S 4800 fe sem system
The S-4800 FE-SEM system is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It is designed to provide high-resolution imaging and analysis of a wide range of materials and samples. The S-4800 FE-SEM system utilizes a field emission gun to generate a high-brightness electron beam, enabling detailed observation and characterization of samples at the nanoscale level.
Lab products found in correlation
7 protocols using s 4800 fe sem system
Cryogenic Sectioning of PVA/DL-Alanine Polycrystals
Characterization of Nanomaterials by SEM, TEM, and Contact Angle
Comprehensive Characterization of Si3N4
SEM-EDS Material Characterization
a Hitachi S4800 FESEM system with an accelerating voltage of 20 kV.
Liposome Size and Zeta Potential Characterization
Characterization of Thin Film Materials
Characterization of TiO2 Powder
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