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Tecnai g2 f20 s twin microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Tecnai G2 F20 S-Twin microscope is a high-performance, field-emission transmission electron microscope designed for advanced imaging and analytical applications. It features a unique S-Twin lens configuration, providing enhanced resolution and contrast for a wide range of sample types.

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10 protocols using tecnai g2 f20 s twin microscope

1

Characterization of Biosynthesized Quantum Dots

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The size of biosynthesized QDs was determined by dynamic light scattering (DLS). Purified and concentrated QDs were sonicated for 2 min and then measured in triplicate using a Zetasizer Nano (ZS) (Malvern Instrument Ltd.). High resolution scanning transmission electron microscopy (HR-STEM) was used to confirm nanometric size and chemical composition (FEI Tecnai G2 F20 S-Twin microscope, operated at 200 kV). For these purposes, 2 μL of the purified and concentrated QDs solution was added to a HC300-Cu grid and left to dry. TEM images were processed and analyzed with Digital Micrograph 3.9.0 (Gatan Inc) and The Gimp 2.4.0 software packages. In addition, samples were chemically characterized by Energy-dispersive X-ray spectroscopy (EDS or EDX).
To determine the organic composition of the external layer of QDs, samples werefreeze-dried for 48 h and the powder obtained was mixed with KBr to form a thin pellet. FTIR spectroscopy in a range between 600 and 4000 cm–1 was performed using a NicoletTM iSTM10 (Thermo Fisher Scientific Inc.).
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2

Characterization of Advanced Composites

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The density of the specimens was examined using the Archimedes method (PN-EN 1094-4:1998 Standard [36 ]). Hardness was measured with the Vickers Hardness Tester (FV-700e, Future-Tech, Kawasaki, Japan) using the indentation method under the load of 49.05 N. The fracture toughness of the produced composites was determined with the Vickers indentation crack length method under the load of 49.05 N. The Niihara, Morena, Hasselman equation was used. A total of 20 hardness measurements and 12 crack length measurements were performed for each sample. The phase composition of composites was analyzed with X-ray diffraction (XRD, D8 ADVANCE, Bruker, Billerica, MA, USA), using CuKα radiation at a wavelength of λ = 0.154056 nm. The parameters of this test were as follows: voltage: 40 kV, current: 40 mA, angular range: 20–100° with step 0.05°. The microstructure observations were performed on a scanning electron microscope (SEM Hitachi 5500, Hitachi, Tokyo, Japan). The observations were carried out at a 20 kV accelerating voltage. The scanning transmission electron microscopy images and diffraction patterns were obtained on an FEI Tecnai G2 F20 S-TWIN microscope (FEI, Hillsboro, OR, USA), operating at 200 kV and equipped with a Fischione 3000 high angle annular dark-field (HAADF) STEM detector.
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3

Nanoparticle Characterization by TEM

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TEM measurements were performed using a FEI Tecnai G2 F20 S-Twin microscope, operated at 200 kV. A drop of the dispersed sample was left to dry out on a commercial carbon coated Cu TEM grid. TEM images were processed and analyzed with Digital Micrograph 3.9.0 (Gatan Inc) and The Gimp 2.4.0 software packages. A statistical study of TEM images was carried out to quantify nanoparticles sizes. This study consists of the size measurement (diameter) of about 200 particles per sample. The counts were then plotted as frequency histograms and the mean particle size was calculated. In addition, samples were chemically characterized by Energy-dispersive X-ray spectroscopy (EDX) and electron diffraction (ED).
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4

Multiscale Characterization of Nanocomposites

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SEM images were measured on FEI Verious 460 L scanning electron microscope (Hillsboro, OH, USA). AFM images were investigated by Icon Bruker microscope (Ettlingen, Germany). TEM images were measured on a FEI Tecnai G2F20 S-TWIN microscope equipped with an energy-dispersive spectrometer (EDS) (Hillsboro, OH, USA). XPS analysis were measured on a Thermo ESCALAB 250 spectrometer (Shanghai, China). The EC and capacitive properties of the films were determined by combining the in-situ TU-1901 PERSEE UV-vis spectrophotometer (Beijing, China) with an CHI660B Chenhua electrochemical workstation (Shanghai, China) in a three-electrode configuration, where the nanocomposites served as the working electrodes; a Pt plate/Pt wire acted as the counter electrode, and Ag/AgCl was used as the reference electrode.
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5

Negative Staining of DNA Nanostructures

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5 μL of sample containing
DNA objects at a concentration of 2–10 nM was pipetted onto
a plasma-treated carbon grid. The sample droplets were incubated on
the grids for 3 min and then blotted away using filter paper. A 5
μL droplet of 2% aqueous uranyl formate (UFO) solution containing
25 mM sodium hydroxide was pipetted onto the grid and immediately
blotted away. Subsequently, a 20 μL UFO droplet was pipetted
onto the grid, incubated for 30 s, and blotted away. The grids were
air-dried for 20 min before imaging on an FEI Tecnai G2 F20 S-TWIN
microscope at 200 kV.
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6

