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Lv150

Manufactured by Nikon
Sourced in Japan

The LV150 is a compact and versatile laboratory microscope designed for a variety of applications. It features a range of magnification options, LED illumination, and a durable construction. The LV150 is a reliable tool for basic microscopy tasks.

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6 protocols using lv150

1

Optical and Fluorescence Microscopy Imaging

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Optical and fluorescence microscopy images were obtained at room temperature with a Nikon LV150, which was equipped with a high-intensity white light LED source and a 5 mega pixel color camera for image acquisition. Optical microscopy pictures were captured in the bright field mode. Fluorescence microscopy images were captured in the fluorescence mode.
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2

Characterizing Graphene Surface Topography

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The roughness and homogeneity of the graphene were measured by an atomic force microscope (NT-MDT Ntegra, Moscow, Russia). The surface images (2400 × 2400 pixels) of the graphene samples were captured by an optical microscope (Nikon LV150, Tokyo, Japan) with a digital camera DS-Fi3. To investigate graphene’s surface, we additionally used the scanning electron microscope using the acceleration voltage of 3 kV (JEOL JSM-7001F, Tokyo, Japan).
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3

Surface Morphology Analysis of SnS2 and SnSe2 Films

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The surface morphology of SnS2 and SnSe2 thin films was analysed by an optical microscope (Nikon LV150, Tokyo, Japan) with a digital camera DS-Fi3, as well as the scanning electron microscope (SEM) using the acceleration voltage of 30 kV and different magnifications (JEOL JSM-7001F, Tokyo, Japan) to prove films homogeneity. The film surface morphology was studied by atomic force microscopy (AFM, notegra, Nt-MDT Spectrum Instruments, Moscow, Russia) in semi-contact mode using a silicon tip with a radius <10 nm and resonance frequency of ~250 kHz (HA_NC Etalon, Tipsnano, Tallinn, Estonia) to determine surface roughnesses and films thicknesses.
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4

Characterization of Epitaxial MoS2 Monolayer

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The roughness and homogeneity of the epitaxial MoS2 monolayer were measured by an atomic force microscope (NT-MDT Ntegra, Moscow, Russia). The MoS2 MBE fabricated sample was characterized immediately after unsealing without any pollution at ambient conditions, and thus these defects demonstrated in AFM and SEM in Figure 1d–f are the result of an MBE fabrication procedure. These defects might be Mo nucleation sites. The surface images (2400 × 2400 pixels) of the MoS2 samples were captured by an optical microscope (Nikon LV150, Tokyo, Japan) with a digital camera DS-Fi3. To investigate the MoS2 surface morphology, we additionally used the scanning electron microscope using the acceleration voltage of 3 kV (JEOL JSM-7001F, Tokyo, Japan).
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5

Condensation Dynamics on Superhydrophobic Surfaces

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Condensation experiments were performed in a closed room with an area of 25 m2 and a height of 3 m. The ambient temperature was controlled at 28 ± 1°C and the relative humidity (RH) was adjusted at 80 ± 2%. The surface superhydrophobilized aluminum foils with a size of 3 cm × 3 cm × 0.5 mm were placed on a horizontally orientated Peltier cooling stage with the hot side cooled by recirculating water. The sample surface was maintained at 0–1°C. The spontaneous motion of condensate droplets was observed and visualized by an optical microscope (Nikon LV 150) with a ×10 objective and charge-coupled device camera (CCD) at 25 fps. The phenomena were quantified by analyzing 2 min representative videos. Four short periods of time (only 1 s) spacing 30 s, all together 5 × 25 pieces of snapshots were used to quantify the average numbers of distinguishable drop location changes in 1 s videos (here named as “spontaneous motion frequency”) (Feng et al., 2012a (link); Feng et al., 2012b (link)).
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6

Morphological Analysis of ZnO Nanostructures

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The morphology of the ZnO nanostructures was observed by scanning electron microscopy (SEM) using a TESCAN LYRA 3 XMH instrument. Microwires were studied using an optical microscope (model D800; Nikon) equipped with a digital camera (model LV-150; Nikon). A white LED was used as the light source.
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