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D2 phaser powder

Manufactured by Bruker

The D2 Phaser is a compact X-ray powder diffractometer designed for routine phase analysis and material characterization. It features a high-intensity X-ray source, an advanced detector system, and a user-friendly software interface for data collection and analysis.

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3 protocols using d2 phaser powder

1

X-Ray Powder Diffraction Characterization

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A standard-oriented silicone pod was used for the X-ray powder diffraction measurement. The crystals were crushed on the pod by a glass microscope slide and narrowed to form a flat surface. The data were collected using a Bruker D2 Phaser powder diffractometer. The measurements were performed at room temperature with Bragg–Brentano geometry using Co-Kα (λ = 1.79 Å) radiation with a step of 0.02° 2θ and 0.8 s measurement time for each step. LYNXEYE XE detector was used for signal collection. The data were scanned over the angular range of 5° to 85° 2θ. The diffraction patterns were processed by High Score Plus 3.0e (PANalytical, Almelo, The Netherlands).
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2

Comprehensive Characterization of Selenium Nanoparticles

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A UV–vis
spectrometer (UV-1800, Shimadzu) was used to observe SeNP formation
at 200–800 nm. The samples were diluted five times before being
analyzed. The crystalline structure of the SeNP powder was determined
by XRD analysis using a Bruker D2 Phaser powder diffractometer with
Cu Kα radiation of 1.5406 nm wavelength at 40 kV and 30 mA in
the range of 2θ angles 10–80° and a step size of
0.02°/s. The functional groups in the GOP extract on SeNPs were
explored by FT-IR spectroscopy using an active Tensor 27-Bruker spectrometer
with a scanning angle from 400 to 4000 cm–1. The
morphology and nanosize of SeNP samples were estimated by HR-TEM analysis
on a JEOL JEM2100 instrument. The element analysis of SeNP samples
was performed by energy-dispersive X-ray (EDX) spectroscopy on a Horiba-7593
instrument.
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3

Powder XRD Analysis of Gelatin Crystals

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Gelatin crystal structures were determined from the powder XRD measurements using a Bruker D2 Phaser Powder X-ray diffractometer with CuKa radiation in a 2θ range of 10–80° with a step mode of 0.02°/min.
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