core function of this equipment is to provide high-magnification, high-resolution imaging capabilities for advanced microscopy applications.

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4 protocols using tecnai g2 f20 s twin d573

1

Comprehensive Characterization of NiFe2O4@NiFe2O4 Nanostructured Arrays

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The morphology of the NiFe2O4@NiFe2O4 NSAs was characterized by field-emission scanning electron microscopy (SEM, JEOL JSM 6700F) and transmission electron microscopy (TEM, FEI Tecnai G2 F20 S-Twin D573) with acceleration voltage of 200 kV. The energy dispersive X-ray spectroscopy (EDS) spectra were also acquired using a JEOL JSM 6700F microscope. The composition and structure of NiFe2O4@NiFe2O4 NSAs were examined by powder X-ray diffraction (XRD, Rigaku D/Max 2550V/PC, Japan Cu-Kα radiation, λ = 0.15418 nm), and further confirmed by X-ray photoelectron spectroscopy (XPS, ESCALAB 250).
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2

Comprehensive Material Characterization

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The morphologies of the samples were observed by a JSM-6700F electron microscope (JEOL, Japan) with an acceleration voltage of 30 kV. The FTIR spectrums of the samples were surveyed using Nicolet 5700 FTIR spectrometer with a resolution of 4 cm−1 through KBr method. Raman spectra were measured on InVia Raman Microscope. Excitation was by means of the 488 nm line of an argon ion laser with an output power in the range of 200 to 300 mw. The instrument is equipped with a microscope with a focal spot size in the range of a few micrometers. The adsorption-desorption isotherms of nitrogen were measured at 77 K by using a Micromeritics ASAP 2420 analyzer. The EDS spectra (JEOL JSM-6700F, Japan) were also used to analyze the composition of the samples. XPS spectrum was collected on a Thermo ESCALAB 250. The morphology and structure of the samples were analyzed by TEM using a FEI Tecnai G2 F20 s-twin D573 operated at 200 kV.
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3

Characterization of JLUE-COPs

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Thermogravimetric analyses (TGA) were performed using a Netzch Sta 449c thermal analyzer system at the heating rate of 5 °C min−1 in N2 atmosphere. CHN elemental analyses were collected using an Elementar model Vario Micro analyzer. The Fourier transform infrared (FT-IR) spectra were recorded using a Nicolet Impact 410 Fourier transform infrared spectrometer. The N2 adsorption isotherms were measured on a Micromeritics ASAP 2020 surface area and porosity analyzer. The powder X-ray diffraction (PXRD) spectra were collected using a Rigaku D/MAX2550 diffractometer with Cu Kα radiation (λ = 1.54178 Å). Transmission electron microscopy (TEM) images and high-resolution transmission electron microscopy (HR-TEM) images were recorded on a FEI Tecnai G2F20 s-twin D573 with an acceleration voltage of 300 kV. Field-scanning electron microscopy (FE-SEM) images were obtained on a JEOLJXA-840 under an accelerating voltage of 15 kV. The solid-state 13C cross-polarization/magic-angle spinning nuclear magnetic resonance (CP/MAS NMR) spectra of JLUE-COPs were obtained at 5 kHz. The zeta potentials were measured at various pH values with a JS94H (Shanghai, China).
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4

Nanomaterial Characterization Using TEM, SEM, FTIR

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Transmission electron microscopy (TEM) was carried out using an FEI Tecnai G2 F20 s-twin D573 operated at 200 kV. The specimens for TEM were prepared by directly placing a small drop of the nanoparticle suspension on a carbon-coated TEM grid. Hitachi S-4800 field-emission scanning electron microscopy (FE-SEM) has been used in the test of morphologies. The IR spectra were obtained with a Bruker IFS 66v/ S FTIR spectrometer. The adsorption-desorption isotherms of nitrogen were obtained at 77 K using a Micromeritics TriStar 3000 system. Adsorption isotherms of N 2 at 77 K were used to calculate the pore size distributions based on the BJH model. The fluorescence emission spectra of the samples were recorded on a HORIBA Instrument FluoroMax -Compact spectrofluorometer.
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