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Fastscan a probes

Manufactured by Bruker
Sourced in United States

The FastScan A probes are high-performance scanning probe microscopy (SPM) probes designed for Bruker's FastScan AFM systems. They are optimized for high-speed and high-resolution imaging in a variety of applications.

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5 protocols using fastscan a probes

1

Atomic Force Microscopy of Amyloid Fibrils

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AFM was carried out using a Dimension FastScan AFM instrument (Bruker) operating in tapping mode and using FastScan A probes (Bruker). Fibril morphology was investigated in tapping mode, using samples that were diluted between 1:50 and 1:1000 in 10 mM HCl. After dilution, 25 μL of each sample was deposited onto freshly cleaved mica and incubated for 30 min at room temperature. After incubation, samples were washed using distilled water and dried using a stream of compressed air. Alternatively, 25 μL of the sample was applied on the mica surface and left to dry at ambient conditions. Nanoscope analysis software (Version 1.5 or 1.9, Bruker) was used to process the image data by flattening the height topology data and removing the tilt and scanner bow.
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2

Atomic Force Microscopy Imaging of GO-PEG-Fol

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AFM imaging was carried out as previously reported. [17] (link) A drop of a suspension of GO-PEG-Fol in ultrapure water (10 -4 mg mL -1 ) was deposited onto a mica disk and then dried under vacuum (20 mbar) overnight. AFM measurements were performed in Tapping mode by a Bruker Dimension FastScan microscope equipped with closed-loop scanners and using a FastScan A probes (resonance frequency = 1400 kHz, tip radius = 5 nm).
Furthermore, in order to study the etching kinetics, for the GO-N 3 samples AFM measurements were recorded before and after 120 and 240 minutes from the treatment with nitrogen plasma.
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3

Atomic Force Microscopy of Rad50 Interactions

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All dry and fluid samples were imaged using the Dimension FastScan Bio Atomic Force Microscope (Bruker) in tapping mode.
For dry imaging, FastScan A probes (Bruker) with a spring constant of 18 N/m were tuned to a resonance frequency between 800 and 2,000 kHz and the amplitude setpoint was adjusted to the highest possible setting, so as to ensure little noise and minimizes the force the sample is exposed to. In fluid, FastScan D probes were used, with a spring constant of 0.25 N/m (resonance frequency of 90 to 140 kHz).
Fast-scan images were captured with a scan area of 1 to 2 µm, a scan rate of 15.1 Hz, and with 512 samples per line. For conventional AFM, images were captured at 1.8 frames per minute at room temperature.
Rad50 coiled-coil interactions with the DNA substrate during fast-scan imaging in fluid, as presented in Fig. 4A, were identified manually using similar interactions observed from AFM imaging in air data (Fig. 3) as a reference; see SI Appendix for further details.
All AFM images presented, excluding Fig. 6C, were processed using the Nanoscope Analysis software version 1.5 by Bruker Corporation. Fig. 6C was processed using SPIP software. Movies were produced using Windows Movie Maker.
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4

Freeze-fractured LCE Characterization by AFM

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yz cross-sectional samples (coordinate system shown in Fig. 1b) were prepared by encasing samples of LCE within a two-part epoxy glue and then freeze-fracturing by snapping off the exposed LCE. AFM images were acquired using a Bruker Dimension FastScan-Bio, using Bruker FastScan A probes, in air tapping mode at a frequency of 1.4 MHz. Images were acquired at a line rate of approximately 4 Hz at 1024 pixel resolution, then processed with a simple low order line flattening in Bruker Nanoscope Analysis v1.9.
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5

Atomic Force Microscopy for DNA-NT Imaging

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Atomic force microscopy (AFM) testing was used to determine the imaging of DNA-NT production. For AFM imaging, 6 μm × 6 μm area was selected after sample preparation on the mica surface using Bruker FastScan AFM (Bruker Scientific, USA) and FastScan A probes (Bruker Scientific, USA). Each sample was analyzed at 4 to 6 different locations on the mica surface [33 ].
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