The roughness of TA surface and TB surface were investigated by atomic force microscope (AFM) using a Dimension Icon with ScanAsyst from Bruker (Billerica, USA). Cantilevers with a resonance frequency of 325 kHz from Olympus (Shinjuku, Japan) were used. The amplitude setpoint, the proportional gain and the integral gain were adjusted for an optimal overlap of the trace and retrace profile. The scan rate was held constant at 1 Hz. Data analysis was performed with the software Gwyddion V. 2.56 (GPL). The scanned surface dimensions were 10 × 10 μm and three different spots were examined for each surface. The Ra values were calculated over the entire surface areas. Values are given as an average with standard deviation (n=3).
Cantilevers
Manufactured by Olympus
Sourced in Japan
Cantilevers are small, flexible beams used as components in various scientific instruments. They act as force sensors, detecting and measuring minute forces, displacements, or stresses. Cantilevers are commonly employed in atomic force microscopy, scanning probe microscopy, and other analytical techniques.
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8 protocols using cantilevers
1
Atomic Force Microscopy for Surface Roughness
2
Temperature-Controlled AFM Imaging
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Variable temperature atomic force microscopy (AFM) images were acquired in dynamic mode using a Nanotec Electronica system operating in the 25–100 °C temperature range under ambient air conditions. For AFM measurements, Olympus cantilevers were used with a nominal force constant of 0.75 N m–1. The images were processed using WSxM.53 (link) The surfaces used for AFM were marked SiO2. In order to obtain reproducible results, very flat substrates were used with precisely controlled chemical functionalities, freshly prepared just before the chemical deposition.
3
Tapping Mode AFM Imaging in Liquid
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The AFM images were acquired with a MFP-3D AFM (Asylum Research) in tapping mode in liquid, using Si3N4 tips coated with Au/Cr with a spring constant of 0.08 N m−1 (Olympus cantilevers) at a scan rate of 1 Hz.
4
Surface Topography Analysis of Coatings
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The surface topographies of all five surface coatings were investigated with a Dimension Icon with ScanAsyst from Bruker (Billerica, USA). Cantilevers with a resonance frequency of 325 kHz from Olympus (Shinjuku, Japan) were used. The scanned surface dimensions were 10 × 10 μm, and three different spots were examined for each surface. The Ra values were calculated for the full surface areas and produced as average, whereas average error was determined from the software Gwyddion V. 2.56 (GPL). Depending on the surface roughness, the amplitude set point, the proportional gain, and the integral gain were adjusted. The scan rate was constant at 1 Hz.
5
Atomic Force Microscopy of Fungal Spores
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Polished Silicon wafers (Siegert Consulting, monocrystalline, diameter: 150 mm, thickness: 675±25 μm, <100> orientation) were cut with a diamond cutter to samples with a size of about 1×1 cm2. These samples were gently pressed on the fungus that was taken as obtained. By this some fungus spores remained on the substrate surface and were investigated by AFM.
The used AFM was a MultiModeTM Nanoscope III (Veeco, Digital Instruments). AFM pictures were taken with cantilevers of Olympus, with a resonance frequency between 233 and 375 kHz and an average spring constant of 42 N/m. The scan sizes were 500×500 nm2, 750×750 nm2 and 1000×1000 nm2. As feedback control parameters we used an integral gain between 0.2 and 0.3, a proportional gain of 2.0 and an amplitude setpoint between 1.5 and 1.75 V. With the software Nanoscope 8.0 the AFM pictures were processed and the height, the length, the width and the bundling of the rodlets were investigated, each with 11 measured values per analyzed picture.
The used AFM was a MultiModeTM Nanoscope III (Veeco, Digital Instruments). AFM pictures were taken with cantilevers of Olympus, with a resonance frequency between 233 and 375 kHz and an average spring constant of 42 N/m. The scan sizes were 500×500 nm2, 750×750 nm2 and 1000×1000 nm2. As feedback control parameters we used an integral gain between 0.2 and 0.3, a proportional gain of 2.0 and an amplitude setpoint between 1.5 and 1.75 V. With the software Nanoscope 8.0 the AFM pictures were processed and the height, the length, the width and the bundling of the rodlets were investigated, each with 11 measured values per analyzed picture.
6
Fabrication of Copper(I) Iodide Nanostructures
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A mixture of 0.53 mmol of copper(I) iodide dissolved in 15 mL of acetonitrile and 0.53 mmol of ethyl isonicotinate (EtIN) was magnetically stirred (500 rpm) at 20 0 C. After 1 min., a yellow suspension was formed. 400 µL of this suspension were diluted with 3600 µL of bidistilled water, and 15 µL of the new suspension were drop-cast onto freshly prepared (15 min sonicated in acetone and 15 min sonicated in 2-propanol) doped SiO 2 substrates. After 3 minutes of adsorption, the surfaces were dried under an argon flow. Atomic Force Microscopy (AFM) images were acquired in dynamic mode using a Nanotec Electronica system operating at room temperature in ambient air conditions. For AFM measurements, Olympus cantilevers were used with a nominal force constant of 0.75 N/m and a resonance frequency of about 70 kHz. The images were processed using WSxM. 33 The surfaces used for AFM were SiO 2 300 nm thickness (IMS Company). SiO 2 surfaces were sonicated in ultrasound bath at 37 kHz and 380 W, for 15 min. in acetone, 15 min. in 2propanol and then dried under an argon flow.
7
Nanoscale Topography and Electrical Characterization
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AFM measurements for topography analysis and electrical characterization were performed on an Agilent 5500 AFM system. Measurements were performed under a controlled N2 environment to preserve the integrity and avoid exposure of the organic films to ambient conditions. Topography measurements were performed in AC tapping mode, which guarantees minimal contact between the AFM probe and the organic film. Ultra sharp (4–10 nm radius) Olympus cantilevers allowed high sensitivity measurements. cs-AFM measurements were performed in contact mode using special Pt-coated Si cantilevers with a spring constant of 0.2 N/m and typical radii of about 20–25 nm. The voltage is applied directly to the bottom Co electrode. The grounded conductive cantilever is therefore used as a top electrode for local I–V spectroscopy as well as current mapping experiments. AFM topography analysis and current maps images were analyzed using WSxM and Gwyddion software packages [31 (link)–32 ].
8
Topography Characterization of Organic Systems
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An Agilent 5600LS AFM system was used to collect topography data under Ar and ambient conditions in order to keep the integrity of the organic system. Measurements were performed in tapping mode in order to minimize the contact between the AFM probe and the sample surface and avoid damage or modification of the topographic characteristics. Special ultrasharp (4–10 nm tip radius) Olympus cantilevers were employed, allowing high sensitivity measurements. Data shown in the respective Figures correspond to a 1 × 1 μm2 area, although a mapping of the topographic characteristics was performed on different points of the samples in order to verify the uniformity of the organic system over the Au substrate.
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