To determine the organic composition of the external layer of QDs, samples werefreeze-dried for 48 h and the powder obtained was mixed with KBr to form a thin pellet. FTIR spectroscopy in a range between 600 and 4000 cm–1 was performed using a NicoletTM iSTM10 (Thermo Fisher Scientific Inc.).
Tecnai g2 f20 s twin microscope
The Tecnai G2 F20 S-Twin microscope is a high-performance, field-emission transmission electron microscope designed for advanced imaging and analytical applications. It features a unique S-Twin lens configuration, providing enhanced resolution and contrast for a wide range of sample types.
Lab products found in correlation
10 protocols using tecnai g2 f20 s twin microscope
Characterization of Biosynthesized Quantum Dots
To determine the organic composition of the external layer of QDs, samples werefreeze-dried for 48 h and the powder obtained was mixed with KBr to form a thin pellet. FTIR spectroscopy in a range between 600 and 4000 cm–1 was performed using a NicoletTM iSTM10 (Thermo Fisher Scientific Inc.).
Characterization of Advanced Composites
Nanoparticle Characterization by TEM
Multiscale Characterization of Nanocomposites
Negative Staining of DNA Nanostructures
DNA objects at a concentration of 2–10 nM was pipetted onto
a plasma-treated carbon grid. The sample droplets were incubated on
the grids for 3 min and then blotted away using filter paper. A 5
μL droplet of 2% aqueous uranyl formate (UFO) solution containing
25 mM sodium hydroxide was pipetted onto the grid and immediately
blotted away. Subsequently, a 20 μL UFO droplet was pipetted
onto the grid, incubated for 30 s, and blotted away. The grids were
air-dried for 20 min before imaging on an FEI Tecnai G2 F20 S-TWIN
microscope at 200 kV.
Transmission Electron Microscopy of Dispersed Samples
Comprehensive Material Characterization Protocol
microscopy (TEM) analysis was carried out using a FEI Tecnai G2 F20S-Twin
microscope at a 200 kV accelerating voltage. For sample preparation,
the powders were dispersed in an ethanol solution through sonication,
and then one drop of the suspension was dropped onto a microgrid.
Fourier transform infrared (FTIR) spectra were obtained using a Nicolet
iS5 spectrophotometer (frequency range from 4000 to 500 cm–1) with a KBr pellet. Thermogravimetric analysis (TGA) was performed
on a Setaram Evolution 16/18 apparatus. The samples were heated in
an alumina pan from 30 to 800 °C at a heating rate of 10 °C/min
under a high-purity nitrogen atmosphere. The N2 adsorption–desorption
isotherms were obtained on a Quantachrome autosorb iQ2 analyzer.
Before measurement, the samples were first degassed under vacuum at
393 K for 6 h at a heating rate of 5 °C/min. The specific surface
areas of the samples were calculated using the Brunauer–Emmet–Teller
(BET) method; pore size distribution and pore volume were calculated
using the Barrett–Joyner–Halenda (BJH) model.
X-ray diffraction (XRD) measurements were recorded on a Rigaku Ultima
IV diffractometer using Cu-Kα radiation as the X-ray source
in the 2θ range of 10°–80°. The X-ray photoelectron
spectra (XPS) were recorded on the PHI-5702 instrument, and the C1s line at 284.5 eV was used as the binding-energy reference.
TEM Analysis of Nanostructured Materials
Multimodal Characterization of Thin Films
Fimbriae Reconstruction and Visualization by TEM
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