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Smart itr

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Smart iTR is a laboratory instrument designed for attenuated total reflectance (ATR) infrared spectroscopy. It provides a simple and efficient method for the analysis of solid, liquid, and paste samples. The Smart iTR features a diamond crystal ATR plate and advanced optics to deliver accurate and reliable data for a wide range of applications.

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30 protocols using smart itr

1

FT-IR Spectroscopy of Materials

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FT-IR spectra were recorded using Nicolet iS10 (Thermo Scientific, Waltham, MA, USA) FT-IR spectrometer equipped with a single reflection ATR system (Smart iTR, Thermo Scientific, Waltham, MA, USA) with diamond plate and ZnSe lens. The spectra were collected in the frequency range from 4000 to 650 cm−1, with the resolution of 4 cm−1, as an average of 16 scans.
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2

Comprehensive Electrochemical Characterization

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A CS300 electrochemical workstation (Corrtest, Wuhan, China) was employed to conduct all electrochemical measurements. A Metrohms (DropSens) screen-printed electrode (SPE, 110), three-electrode system, was used to execute the voltammetric studies. Working and auxiliary electrodes were made of carbon, while reference electrode was available in silver or silver/silver chloride. The surface morphologies of different modified electrodes were investigated using ZEISS Gemini SEM 500 scanning electron microscope (SEM) equipped with BRUKER energy disperse X-ray spectrophotometer with an accelerating voltage of 5–20 kV. Thermo scientific ATR-FTIR (Model: Smart iTR) was used to take Fourier transform infrared (FTIR) absorption spectra. UV-vis experiment was done with Shimadzu UV1900 model. For UV experiment, 1 mL GO–NHS–AuNFs nanocomposite solution contains 0.2 mg GO, 2 mM NHS and 100 μL as-prepared AUNFs.
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3

Fourier Transform Infrared Spectroscopy

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FT–IR spectra were recorded using a Nicolet 380 FT–IR (Thermo Scientific, Madison, WI, USA) attached with an attenuated total reflectance accessory (ATR, Smart iTR, Thermo Scientific). Spectra were collected over a range of 4000–400 cm−1 (64 scans, resolution 4 cm−1).
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4

Microscopy and Spectroscopy of Dip-Coated Films

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The morphology of the films deposited by dip coating was assessed by using a scanning electron microscope CrossBeam Workstation (SEM-FIB)–Zeiss Auriga. The SEM images under the in-lens mode were carried out with an acceleration voltage of 2 kV and aperture size of 30 μm. A thin carbon layer (< 20 nm) was deposited on the suspended fibers using a Q150T ES Quorum sputter coater.
Coatings chemical structure was unveiled by FT-IR. The FT-IR data were obtained using an Attenuated Total Reflectance (ATR) sampling accessory (Smart iTR) equipped with a single bounce diamond crystal on a Thermo Nicolet 6700 Spectrometer. The spectra were acquired with a 45° incident angle in the range of 4000−600 cm−1 and with a 4 cm−1 resolution.
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5

Characterization of OEO-loaded Vermiculite

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The OEO was loaded by SMV or RV by mechanical mixing with the OEO:vermiclulite ratio of 5:95. The FTIR spectra of OEO-loaded SMV and RV were characterized by a Thermo Scientific Smart iTR™ in the wavenumber range of 500–4000 nm−1. The WA-XRD and SA-XRD patterns were recorded on a Rigaku X-ray powder diffractometer equipped with a Co source (40 kV, Kα 0.1790 nm). A TGA (TGA/DSC Thermogravimetric Analyzer, Mettler-Toledo Inc) was utilized to measure the weight loss of the OEO, OEO-loaded SMV and SMV, which were used to calculate the OEO loading amount. In a typical procedure, ~10–15 mg of a TGA sample was placed in an alumina pan and heated from 25 °C to 900 °C at a heating rate of 2 °C/min and an air flow rate of 20 mL/min. The isothermal release of OEO from the SMV was also evaluated by TGA at a constant temperature of 60 °C.
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6

FT-IR Analysis of Ni-Doped CuO Nanoparticles

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FT-IR experiment was done at room temperature by an instrument from Thermo Scientific company (model name: Smart i TR). The instrument uses DTGS-KBr detector with beam splitter of KBr. Transmittance was measured with spectral data spacing of 0.964 cm−1 from 400 to 1000 cm−1. An atmospheric background was collected first followed by measuring each sample in triplicate before cleaning and measuring the next sample. The Ni doping level ranged from 0 to 7% within CuO nanoparticles.
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7

Silk Fibroin Fiber FTIR Analysis

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ATR-FTIR spectra of silk fibroin fibers were recorded using a Nicolet 6700 spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). The spectrometer was equipped with a single-bounce diamond ATR accessory (SmartiTR, Thermo Fisher Scientific, Waltham, MA, USA) with a refractive index of 2.4 and an active sample area diameter of 1.5 mm. Spectra of each of the samples were acquired by pressing the fibers against an ATR crystal. All samples were measured in reflection mode. For all measurements, the following parameters were used: (i) resolution of 4 cm−1, (ii) spectral range of 650–4000 cm−1, (iii) a Norton and Beer apodization window (strong), and (iv) and 64 scans. Deconvolution of amide I band was carried out using the Peak Deconvolution App in OriginPro 2020b (OriginLab Corporation, Northampton, MA, USA). The numbers and positions of peaks were determined from the results of the second-derivatives spectra. The data obtained from the spectra were expressed as means and standard deviations of three independent fiber samples for each sample type.
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8

Electrochemical Characterization of Nanopapers

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The electrochemical
characterization of the nanopapers was made using a Gamry Instruments
Reference 600 potentiostat at room temperature. The electrochemical
cells had a vertical configuration, where the cellulose was placed
between two aluminum electrodes. EIS measurements were performed with
500 mV AC voltage in the frequency range 10 mHz to 1 MHz. CV measurements
were made in the potential range between −3 and 3 V with a
scan rate of 400 mV s–1Fourier-transform
infrared (FTIR) spectroscopy was performed using an attenuated total
reflectance (ATR) sampling accessory (Smart iTR) equipped with a single-bounce
diamond crystal on a Thermo Nicolet 6700 spectrometer. The spectra
were acquired between 4000 and 650 cm–1 in steps
of 4 cm–1. The crystallinity of the films was assessed
by X-ray diffraction (XRD) using a PANalytical X′Pert PRO with
Cu Kα radiation (λ = 1.540598 Å), while the morphology
was investigated by scanning electron microscopy (SEM) with a ZEISS
SEM/FIB AURIGA operated at 2 kV, with a working distance of 5.9 mm
and an aperture size of 20 μm.
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9

Freeze-Dried Sample FTIR Analysis

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FTIR analysis was performed using a Thermo Scientific Nicolet Nexus 670 FTIR spectrometer and Smart iTR with a diamond window (Thermo Fisher Scientific, Waltham, MA, USA). The spectra were observed in the range of 550–4000 cm−1 to record specific peaks of the freeze-dried samples [28 (link)].
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10

FTIR Analysis of Salt Formation

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Infrared spectra were obtained using a Nicolet 380 FTIR (Thermo Scientific, Madison, WI, USA) attached with an attenuated total reflectance accessory (ATR, Smart iTR, Thermo Scientific, Madison, WI, USA). Spectra were collected in triplicates over a range of 4000–400 cm−1 (64 scans, resolution 4 cm−1). The spectral region from 1500 to 1700 cm−1 was investigated for analysis of salt formation with ThermoScientific OMNIC software (version 8.1.11).
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