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Ecsalab 250

Manufactured by Thermo Fisher Scientific
Sourced in France

The ECSALAB 250 is a laboratory equipment product manufactured by Thermo Fisher Scientific. It is designed for electrochemical analysis and characterization applications in a laboratory setting. The core function of the ECSALAB 250 is to provide accurate and reliable measurements for various electrochemical techniques, such as potentiometry, voltammetry, and electrochemical impedance spectroscopy.

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9 protocols using ecsalab 250

1

Comprehensive Characterization of Carbon Materials

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Field emission
scanning electron microscopy (SEM, Carl Zeiss, Germany) and transmission
electron microscopy (TEM, JEM2010-HR, 200 kv) images were taken to
observe the morphologies of the samples. Compositional information
was determined by X-ray photoelectron spectroscopy (XPS) spectra recorded
on a Thermo ECSALAB 250 electron spectrometer using Al Kα radiation,
and Raman spectroscopy was performed using a confocal laser micro
Raman spectrometer (HR800UV, HORIBA Jobin Yvon, France) with the excitation
wavelength at 633 nm. The Brunauer–Emmett–Teller (BET)
surface area and porous structure of the carbon were studied by the
classical analysis of nitrogen adsorption–desorption isotherms
using an ASAP2020 instrument at −196 °C.
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2

Microstructural Characterization of E-Al82Cu18 and Al2Cu Alloys

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The electronic microstructures of E-Al82Cu18 and Al2Cu alloy sheets were characterized by a field-emission scanning electron microscope equipped with an X-ray energy-dispersive spectroscopy (JEOL, JSM-6700F, 8 kV) and a field-emission transmission electron microscope (JEOL, JEM-2100F, 200 kV). The metallographic microstructure of E-Al82Cu18 alloy was observed on a confocal laser scanning microscope (OLS3000, Olympus) after a chemical etching in a Keller solution. X-ray diffraction measurements of all specimens were performed on a D/max2500pc diffractometer with a Cu Kα radiation. Raman spectra were measured on a micro-Raman spectrometer (Renishaw) at the laser power of 0.5 mW, in which the laser with a wavelength of 532 nm was equipped. X-ray photoelectron spectroscopy analysis was conducted on a Thermo ECSALAB 250 with an Al anode. Charging effects were compensated by shifting binding energies based on the adventitious C 1s peak (284.8 eV). O2 concentrations and Cu/Al ion concentrations in electrolytes were analyzed by portable DO meter (az8403) and inductively coupled plasma optical emission spectrometer (ICP-OES, Thermo electron), respectively.
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3

Comprehensive Characterization of Nanoporous Electrodes

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Microstructure characterizations and elements analysis of nanoporous electrodes were conducted on a thermal field emission scanning electron microscopy (JSM-7900F, JEOL, 5 kV) equipped with X-ray energy-dispersive spectroscopy. Low-magnification and high-resolution TEM images were obtained by a field-emission transmission electron microscope (JEOL JEM-2100F, 200 kV). X-ray diffraction measurements of nanoporous electrodes were performed on a Rigaku smartlab diffractometer with a monochromatic Cu Kα radiation. Chemical states of surface elements were analyzed using X-ray photoelectron spectroscopy (Thermo ECSALAB 250) with an Al anode. Charging effect was compensated by shifting binding energies according to the C 1 s peak (284.8 eV). Raman spectra were collected on a micro-Raman spectrometer (Renishaw) equipped with a 532-nm-wavelength laser at a power of 0.5 mW. The concentrations of metal ions were measured by inductively coupled plasma optical emission spectroscopy (ICP-OES, Thermo electron).
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4

Comprehensive Characterization of EDOT-Based Electrode Materials

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The 1H nuclear magnetic resonance (NMR) was performed on a 400 MHz NMR spectrometer (Bruker AMX 400 system) to confirm the chemical structures of EDOT‐MeCl and EDOT‐CQH2 monomer. Ex situ FT‐IR spectra (BRUKER VECTOR 22 Spectrometer) were used to characterize the structure changes of anodes and cathodes during different charged/discharged stages. Raman spectra (Renishaw's InVia Raman Microscopes) and XPS (Thermo ECSALAB 250) were also used to clarify the reaction mechanism of the cathode, accompanied by C1s peak calibration (284.8 eV). Crystal structures of PUQ powder and anode were characterized using Rigaku wide‐angle X‐ray diffractometer (XRD, D/max rA, using Cu Kα radiation, λ = 1.5406 Å). Morphology was observed using field‐emission SEM (FEI Nova Nano SEM 450) before and after long‐term cycles.
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5

