2010 field emission gun transmission electron microscope
The 2010 field emission gun transmission electron microscope is a high-performance instrument designed for advanced materials analysis. It utilizes a field emission gun to produce a high-brightness electron beam, enabling high-resolution imaging and analytical capabilities. The 2010 FEG TEM is capable of providing detailed structural and compositional information at the nanoscale level.
Lab products found in correlation
2 protocols using 2010 field emission gun transmission electron microscope
Particle Characterization via Electron Microscopy
Particle Characterization via Electron Microscopy
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