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Jem 2200fs eftem stem 200 kv

Manufactured by JEOL

The JEM-2200FS EFTEM/STEM is a 200 kV electron microscope designed for high-resolution imaging and analysis. It combines energy-filtered transmission electron microscopy (EFTEM) and scanning transmission electron microscopy (STEM) capabilities in a single integrated system.

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2 protocols using jem 2200fs eftem stem 200 kv

1

Comprehensive Characterization of MXene-Polymer Hybrids

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X-ray photoelectron
spectroscopy (XPS) measurements were performed with a Thermo Fisher
Scientific Escalab 250 XI system with an Al Kα source. Raman
spectra were performed by a Thermo Scientific DXR2xi Raman imaging
microscope (excitation wavelength, λ = 785 nm). The microstructure
of synthesized material was studied by field-emission scanning electron
microscopy (FESEM, Zeiss ULTRA plus and equipped with EDX), transmission
electron microscopy (TEM, JEOL JEM-2200FS EFTEM/STEM 200 kV), and
energy-dispersive X-ray elemental mapping. Fourier transform infrared
spectroscopy (FTIR) of MXene–polymer hybrid was performed on
a Spectrum Two FT-IR spectrometer with an ATR model (PerkinElmer,
UK). The X-ray diffraction (XRD) was carried out by Rigaku Smart Lab
9 kW, Cu Kα-radiation with a 0.02° of step width. Dynamic
light scattering (DLS) data were obtained using a Zeta sizer Nano
ZS 90.
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2

Microstructural Characterization of Melamine Foam

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Field emission
scanning electron microscopy (FESEM, Zeiss Ultra Plus, equipped with
EDX) and transmission electron microscopy (TEM, JEOL JEM-2200FS EFTEM/STEM
200 kV) was used to study the microstructure of the materials. Because
of the insulating electrical behavior of the melamine foam ∼20
nm of carbon was sputtered on the polymer samples before imaging.
Raman spectroscopy was carried out using a Horiba Jobin-Yvon LabRAM
HR800 device with an excitation of λ = 488 nm. The elemental
composition was assessed by energy dispersive X-ray spectroscopy (EDX)
with a detector installed on the FESEM.
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