Fourier transform infrared spectroscopy (FTIR) (Equinox 55, Bruker Optik GmbH), and energy-dispersive X-ray (EDX) analysis (MIRA 3-XMU, Tescan, Kohoutovice) were employed for approval of the chemical structure of polymer and nanocomposite. X-ray diffraction (XRD) (D8 Advance X-ray diffractometer, Bruker Optik GmbH), field emission scanning electron microscope (FESEM) (MIRA 3-XMU, Tescan, Kohoutovice), and transmission electron microscope (Philips CM200) were employed for characterization of crystallinity and morphology, respectively. Zeta potential was measured by using Zeta Meter 4.0, Zeta Meter Inc. Specific surface area determinations were done by the Brunauer–Emmett–Teller (BET, Belsorp mini II, Microtrac Bel Corp) technique with the BELCAT-A instrument. Thermogravimetric analysis (TGA, L81A1750, Linseis) was employed for studying the thermal stability of products. Flame atomic absorption instrument (AAS) (Hewlett-Packard 3510) was applied for measuring the concentration of lead(II) ions in the solution.
Mira3 xmu
Manufactured by TESCAN
Sourced in Czechia, United States, Germany
The Mira3 XMU is a versatile scanning electron microscope (SEM) developed by TESCAN. It features a high-resolution electron column and advanced imaging capabilities to provide detailed analysis of a wide range of samples. The core function of the Mira3 XMU is to enable high-quality imaging and data collection for scientific research and industrial applications.
Automatically generated - may contain errors
Lab products found in correlation
D8 advance x ray diffractometer, by Bruker (2 mentions)
Equinox 55, by Bruker (2 mentions)
Cm200, by Philips (1 mentions)
Jem f200, by JEOL (1 mentions)
Xrf 1800, by Shimadzu (1 mentions)
Ultima 4, by Rigaku (1 mentions)
Tga sdta 851, by Mettler Toledo (1 mentions)
Vector 22 ftir, by Bruker (1 mentions)
X pert high score software, by Philips (1 mentions)
Carbon conductive tabs, by Ted Pella (1 mentions)
Pelco tab, by Ted Pella (1 mentions)
Stemi 2000 c, by Zeiss (1 mentions)
Axiocam erc5, by Zeiss (1 mentions)
Reichert microscope, by Reichert Technologies (1 mentions)
Spectrum one, by PerkinElmer (1 mentions)
T80 uv vis spectrophotometer, by PG Instruments (1 mentions)
Tg 209 f3, by Netzsch (1 mentions)
Smartlab se, by Rigaku (1 mentions)
α 2 ftir spectrometer, by Bruker (1 mentions)
Dm ilm, by Leica camera (1 mentions)
53 protocols using mira3 xmu
1
Comprehensive Characterization of Polymer Nanocomposites
2
Characterization of Mn5Si3 Nanorods
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The phase composition of the brass alloys and the crystal structure of the prepared nanorod samples were analyzed by an X-ray diffractometer (XRD, Rigaku Ultima IV, Tokyo, Japan). The purity of the Mn5Si3 nanorods was determined through X-ray fluorescence (XRF, Shimadzu XRF1800, Kyoto, Japan). The yield was calculated from the ratio of acquisition to addition using an analytical balance with a precision of 0.0001 g. The microstructures were characterized using a scanning electron microscope (SEM, Tescan Mira 3XMU, Brno, Czech Republic) equipped with an energy dispersive spectrometer (EDS), and a transmission electron microscope (TEM, JEOL JEM-F200, Tokyo, Japan). Magnetic properties were measured using a vibrating sample magnetometer (VSM, LakeShore-7404, Westerville, OH, USA) with a maximum applied magnetic field of 10 KOe at room temperature. Thermogravimetric (TG) analysis and differential thermal analysis (DTA) were carried out using a thermoanalyser apparatus (Mettler-Toledo, TGA/SDTA851, Columbus, OH, USA) to evaluate the oxidation resistance of Mn5Si3 nanorods in air. The nanorod samples were heated from room temperature to 1273 K at a constant rate of 10 K/min.
3
Characterization of Curcumin-Loaded Nanoparticles
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The surface morphology and size distribution of curcumin-loaded ALG-CS-STPP NPs were characterized by field emission scanning electron microscopy (FE-SEM; Mira 3 XMU; TESCAN, Brno, Czech Republic), atomic force microscopy (AFM; Easyscan 2 Flex, Liestal, Switzerland), and Fourier transform infrared (FT-IR) spectroscopy. The FT-IR spectroscopy of curcumin, ALG-CS-STPP NPs, and curcumin-loaded NPs were obtained by using FT-IR spectrophotometer (Vector 22 FT-IR; Bruker Optik GmbH, Ettlingen, Germany).
4
Structural and Electrochemical Analysis of Fe3O4 Nanocomposites
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X-ray diffraction (XRD) (Co-Kα, Philips) was used to investigate the crystalline structure of Fe3O4 nanoparticles and the average crystallite size of Fe3O4 nanoparticles were calculated using PANalytical X'Pert HighScore software according to Scherrer equation. The PVA-Fe3O4 and its interaction with GOx were characterized by Fourier transform infrared (FTIR) spectrophotometer (Nicolet, NEXUS 670). Field emission scanning electron microscopy (FE-SEM) (TESCAN, Mira 3-XMU) was used to study the surface morphology of the prepared nanocomposite films. Electrochemical impedance spectroscopy (EIS) was performed on PVA/Sn, PVA-Fe3O4/Sn electrode and GOx/PVA-Fe3O4/Sn bioelectrode with 4 mg mL -1 GOx in the absence of glucose in the frequency range, 0.01-10 5 Hz. Cyclic voltammetry (CV) of PVA/Sn film, PVA-Fe3O4/Sn electrode and GOx/PVA-Fe3O4/Sn bioelectrode with 4 mg mL -1 GOx were investigated between -0.9 and 0.7 V with the scan rate of 50 mVs -1 . All electrochemical measurements were carried out on an Autolab Potentiostat/Galvanostat at room temperature in PBS buffer (pH = 7) solution, utilizing three-electrode system with a Sn electrode as working electrode, a Pt wire as auxiliary electrode and an Ag/AgCl electrode as reference.
