Auriga base
The Auriga Base is a versatile scanning electron microscope (SEM) platform designed for high-resolution imaging and analysis. It offers a stable and reliable column that enables high-quality imaging and data acquisition. The Auriga Base provides a flexible and modular design that can be customized to meet various research and industrial requirements.
5 protocols using auriga base
Nanoparticle Morphology and Composition
Fabrication of PCL Electrospun Scaffolds
The electrospun fiber morphology and scaffold topology were investigated by using a scanning electron microscope (SEM) (Auriga Base, Zeiss, Jena, Germany).
Electrospun Mats Microstructure Characterization
FTIR spectroscopy analysis was carried out in attenuated total reflectance mode (ATR) (IRAffinity-1S, Shimadzu, Japan). For the analysis, 40 spectral scans in absorbance mode were averaged across the wavenumber range of 4000 to 400 cm−1 with a resolution of 4 cm−1.
Morphological Analysis of SeNPs
Scanning Electron Microscopy Analysis
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