Tecnai tf 20 x twin microscope

Transmission electron microscopy (TEM) was performed using a Tecnai TF 20 X-TWIN microscope (FEI, Hilsboro, OR, USA) upon samples dispersed with ethanol on a copper grid. Energy dispersion X-ray spectroscopy confirmed the presence of all the desired elements. The clustering behavior of the particles was probed using a FEI VERSA 3D scanning electron microscope (SEM) (FEI, Hilsboro, OR, USA) or a Tescan VEGA3 SEM (Brno, Czech Republic). The SEM and TEM images were analyzed with Image-J software (version 1.53, NIH, Bethesda, MD, USA) by individually measuring the long axis of the nanoparticles from several micrographs.

The transmission
electron microscopy (TEM) images were acquired with a Tecnai TF 20
X-TWIN microscope (FEI, Hillsboro, OR). The TEM pictures were analyzed
using Image-J software. The AFM images of particles were acquired
with a Dimension Icon XR atomic force microscope (Bruker, Santa Barbara,
CA) working in the air in the PeakForce Tapping mode using standard
silicon support cantilevers with a nominal spring constant of 0.4
N/m (tip radius < 8 nm).

Transmission electron microscopy (TEM) was carried out on a FEI Tecnai TF20 X-twin microscope (FEI, Hillsboro, Oregon, USA) operated at 200 kV (FEG, 1.9 Å point resolution) with an EDAX Energy Dispersive X-ray (EDX) detector attached. Images were recorded on a Gatan CCD camera with resolution of 2048 × 2048 pixels using the Digital Micrograph software package (Gatan, Pleasanton, CA, USA). Electron diffraction patterns were evaluated using the CrysTBox software (Institute of Physics, Prague, Czech Republic) for an automated analysis of electron diffraction patterns. The lamella for TEM observation was prepared by focused-ion-beam milling in a FEI Quanta 3D.