5
Nanostructure Imaging via SEM
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Nozzles were mounted directly onto SEM pin stub holders using Carbon Conductive Tabs (PELCO Tabs™, Ted Pella) or printed on ITO slides with conductive liquid silver paint, (PELCO® Colloidal Silver, TedPella), then sputter coated with 15 nm platinum (Cressington 208 HR, High Resolution Sputter Coater) and imaged in a Tescan MIRA3 XMU.
6
Fracture Surface Characterization of Cast and Chip-Based Specimens
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In order to be able to characterize in particular the deformation and crack propagation behavior of the specimens, the fracture surfaces of the tested specimens were examined in a scanning electron microscope (SEM) (Tescan Mira 3 XMU, Brno, Czech Republic). For a comprehensive characterization of the fracture surfaces, both the information of the element-sensitive backscattered electron detector and the secondary electron detector suitable for topological information were evaluated. Previously, the fracture surfaces were cleaned in an ethanol-filled ultrasonic bath. The investigations were intended to detect stress-dependent changes in the type, shape, and size of cracks and to determine differences in the fatigue behavior between the cast- and chip-based specimens. For the chip-based specimens, knowledge about the preferred crack propagation direction and the role of the welded chips in the fatigue process, as well as their interaction, was gained.
7
Nanofiber Surface Morphology Analysis
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The surface morphology of nanofibers was determined by scanning electron microscopy (SEM, model TESCAN MIRA3XMU, Brno, Czech Republic) using a voltage of 10 kV and a magnification of 50,000. The size distribution of the obtained nanofibers was determined from the SEM images using the Image J software V 1.8.0, which analyzed no less than 100 fibers.
8
Preparation and Imaging of Cross-Sections
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The CitoPress-10 hot mounting press (Struers, DK) was used for the PolyFast and LevoFast resins.
A Leica EM ACE 600 high-vacuum coater was used for the application of a carbon coating of 30 nm in Preparation B.
The grinding and polishing of the cross-sections were done as described in Jaques and Zikmundová (unpublished). Before the sample was reached, the polishing mode was changed from wet to dry47 (link).
The first observations of the cross-sections were made under the Stemi 2000-C and Stemi 508 stereomicroscopes (Zeiss, DE) and a Reichert microscope (Reichert Technologies, US) coupled to an Axiocam ERc 5 s (Zeiss, DE).
The scanning electron microscope used for this study is a MIRA3 XMU (Tescan, CZ). Both the high-vacuum (5 mbar to 9 × 10–5 mbar) mode and the low-vacuum (0.07 mbar to 5 mbar) mode with a secondary electron detector (LVSTD mode) were used.
A Leica EM ACE 600 high-vacuum coater was used for the application of a carbon coating of 30 nm in Preparation B.
The grinding and polishing of the cross-sections were done as described in Jaques and Zikmundová (unpublished). Before the sample was reached, the polishing mode was changed from wet to dry47 (link).
The first observations of the cross-sections were made under the Stemi 2000-C and Stemi 508 stereomicroscopes (Zeiss, DE) and a Reichert microscope (Reichert Technologies, US) coupled to an Axiocam ERc 5 s (Zeiss, DE).
The scanning electron microscope used for this study is a MIRA3 XMU (Tescan, CZ). Both the high-vacuum (5 mbar to 9 × 10–5 mbar) mode and the low-vacuum (0.07 mbar to 5 mbar) mode with a secondary electron detector (LVSTD mode) were used.
9
Spectroscopic and Thermal Analysis of O-CNT-PEG
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IR measurements were performed by (Perkin Elmer Spectrum One, Fourier transform infrared [FT-IR]; Shelton, CT, USA). Thermogravimetric analysis (TGA) was carried out (BAHR-Thermoanalyse Gmbh, TGA; Hüllhorst, Germany) under dynamic atmosphere of an inert gas (N2) at 30 mL/min (room temperature). Field emission scanning electron microscopic (FESEM) analyses were performed (TESCAN MIRA 3-XMU, FESEM; Brno, Czech Republic). UV–Vis absorption of O-CNT-PEG was analyzed (PG instruments Ltd., T80+ UV–Vis spectrophotometer, Lutterworth, UK) to determine the best photoabsorption wavelength for excitation.
10
Characterization of Nanocomposite Hydrogels
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The prepared nanocomposite hydrogels were examined using Fourier transform infrared spectroscopy (FTIR) (Equinox 55, Bruker Optik GmbH, Leipzig, Germany) in the wavenumber range of 4000–400 cm−1. A field emission scanning electron microscope coupled with energy dispersive X-ray analysis (FESEM/EDS) (MIRA 3-XMU, Tescan, Kohoutovice, Czech Republic) was used for evaluating the surface morphology of the synthesized materials. The crystallinity of materials was examined using X-ray diffraction (XRD) (D8 Advance X-ray diffractometer, Bruker Optik GmbH, Leipzig, Germany). Thermogravimetric analysis (TG 209F3, NETZSCH, Selb, Germany) was used to investigate the thermal stability of the materials. Ultraviolet-visible light absorption spectroscopy (Cecil 5000 series UV–vis spectrometer (Cecil Instruments Ltd., Cambridge, UK) was used for evaluating the antioxidant activities of materials.
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