Transmission electron microscopy (TEM) overview images were taken at 200 kV through Philips CM 200 electron microscope and analyzed through the software of ImageJ. The atomic and weight fraction of elements existing in the as-prepared materials was taken via energy-dispersive X-ray (EDX) spectroscopy. High-resolution X-ray photoelectron spectroscopy (XPS) spectra were obtained on a Kratos AXIS UltraDLD ultrahigh vacuum (UHV) surface analysis system. Powder UV–vis-NIR absorption spectra were collected with a PerkinElmer Lambda 750 UV–vis-NIR spectrophotometer. Photoluminescence (PL) measurements were performed with a Horiba Jobin–Yvon Fluoromax-4 spectrofluorometer. Fourier transform infrared spectrometer (FTIR) spectra were conducted with a Bruker Hyperion FTIR spectrometer and cumulated scans at a resolution of 4 cm−1. The dynamic light scattering (DLS) and zeta potential of materials were detected using Malvern ZEN3690.
Hyperion ftir spectrometer
Manufactured by Bruker
The Hyperion FTIR spectrometer is a versatile and high-performance Fourier Transform Infrared (FTIR) spectrometer designed for a wide range of analytical applications. It offers precise and reliable infrared spectroscopic measurements with a spectral resolution of up to 0.4 cm⁻¹. The Hyperion FTIR spectrometer is equipped with advanced features that enable accurate and reproducible data acquisition.
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Lab products found in correlation
Axis ultra dld, by Shimadzu (1 mentions)
Cm200 electron microscope, by Philips (1 mentions)
Zen3690, by Malvern Panalytical (1 mentions)
Tecnai f20, by Thermo Fisher Scientific (1 mentions)
Icp oes, by Thermo Fisher Scientific (1 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
Edx detector, by Bruker (1 mentions)
X ray diffractometer, by Rigaku (1 mentions)
Broadband dielectric impedance spectrometer, by Novocontrol (1 mentions)
Invenio r, by Bruker (1 mentions)
S 4800, by Shimadzu (1 mentions)
Ihr550, by Horiba (1 mentions)
Ftir spectrometer, by Bruker (1 mentions)
5 protocols using hyperion ftir spectrometer
1
Comprehensive Characterization of Materials
2
FTIR Analysis of PyOM Functional Groups
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FTIR spectroscopy was used to characterize oxidized PyOM samples and investigate changes in PyOM functional group composition after exposure to NH3 and NH4+. Two replicates of each PyOM sample were scanned 200 times from 575 to 3500 cm−1 at a resolution of 8 cm−1 using a Bruker Hyperion FT-IR Spectrometer (Bruker, Billerica, Massachusetts) equipped with a ZnSe crystal source (PIKE Technologies, Inc., Madison, Wisconsin). Atmospheric background spectra were subtracted from each sample spectrum. Replicate sample spectra were averaged, baseline corrected, and normalized. Wavenumbers were assigned and peak ratios were calculated for the following functional groups: 752–761, 813–823, and 875–915 cm−1 to aromatic C–H out of plane deformation, 1690–1715 cm−1 to carbonyl/carboxyl and ketonic C=O stretching, and 1581–1609 cm−1 to aromatic C=C vibrations and stretching (OPUS, Bruker, Billerica, Massachusetts).
3
Nanostructure Characterization Techniques
4
Comprehensive Characterization of Al-MnO2 Battery
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dc ionic conductivity and EIS were measured using a Novocontrol broadband dielectric/impedance spectrometer. Field-emission SEM (FESEM) images of MnO2 cathode and Al anode were obtained using a Leo 1550 Keck FESEM, in which EDX analysis was also carried out with a Bruker EDX detector. The XRD pattern of α-MnO2 cathodes during electrochemical reaction was taken with a Rigaku x-ray diffractometer. ATR-FTIR spectra of different electrolytes were obtained using a Bruker Hyperion FTIR spectrometer. XPS SSX-100 was applied to study the chemistry information of SEI on the Al surface and MnO2 cathodes. Galvanostatic measurements of Al batteries were performed using Neware battery testers at room temperature. CV diagram was performed on an electrochemical workstation of CH 600E. TEM images were obtained from the FEI Titan Themis CryoS/TEM, in which EELS spectra were obtained using a Gatan GIF Tridiem energy filter.
5
Characterization of C-PANI Electrode
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The samples were characterized by SEM (Hitachi S-4800, 5 kV), XPS (Kratos Analytical AXIS-Ultra with monochromatic Al Kα X-ray) and TEM (JEM-F200). C-PANI and PANI were polymerized directly onto the surface of carbon cloth as a working electrode. Samples for ex situ XPS measurements at different voltages were prepared in a nitrogen-filled glovebox, kept dry and removed for testing without the need for transport procedures. For in situ Raman testing, the Fe||C-PANI cell was assembled inside a nitrogen-filled glovebox using an in situ Raman spectroscopy electrochemical cell (C031-1, GaossUnion). All binding energy values of the XPS results were referenced to the C 1s peak of carbon at 284.8 eV. Raman spectroscopy (HORIBA iHR550, excitation light of ~633 nm) and FTIR spectra (Bruker Hyperion FTIR spectrometer). The spectral emittance of the devices was tested by an INVENIO-R (Bruker) FTIR spectrometer in the spectral range of 2.5–25 µm (equipped with an integrating sphere). The C-PANI for tTEM was scraped off the carbon cloth with a knife.
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