To demonstrate whether the parameters of the prepared scaffolds, such as pore size and porosity, are the same as those of the pre-designed model, we performed characterization tests on the scaffolds. The porosity of prepared porous scaffolds was measured by a SkyScan 1076 scanner Microcomputed Tomography (Micro-CT, Bruker, Kontich, Belgium). In addition, in order to detect the average pore diameter of these Ti6Al4V scaffolds, the microstructure of samples was photographed by a SIGMA500 scanning electron microscope (SEM, ZEISS, Oberkochen, Germany), and pictures were quantitative analysis by Image J software (NIH, Bethesda, MD, USA).
Sigma 500 scanning electron microscope
The Sigma 500 scanning electron microscope is a high-resolution imaging and analytical tool designed for materials science and nanotechnology research. It provides detailed surface information and elemental analysis of a wide range of samples at the nanometer scale. The Sigma 500 offers excellent imaging capabilities, advanced analytical functionalities, and user-friendly operation.
9 protocols using sigma 500 scanning electron microscope
Characterization of 3D Printed Titanium Scaffolds
To demonstrate whether the parameters of the prepared scaffolds, such as pore size and porosity, are the same as those of the pre-designed model, we performed characterization tests on the scaffolds. The porosity of prepared porous scaffolds was measured by a SkyScan 1076 scanner Microcomputed Tomography (Micro-CT, Bruker, Kontich, Belgium). In addition, in order to detect the average pore diameter of these Ti6Al4V scaffolds, the microstructure of samples was photographed by a SIGMA500 scanning electron microscope (SEM, ZEISS, Oberkochen, Germany), and pictures were quantitative analysis by Image J software (NIH, Bethesda, MD, USA).
Comprehensive Tailings Characterization Protocol
Zeiss Sigma 500 scanning electron microscope was used to detect the tailings by SEM, and EDS scanning energy spectrometer was used to detect the chemical substances on the surface of the samples. The tailing sand samples were ground to 200 mesh, and XRD detection was conducted. The scanning step for XRD detection with Bruker D8 Advance X-ray diffractometer was 5–90°.
SEM Analysis of PNR Films
Comprehensive Analytical Techniques for Material Characterization
Scanning Electron Microscopy of H. pylori
SEM Imaging of Ferritin Crystals
Histological Analysis of Spikelet Hulls
Comprehensive Characterization of Synthesized Samples
samples was investigated using a ZEISS Sigma-500 scanning electron
microscope (Germany). The elemental distribution and mapping were
obtained using Energy Dispersive Spectroscopy (EDS, BRUKE XFlash-6130,
Germany). TEM images were captured on a JEM2100 instrument at an acceleration
voltage of 200 kV. The surface elemental composition was evaluated
using XPS from Thermo Scientific ESCALAB 250Xi, USA, with a monochrome
Al Kα as the X-ray source. The N2 adsorption–desorption
isotherm analysis of the samples was performed by a Quantachrome Autosorb-iQ2-MP
(USA) Nova-1000 system at −196 °C. The degassing of the
samples was performed at 250 °C for 3 h. The specific surface
and pore size distribution were analyzed using Brunauer–Emmett–Teller
(BET) and density functional theory (DFT) methods, respectively.
SEM Analysis of H. pylori Morphology
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