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The HRTEM (High-Resolution Transmission Electron Microscope) is a specialized laboratory instrument used for high-magnification imaging and analysis of materials at the atomic and molecular scale. It provides a powerful tool for visualizing and characterizing the microstructure and composition of a wide range of samples, including biological specimens, metals, ceramics, and advanced materials.

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19 protocols using hrtem

1

Characterizing Nanocrystals in Glass Ceramics

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To identify the crystalline phase in GCs, X-ray diffraction (XRD) patterns were performed on a X-ray diffractometer (Bruker, Fällanden, Switzerland) with Cu/Ka (λ = 0.1541 nm) radiation. The morphology and size distribution of the nanocrystals in GCs were measured via high-resolution transmission electron microscopy (HRTEM) (FEI, Hillsboro, OR, USA). UC emission spectra of samples were recorded using an Edinburgh FLS980 fluorescence spectrometer (Edinburgh Instruments, Edinburgh, UK). A 980 nm laser diode (LD) was used as the exciting source for the measurement of UC emission spectra. The emission decay curves were measured using the same spectrometer with a microsecond lamp as the excitation source. All measurements were performed at room temperature.
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2

Morphological Analysis of Emulgel Formulations

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The morphological study of the representative emulgel samples was examined using transmission electron microscopy (TEM, Tecnai-G2, 200 kV, HR-TEM, FEI, Eindhoven, The Netherlands) equipped with an electron source LaB6 and an ultrathin windowed energy dispersive X-Ray system. Prior to measurements, each formulation (10 μL) was placed on a carbon-film-coated 400 mesh copper grid, stained with 2% phosphotungstic acid, air-dried, and studied at 200 kV.
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3

Bio-Synthesis of Gold Nanoparticles from Bee Pollen

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A digital microscopic image of bee pollen was obtained with the help of the Trinocular Stereomicroscope (SMZ745T, Nikon, Japan). The biosynthesis of AuNPs and its catalytic activity was determined by visual inspection and checking the absorption spectra using UV-visible spectrophotometer (Thermo Spectronic, GENESYS™ 8, England) and (SPECORD ® S600 from Analytik Jena, Germany). The shape/size and selective area electron diffraction (SAED) pattern of AuNPs are studied by placing a drop of AuNPs on a carbon coated copper disc and visualizing it using high resolution transmission electron microscopy, HR-TEM (FEI, TECNAI, G2 spirit twin, Holland) having 80 kV accelerating voltage. The average particle diameter and Dynamic Light Scattering (DLS) of the AuNPs was determined using the HORIBA, DLS version LB-550 program (Japan). The Fourier transform infrared spectroscopy (FTIR) measurements of pollen and AuNPs in the attenuated total reflectance (ATR) mode were recorded using Frontier FT-IR spectrophotometer (Perkin Elmer, USA) to identify bee pollen constituents responsible for synthesis and capping of AuNPs. The UV-vis and FTIR graphics have been drawn on the OriginPro 8 program. The geometry of AuNPs was examined using X-ray diffraction (XRD) analyses (PANalytical, Malvern copper λ = 1.54059 Å and EMPYREAN diffractometer, UK) at 45 kV and 40 mA.
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4

Comprehensive Materials Characterization

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Optical microscope (Motic, Xiamen, China) was used to characterize the morphology. Material composition was characterized by X-ray photoelectron spectroscopy (XPS) (Thermo Fisher, Waltham, MA, USA). X-ray diffraction (XRD) (Bruker, Bilerika, MA, USA) and high-resolution transmission electron microscopy (HRTEM) (FEI, Hillsboro, OR, USA) were applied to characterize microstructure. The electric and photoelectric properties were studied on a four-probe table (SEMISHARE, Shenzhen, China) combined with the 2636B source meter (KEITHLEY, Cleveland, OH, USA). For this, 365, 405, 532, 808, and 1550 nm lasers were applied as the probing light sources.
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5

