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Tcu 1000 n temperature control unit

Manufactured by Anton Paar

The TCU 1000 N Temperature Control Unit is a laboratory equipment designed to provide precise temperature control for various applications. It is a self-contained unit that can independently control the temperature of a connected device or sample. The TCU 1000 N is capable of maintaining temperatures within a specified range, ensuring consistent and stable thermal conditions for experiments or processes.

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4 protocols using tcu 1000 n temperature control unit

1

Structural and Optical Characterization

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Powder diffraction studies were carried out on PANalytical X’Pert Pro diffractometer equipped with an Anton Paar TCU 1000 N Temperature Control Unit and using Ni-filtered Cu radiation (V = 40 kV, I = 30 mA).
Transmission electron microscope images were obtained using a TEM Philips CM-20 SuperTwin operating at 160 kV with an optical resolution of 0.25 nm.
The emission spectra were measured using the 266 nm excitation line from a laser diode (LD) and a Silver-Nova Super Range TEC Spectrometer form Stellarnet (1 nm spectral resolution). The temperature of the sample was controlled using a heating stage from Linkam (0.1 °C temperature stability and 0.1 °C set point resolution).
Luminescence decay profiles were recorded using FLS980 Fluorescence Spectrometer from Edinburgh Instruments with μFlash lamp as an excitation source and the signal was detected using a R928P side window photomultiplier tube from Hamamatsu.
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2

Characterization of Nanomaterials by XRD, TEM, and Emission Spectroscopy

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Powder diffraction studies were carried out on PANalytical X'Pert Pro diffractometer equipped with Anton Paar TCU 1000 N Temperature Control Unit using Ni-filtered Cu Kα radiation (V = 40 kV, I = 30 mA).
Transmission electron microscopy images were obtained using the Tecnai G2 20 S/TEM Microscope from FEI Company. The microscope was equipped with a thermionic LaB6 emitter and EDS detector for elemental analysis. The study was conducted in the TEM mode at maximum voltage of 200 kV. Micrographs were taken at various magnifications, including high resolution images with lattice fringes.
The emission spectra were measured using the 266 nm excitation line from a laser diode (LD) and a Silver-Nova Super Range TEC Spectrometer form Stellarnet (1 nm spectral resolution) as a detector.
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3

Characterization of Nanoparticle Properties

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Powder X-ray diffraction (XRD) studies were carried out on PANalytical X’Pert Pro diffractometer equipped with Anton Paar TCU 1000 N Temperature Control Unit using Ni-filtered Cu radiation (V = 40 kV, I = 30 mA).
Transmission electron microscope images were taken using transmission electron microscopy (TEM) Philips CM-20 SuperTwin with 160 kV of accelerating voltage and 0.25 nm of optical resolution.
The hydrodynamic size of the nanoparticles was determined by dynamic light scattering (DLS), conducted in Malvern ZetaSizer at room temperature in polystyrene cuvette, using distilled water as a dispersant.
The emission spectra were measured using the 266 nm excitation line from a laser diode (LD) and a Silver-Nova Super Range TEC Spectrometer form Stellarnet (1 nm spectral resolution) as a detector. The temperature of the sample was controlled using a THMS600 heating stage from Linkam (0.1 1C temperature stability and 0.1 1C set point resolution).
Luminescence decay profiles were recorded using FLS980 Fluorescence Spectrometer from Edinburgh Instruments with μFlash lamp as an excitation source and R928P side window photomultiplier tube from Hamamatsu as a detector.
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4

Structural and Optical Characterization of Nanomaterials

Check if the same lab product or an alternative is used in the 5 most similar protocols
Powder diffraction data were obtained using a PANalytical X'Pert Pro diffractometer equipped with an Anton Paar TCU 1000 N Temperature Control Unit using Ni-filtered Cu Kα radiation (V = 40 kV and I = 30 mA)38 (link), 39 (link). Transmission electron microscope (TEM) images were recorded with a Philips CM-20 SuperTwin transmission electron microscope, operating at 160 kV. A drop of the suspension was put on a copper microscope grid covered with carbon. Before the measurement, the sample was dried and purified in a H2/O2 plasma cleaner for 1 min. The excitation spectra and luminescence decay profiles were obtained using an FLS1000 Fluorescence Spectrometer from Edinburgh Instruments equipped with a 450 W xenon lamp and μFlash lamp as an excitation sources and R5509-72 photomultiplier tube from Hamamatsu in a nitrogen-flow cooled housing as a detector. To carry out the temperature measurement, the temperature of the sample was controlled using a THMS 600 heating–cooling stage from Linkam (0.1 °C temperature stability and 0.1 °C set point resolution). The emission spectra were recorded using 808 nm excitation lines from laser diode (LD of 1.1 W/cm2 excitation density) and a Silver-Nova Super Range TEC Spectrometer from Stellarnet (1 nm spectral resolution) as a detector.
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