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Nanoscope 4 controller

Manufactured by Bruker
Sourced in Germany

The Nanoscope IV controller is a specialized instrument used for atomic force microscopy (AFM) applications. It serves as the central control and processing unit for the AFM system, providing the necessary functionality to operate the microscope and acquire high-resolution images of surface topography and other material properties at the nanoscale.

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9 protocols using nanoscope 4 controller

1

Topographical Analysis of A549 Cells

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A549 cells were seeded onto glass coverslips at a density of 3.0 × 105 cells per mL. After RMF treatment, cells were fixed with 10% formalin solution. Atomic force microscopy (AFM) was performed using a Nanoscope IV controller (Bruker, Germany). Topological images were recorded in tapping mode using a SNL-10 cantilever (silicon-tip on nitride lever, f0 = 12–24 kHz, k = 0.06 N m−1, Bruker, Germany). All images were calculated by software Nanoscope analysis 1.4.
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2

Nanoscale Characterization of NR/VMQ Masterbatch

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Phase morphology of NR/VMQ masterbatch was also studied by AFM (Nanoscope IV Controller, Bruker Co., Ltd., Germany) in Peak Force Quantitative Nano-Mechanical mode. Samples for AFM were cut and polished by the ultra-microtome under liquid nitrogen atmosphere. Then the scanning was operated by a Si3N4 cantilever (Bruker SNL-10, radius of curvature = 2 nm, nominal spring constant = 0.35 N m−1) at 1.0 nN peak tapping force. All tests were conducted with 1.0 kHz Z-piezo oscillation frequency and 150 nm peak force amplitude under room temperature.
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3

Electrical Characterization of P-S@dioct:DOPC Films

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Pt films were sputtered on SiO2 substrates. On these were P-S@dioct:DOPC structures added (500 μg/mL DOPC, 50 μg/mL PEDOT-S), which had been prepared with polycarbonate membranes having 400 nm orifices in the extrusion process. After 15 min incubation, the surfaces were rinsed by submersion in MilliQ for 30 s. Local electrical characterization was then conducted in a Dimension 3100 (Bruker) microscope with a Nanoscope IV controller equipped with a C-AFM module (1 nA/V current sensitivity). Commercial Pt/Ir coated silicon probes having nominal spring constant of 0.2 N/m were used to perform imaging and measure local current-voltage characteristics in contact mode, by applying load forces of 2–5 nN.
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4

Atomic Force Microscopy of QD Films

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QD films were prepared on FTO-coated glass as described above. Samples were mounted using double-sided adhesive strips to metal disks exposing the QD layer. Imaging was performed with multimode scanning probe microscope equipped with a NanoScope IV controller (Bruker). Height images were obtained in soft-tapping mode using etched silicon probes (TESP, Bruker) with an autotuned resonance frequency range of 250 to 300 kHz at a scan rate of 2 Hz. Images were analyzed with NanoScope Analysis v1.2 software.
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5

Lipid Sample AFM Imaging

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LT samples (50 μM total lipid) were incubated on a freshly cleaved mica surface for ∼10 min and subsequently rinsed with water to remove buffer and salts. After the mica surface was allowed to dry, the samples were imaged using the tapping mode on a Digital Instruments MultiMode atomic force microscope equipped with a Nanoscope IV controller and a type E scanner (Bruker, Billerica, MA). All images were acquired using single-beam silicon probes with nominal spring constant of 40 N/m and nominal tip radius of 10 nm.
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6

Multilamellar Vesicle Preparation and Imaging

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Multilamellar vesicles were first prepared by hydration of a lipid film (10 mg/ml) in Hepes buffer, followed by incubation at 50°C for 30 min. Liposomal suspensions were then sonicated for 5 min and added to a mica substrate. Excess of liposomes was removed after 1 hour, and the mica surfaces were rinsed 10 times with a 150 mM KCl solution. Samples were imaged using a multimode atomic force microscope with a NanoScope IV controller (Bruker, Santa Barbara, CA) (fig. S6). The tapping mode images were acquired using silicon nitride cantilever tips submerged in buffer. A resonance frequency of ~8 kHz and drive amplitude under 100 mV were used (Asylum Research, Santa Barbara, CA). NanoScope software was used for depth analysis to estimate the height of the lipid membranes.
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7

Characterizing Surface Morphology by AFM

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AFM measurements were performed using a Dimension 3100 microscope equipped with a Nanoscope IV controller (Bruker-Nano). Commercial silicon cantilevers with a nominal spring constant of 40 N m−1 and with a resonance frequency in the 150–300 kHz range were used for morphological characterization in tapping mode. All images were recorded under ambient conditions.
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8

Collagen Fibrillation Imaging by AFM

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The collagen samples fibrillated at 20 °C were pipetted (100 µL) onto glass coverslips and left for 30 min before rinsing 5 times with ultrapure water and left to dry at room temperature overnight before imaging. AFM images were acquired on a Multimode 8 AFM (Bruker, Billerica, MA, USA) with a Nanoscope IV controller (Bruker, Billerica, MA, USA) and Nanoscope v8.15 software (Bruker, Billerica, MA, USA). Imaging was performed in ScanAsyst mode in air at a scan rate of 1Hz and a sample rate of 512 on 10 µm2 regions.
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9

Characterization of Nanostructured Gold Thin Films

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The surface morphology of nanostructured gold thin films was characterized in air using a Multimode AFM equipped with a Nanoscope IV controller (BRUKER). The AFM was operated in Tapping Mode, using rigid silicon cantilevers mounting single crystal silicon tip with nominal radius 5–10 nm and resonance frequency in the range 250–350 kHz. Several 2 μm × 1 μm images were acquired on each sample with scan rate of 1 Hz and 2048 × 512 points. The images were flattened by line-by-line subtraction of first and second order polynomials in order to remove artifacts due to sample tilt and scanner bow.
Only globular objects from AFM images have been selected for the analysis of the cluster heights, by applying filtering selection criteria described in ref. 29 and 30 . The height distribution of the objects identified is typically log-normal, as it is typical for systems resulting from aggregation processes,56 (link) and they appear Gaussian in a semi-log scale.57 (link) The distributions have been normalized with respect to the total number of counted particles and the median value of each Gaussian is associated to the diameter (in z direction) of the gold clusters.
The gold samples with the lowest coverage have been analyzed in order to characterize the size distribution of the incident clusters using a complementary approach and analysis based on SEM and AFM.29
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