Su1510 microscope
The SU1510 is a scanning electron microscope manufactured by Hitachi. It is designed to provide high-resolution imaging of samples by using a focused beam of electrons to scan the surface of the specimen. The SU1510 microscope is capable of magnifying and analyzing samples at the nanoscale level.
Lab products found in correlation
3 protocols using su1510 microscope
Scanning Electron Microscopy of Films
Characterization of Click-Functionalized Fibers
Scanning electron microscopy (SEM) was used to evaluate the effect of click chemistry and chemical treatments on fiber morphology. SEM images were obtained using a Hitachi SU1510 microscope operating in secondary electron mode with a beam current of 100 mA and an accelerating voltage of 15 kV. The SEM is equipped with an Energy Dispersive X-Ray Spectroscopy (EDX, Oxford instrument X-Max 20 mm2) which was used for the chemical characterization of the surface of fiber pellets composed of homogeneously ground samples. We are more interested in the external surface of fibers since interfiber interactions occur only at the external surface of fibers. The propargyl, tosyl and azide groups present on the functionalized surface of KFT are mainly composed of carbon, sulfur, nitrogen, and oxygen. Three trials were completed for each sample.
The calculation of the surface degree of substitution (DS) for each intermediate was calculated using EDX data. Specific hypotheses tailored to each reaction guided DS calculations.
Characterization of Hypercrosslinked Polymers
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