Transmission Electron Microscopy of Dispersed Samples

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Transmission electron microscopy (TEM) measurements were made using a FEI Tecnai G2 F20 S-Twin microscope, operated at 200 kV. For these studies, a drop of the dispersed sample was left to dry out on a commercial carbon coated Cu TEM grid. TEM images were processed and analyzed with Digital Micrograph 3.9.0 (Gatan Inc) and The Gimp 2.4.0 software packages. In addition, samples were chemically characterized by Energy-dispersive X-ray spectroscopy (EDS or EDX).
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7

Comprehensive Material Characterization Protocol

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Transmission electron
microscopy (TEM) analysis was carried out using a FEI Tecnai G2 F20S-Twin
microscope at a 200 kV accelerating voltage. For sample preparation,
the powders were dispersed in an ethanol solution through sonication,
and then one drop of the suspension was dropped onto a microgrid.
Fourier transform infrared (FTIR) spectra were obtained using a Nicolet
iS5 spectrophotometer (frequency range from 4000 to 500 cm–1) with a KBr pellet. Thermogravimetric analysis (TGA) was performed
on a Setaram Evolution 16/18 apparatus. The samples were heated in
an alumina pan from 30 to 800 °C at a heating rate of 10 °C/min
under a high-purity nitrogen atmosphere. The N2 adsorption–desorption
isotherms were obtained on a Quantachrome autosorb iQ2 analyzer.
Before measurement, the samples were first degassed under vacuum at
393 K for 6 h at a heating rate of 5 °C/min. The specific surface
areas of the samples were calculated using the Brunauer–Emmet–Teller
(BET) method; pore size distribution and pore volume were calculated
using the Barrett–Joyner–Halenda (BJH) model.
X-ray diffraction (XRD) measurements were recorded on a Rigaku Ultima
IV diffractometer using Cu-Kα radiation as the X-ray source
in the 2θ range of 10°–80°. The X-ray photoelectron
spectra (XPS) were recorded on the PHI-5702 instrument, and the C1s line at 284.5 eV was used as the binding-energy reference.
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8

TEM Analysis of Nanostructured Materials

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TEM and HRTEM images and electron diffraction were performed on a FEI Tecnai G2 F20 S-Twin microscope operated at an accelerating voltage of up to 200 kV. The TEM samples were prepared by sonication at 500 W for ∼5 min and 25 μl of the supernatant were dropped onto holey carbon grids.
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9

Multimodal Characterization of Thin Films

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FTIR spectroscopy was conducted using a GangDong FTIR-650 spectrometer (Tianjin, China) between 400 and 4000 cm−1. SEM images were measured on FEI Verious 460 L scanning electron microscope (Hillsboro, OH, USA). AFM images were investigated by Icon Bruker microscope (Ettlingen, Germany). TEM images were measured on a FEI Tecnai G2F20 S-TWIN microscope equipped with an energy-dispersive spectrometer (EDS) (Hillsboro, OH, USA). The TEM sample was prepared by scraping a small amount of the film (0.005 mg) off the FTO substate and dispersing the powder in 1 mL of an ethanol solution by ultrasonication for 40 min. XPS analysis were measured on a Thermo ESCALAB 250 spectrometer (Shanghai, China).
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10

Fimbriae Reconstruction and Visualization by TEM

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Using TEM to observe the reconstruction of fimbriae in vitro, the concentrations of purified mtCfaA-CfaE, mtCfaA-CfaB and CfaC are 0.25 μM, 5 μM and 0.25 μM, respectively, each sample was incubated at 25°C for 24 hours in a buffer containing 10 mM Tris-HCl, pH 7.5 and 20 mM NaCl, negatively stained with 2% (w/v) uranyl acetate for 1 min and imaged using FEI Tecnai G2 F20 S-TWIN microscope. The micrographs were recorded at an accelerating voltage of 200 kV and a magnification of 20,000. To illustrate the effect of different mutations of CfaE on CFA/I fimbriation by TEM, sample cell pastes were resuspended in PBS, pH 7.4 to a density of 107–108 cells mL-1. Formvar/carbon coated 300 mesh copper grids were prepared by adsorbing 2–5 μL bacterial suspensions for 5 minutes. The grids were then negatively stained with 2% uranyl acetate for 1–2 minutes and imaged using a FEI Tecnai G2 F20 S-TWIN transmission electron microscope. Micrographs were recorded at an accelerating voltage of 200 kV.
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