Multimodal Characterization of Nanoporous Electrocatalysts

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Microstructure characterizations and chemical component analysis of nanoporous electrocatalyst electrodes were performed on a field-emission scanning electron microscope (JSM-6700F, JEOL, 7 keV) equipped with X-ray energy-dispersive spectroscopy (EDS), and a field-emission transition electron microscope (JEM-ARM300F, JEOL) equipped with double spherical-aberration correctors for both condenser and objective lens, respectively. XRD measurements of nanoporous electrocatalyst electrodes were conducted on a D/max2500pc diffractometer with a monochromated Cu Kα radiation. Chemical states and distribution of surface elements were analyzed using XPS and LEIS on a Thermo ECSALAB 250 with an Al anode. Charging effects were compensated by shifting binding energies according to the C 1 s peak (284.8 eV). Inductively coupled plasma optical emission spectrometry (ICP-OES, Thermo electron) analysis was conducted to determine the concentrations of metal ions. Raman spectra were measured on a micro-Raman spectrometer (Renishaw) equipped with 532 nm-wavelength laser at a power of 0.5 mW.
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6

Nanoporous Zn, Cu/Zn, Zn_x Cu_y/Zn Characterization

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The microstructural and chemical features of nanoporous Zn, Cu/Zn and ZnxCuy/Zn sheets were characterized by a field-emission scanning electron microscope equipped with an X-ray energy-dispersive spectroscopy (SEM–EDS, JEOL, JSM-7900F, 15 kV) and a field-emission transition electron microscope (TEM, JEOL, JEM-2100F, 200 kV). X-ray diffraction (XRD) measurements of all specimens were taken on a D/max2500pc diffractometer with a Cu Kα radiation. Raman spectra were measured on a micro-Raman spectrometer (Renishaw) with a 532-nm-wavelength laser at the power of 0.5 mW. X-ray photoelectron spectroscopy (XPS) analysis was conducted on a Thermo ECSALAB 250 with an Al anode. Charging effects were compensated by shifting binding energies based on the adventitious C 1 s peak (284.8 eV). Ion concentrations in electrolytes were analyzed by inductively coupled plasma optical emission spectrometer (ICP-OES, Thermo electron).
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7

Comprehensive Microstructural Characterization of Vanadium Oxide Compounds

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The microstructures of NP c-V2O3, c-V2O3/r-VO2−x and r-VO2 were investigated using a field-emission scanning microscope (JEOL JSM-6700F, 15 keV) and a field-emission transmission electron microscope (JEOL JEM-2100F, 200 keV). HR-STEM characterization was performed on a field-emission transition electron microscope (JEM-ARM200F, 200 kV) equipped with double spherical aberration correctors for the condenser lens and objective lens. The chemical composition was characterized by X-ray photoelectron spectroscopy on Thermo ECSALAB 250 with an Al anode. Binding energies were calibrated using containment carbon (C 1s = 284.6 eV). Nitrogen adsorption/desorption isotherms at 77 K were measured on a micromeritics ASAP 2020 system to evaluate the specific surface area by the BET method, as well as the pore volume and the pore size by the Barrett–Joyner–Halenda (BJH) method. X-ray diffraction measurements were performed on a D/max2500pc diffractometer using Cu Kα radiation. Raman spectra were collected using a micro-Raman spectrometer (Renishaw) with a laser of 532 nm wavelength at 0.2 mW. Temperature dependence of resistivity was collected on Hall Effect measurement system (HMS-5000).
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8

Nanoporous Catalyst Characterization Methods

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Field-emission scanning electron microscope (JSM-6700F, JEOL, 15 keV) equipped with X-ray energy-dispersive spectroscopy (EDS) was employed to characterize microstructure and chemical composition of nanoporous catalysts. High-resolution transmission electron microscopy (HRTEM) and scanning transmission electron microscopy (STEM) characterizations were performed on a field-emission transmission electron microscope (JEM-2100F, JEOL, 200 keV) and a field-emission transition electron microscope (JEM-ARM200CF, JEOL) operated at 200 keV and equipped with double spherical-aberration correctors for both condenser and objective lens, respectively. X-ray diffraction patterns of all nanoporous catalyst electrodes were collected from a D/max2500pc diffractometer with a monochromated Cu Kα radiation. X-ray photoelectron spectroscopy (XPS) analysis was conducted on a Thermo ECSALAB 250 with an Al anode. Charging effects were compensated by shifting binding energies based on the adventitious C 1s peak (284.8 eV). Atomic ratio of elements was analyzed using ICP-MS (Thermo electron). N2 adsorption/desorption isotherms were collected at 77 K by a Micromeritics (ASAP 2020 Plus) system.
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9

Microstructural Analysis of Zn-Al Alloy Sheets

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The metallographic microstructure of ZnxAl100−x alloy sheets was investigated by using a confocal laser scanning microscope (OLS3000, Olympus) after conventional grinding and mechanical polishing, followed by chemical etching in acetic picric solution (5 ml HNO3 and 5 ml HF, 90 ml ultrapure water). The electron micrographic structures were characterized by using a field-emission scanning electron microscope (JEOL, JSM-6700F, 15 kV) equipped with an X-ray energy-dispersive microscopy, and a field-emission transmission electron microscope (JEOL, JEM-2100F, 200 kV). XRD measurements were conducted on a D/max2500pc diffractometer using Cu Kα radiation. Ion concentrations in electrolytes were analyzed by inductively coupled plasma optical emission spectrometer (ICP-OES, Thermo electron). XPS analysis was conducted on a Thermo ECSALAB 250 with an Al anode. Charging effects were compensated by shifting binding energies based on the adventitious C 1s peak (284.8 eV).
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