Comprehensive Material Characterization Techniques

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The morphology and crystallinity of the obtained material were performed by scanning electron microscopy (SEM, Carl Zeiss, Merlin Compact, Jena, Germany). The transmission electron microscope (TEM, FEI, Hillsboro, USA) and high-resolution TEM (HRTEM, FEI, Hillsboro, USA) observations were performed with a TEI Tecnai G2 F30 (FEI, Hillsboro, USA) microscope operating at 300 KV, while energy-dispersive X-ray spectroscopy (EDS) and elemental mapping were performed on the transmission electron microscope. On the spectrometer (ESCALAB 250Xi, Thermo Scientific Escalab, Waltham, USA), the X-ray photoelectron spectroscopy (XPS) measurement was carried out. The X-ray power diffraction (XRD) analysis was characterized by an X-ray diffractometer (Empyrean, Panalytical, Malvern, UK) equipped with Cu Kα radiation (λ = 1.5418 Å). Raman spectra were obtained using a 532.8 nm excitation laser on the LabRAM HR EV0 of Horiba Jobin Yvon, Langjoux, France. The optical response of all the samples was obtained by photoluminescence (PL) measurements excited by a 325 nm He-Cd laser. At room temperature, the ultraviolet visible diffuse reflectance spectra (DRS) was recorded on the Shimadzu UV1700-visible spectrophotometer.
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6

Ultrastructural Analysis of Graphene Oxide in HepG2 Cells

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HepG2 cells were treated with the 400µg/ml graphene oxide for 24h. Cells were washed with PBS buffer then fixed with 2% glutaraldehyde for 2 hours and washed twice with PBS before fixation in 1% Osmium tetroxide for 1 hour. Following agarose (1.5%) enrobing, Spurr’s resin embedding, and ultrathin (50nm) sectioning, the samples were stained with 2% aqueous uranyl acetate and 25mg/ml lead citrate and imaged with Transmission Electron Microscope (HRTEM, Tecnai, G20, FEI, Netherlands) (Zhu Z J et al., 2008).
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7

Comprehensive Structural Characterization of Materials

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FT-IR spectra were recorded with a Thermo Fisher 6700 spectrometer by using the KBr pellet method. XRD patterns were obtained with a Rigaku D/Max 2400 diffractometer by using Cu Kα radiation operated at 45 kV and 200 mA. Nitrogen sorption/desorption isotherms were characterized at 77 K with a Micromeritics ASAP 2020 analyzer. Prior to the gas adsorption, powders were outgassed at 120 °C for 8 h under a vacuum of 10−6 Torr. To further characterize the structure, the as-prepared samples were observed and characterized using the SEM (Hitachi, SU8220) and HR-TEM (FEI, Eindhoven, The Netherlands). In addition, XPS measurements were measured using an ESCALAB 250 analyzer with an Al Kα X-ray source and a base pressure of 1 × 10−9 mbar.
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8

TEM Analysis of F9 Formulation Morphology

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The liquid sample of F9 formulation was applied on a copper grid and then stained by 2% phosphotungstic acid and air dried. The sample morphology was analyzed by transmission electron microscopy (TEM) (TECNAI-G2, 200 kV, HR-TEM, FEI, Eindhoven, The Netherlands).
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9

Comprehensive Structural Analysis of Powder

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The morphology of the powder was observed under a field emission scanning electron microscope (FESEM, Supernova, ZEISS) and transmission electron microscope (TEM), High resolution (HRTEM, 300 KV, Tecnai, FEI), while an X-ray diffraction pattern (Ultima IV, Rigaku) with a CuKα target (1.5415 Å) was obtained to ascertain the structural information. Functional band information was observed with a Fourier transform infrared (FTIR) spectrophotometer (Tensor 37, Bruker) in attenuated total reflection (ATR) mode.
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10

Characterization of Zirconium-Aluminum Bimetallic Nanoparticles

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The hydrodynamic size and zeta potential of ZAB were determined using Zetasizer Nano ZS (Malvern Instruments Ltd., Worcestershire, UK). The morphology of ZAB was observed using FE‐SEM (Carl Zeiss, Germany) and HR‐TEM (Tecnai, FEI Company, OR, USA) equipped with a TEM‐EDS analysis system. The structure of the ZAB was characterized by PXRD (D2 Phaser, Bruker, MA, USA). The ZAB was characterized using Fourier transform‐infrared spectroscopy (FTIR) (Spectrum two, PerkinElmer, UK).
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