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Su1510 microscope

Manufactured by Hitachi

The SU1510 is a scanning electron microscope manufactured by Hitachi. It is designed to provide high-resolution imaging of samples by using a focused beam of electrons to scan the surface of the specimen. The SU1510 microscope is capable of magnifying and analyzing samples at the nanoscale level.

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3 protocols using su1510 microscope

1

Scanning Electron Microscopy of Films

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The surface morphologies of the films were observed by scanning electron microscopy using a Hitachi SU-1510 microscope with an accelerating voltage of 20 keV. The films were coated with a carbon layer to increase the quality of the images.
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2

Characterization of Click-Functionalized Fibers

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Infrared spectroscopy was carried out using a Thermo Scientific Nicolet iS10 FT-IR spectrometer, 32 acquisitions were performed at room temperature at a resolution of ±4 cm−1.
Scanning electron microscopy (SEM) was used to evaluate the effect of click chemistry and chemical treatments on fiber morphology. SEM images were obtained using a Hitachi SU1510 microscope operating in secondary electron mode with a beam current of 100 mA and an accelerating voltage of 15 kV. The SEM is equipped with an Energy Dispersive X-Ray Spectroscopy (EDX, Oxford instrument X-Max 20 mm2) which was used for the chemical characterization of the surface of fiber pellets composed of homogeneously ground samples. We are more interested in the external surface of fibers since interfiber interactions occur only at the external surface of fibers. The propargyl, tosyl and azide groups present on the functionalized surface of KFT are mainly composed of carbon, sulfur, nitrogen, and oxygen. Three trials were completed for each sample.
The calculation of the surface degree of substitution (DS) for each intermediate was calculated using EDX data. Specific hypotheses tailored to each reaction guided DS calculations. Table 1 presents the hypotheses and corresponding formulas used for DS calculation in each reaction.
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3

Characterization of Hypercrosslinked Polymers

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Fourier-transform infrared (FTIR) spectra of HCPs were obtained by using a Nicolet 6700 spectrometer over a wave number range of 4000–400 cm−1 by scanning 32 times at a resolution of 4 cm−1. TG analysis of the polymers were conducted with a NETZSCH TG 209F1 TG analyzer for 40–800 °C at a heating rate of 10 °C min−1 under a nitrogen flow of 50 mL min−1. The X-ray diffraction (XRD) patterns of the as prepared polymers were collected using a PANalytical X’pert Pro MPD diffractometer with Cu Kα radiation at room temperature, with step size of 0.0202°, 2θ ranging from 5.0 to 60°. Scanning electron microscope (SEM) measurements of obtained samples were carried out using a Hitachi SU1510 microscope. The nitrogen adsorption and desorption and the CO2 adsorption and desorption isotherms of HCPs were obtained using a GAPP V-Sorb 2800P BET surface area and pore volume analyzer. Polymers were degassed at 100 °C for over 10 h under vacuum before all gas analysis experiments.
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