Q150r es sputter coater
The Q150R-ES is a sputter coater designed for depositing thin metallic films onto samples. It features a rotary-pumped vacuum system, with a base pressure of 5 x 10-6 mbar, and a sputtering chamber that can accommodate samples up to 150 mm in diameter. The Q150R-ES is capable of sputtering a variety of target materials, including gold, silver, and platinum, at user-selectable deposition rates.
Lab products found in correlation
24 protocols using q150r es sputter coater
Scanning Electron Microscopy of Bacterial Morphology
Tablet Microstructure Evaluation via SEM-BSE
Decellularized GOM Ultrastructure Analysis
GOM, we performed scanning electron microscopy
(SEM). One part of each decellularized GOM was
fixed with 2.5% glutaraldehyde (Sigma-Aldrich,
St. Louis, MO, USA) in 0.2M PBS at pH=7.4 for 2
hours at 4°C. Subsequently, they were dehydrated in
an increasing graded series of ethanol (50-100%).
Finally, the samples were dried at the critical point
and coated with gold by Q150R- ES sputter coater
(QuorumTechnologies, UK); then, they were observed,
and photography was taken by a VEGA3 microscope
(TESCAN, Czech Republic).
SEM Sample Preparation Protocol
Scaffold Preparation for SEM Imaging
Characterization of TQ-Free Scaffolds
The degradation rate was measured by incubating the scaffolds in 0.01% trypsin (Bioidea, USA) and weighting them on days 1, 2, 3, 4, 5, 6, 8, 10, 12, 14, 16, 18, 20, 25, 30, 35, 40, 50, and 56. The hydration rate was evaluated by immersing lyophilized TQ-free and loaded scaffolds in distilled water and weighting them at the beginning as well as at intervals of 5, 15, 30, 60, 120, and 240 s. To evaluate the impact of TQ loading on mechanical strength, the scaffolds at a size of 10 × 10 × 3 mm3 and the same porosity were exposed to a mechanical resistance determination device (Zwick/Roell, Germany) at a speed of 0.5 mm/min.
Scaffold Microarchitecture Evaluation by SEM
Ultrastructure Analysis of Decellularized GOM
Ultrastructural Assessment of Decellularized Tissues
Pollen Morphology Characterization by SEM
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