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S 4800 fe sem system

Manufactured by Hitachi
Sourced in Japan

The S-4800 FE-SEM system is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It is designed to provide high-resolution imaging and analysis of a wide range of materials and samples. The S-4800 FE-SEM system utilizes a field emission gun to generate a high-brightness electron beam, enabling detailed observation and characterization of samples at the nanoscale level.

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7 protocols using s 4800 fe sem system

1

Cryogenic Sectioning of PVA/DL-Alanine Polycrystals

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PVA/DL-alanine polycrystal samples of 2 × 2 cm2 size were frozen in liquid nitrogen for approximately 5 s and then cut to a suitable size to obtain clean cross-sectional SEM images of the PVA/DL-alanine polycrystals. The cut samples were fixed to the SEM sample holder so that their cross-sections were exposed for photography on the SEM holder, then the cut samples were coated with platinum (Pt) thin film through DC sputtering in an Ar gas ambient at a power of about 20 mA × 500 V for about 4–5 min by employing a sputter coater (SMC 12R-plus, Semian, South Korea) in vacuum of 5 × 10−2 mbar to obtain better cross-sectional SEM images by improving the electrical conductivity of the cross sections in which the SEM images are taken. The cross-sectional SEM images of PVA/DL-alanine polycrystals were taken by S-4800 FE-SEM system (Hitachi, Japan), and the voltage and current were set to 10 kV and 10 μA, respectively, and the measurement was carried out in vacuum at room temperature without intentional cooling. See also Figures S1 and S10 in the supplemental information section, and in Figure S10, the change of the thickness of the upper and the lower parts of the PVA/DL-alanine polycrystals according to the r is presented.
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2

Characterization of Nanomaterials by SEM, TEM, and Contact Angle

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Scanning electron microscopy (SEM) images of the samples were obtained by using a Hitachi S4800 FE-SEM system with 10 kV accelerating voltage and 10 mA of beam current. Transmission electron microscopy (TEM) analysis was carried out on a JEM-2100 electron microscope operating at 200 kV. UV-vis spectra of samples were collected on a UV scanning spectrophotometer (Cary 50) equipped with an integrating sphere from 200 to 800 nm. Static contact angles were measured using the sessile drop method with a 3 μL certain liquid droplet and a telescopic goniometer (Rame-Hart, Inc., Mountain Lake, NJ).
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3

Comprehensive Characterization of Si3N4

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FE-SEM images were obtained using the S-4800 FE-SEM system (Hitachi, Tokyo, Japan). All samples were coated with OsO4 using a Vacuum Device (Ibaraki, Japan). The crystalline phases of Si3N4 determined by powder XRD (LabX XRD-6000, SHIMADZU Corporation. Kyoto, Japan), and the chemical structures were characterized by ATR-FTIR spectroscopy (IRAffinity-1S; Shimadzu Corporation, Kyoto, Japan). Chemical composition and chemical bonding were determined by XPS (PHI X-tool; ΦULVAC-PHI, Inc., Kanagawa, Japan) and Raman Spectroscopy (RAMAN touch, Nanophoton, Osaka, Japan).
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4

SEM-EDS Material Characterization

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SEM images with EDS measurements were obtained using
a Hitachi S4800 FESEM system with an accelerating voltage of 20 kV.
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5

Liposome Size and Zeta Potential Characterization

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The size distribution and zeta potentials of liposomes were measured with a Zetasizer Nano-Z (Malvern Panalytical Ltd., Malvern, UK) at 25 °C. The morphology of the liposomes was observed using field emission scanning electronic microscopy (FESEM) (HITACHI S-4800 FESEM system).
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6

Characterization of Thin Film Materials

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SEM studies were performed using a S4800 FESEM system from Hitachi at a working distance of 3.2 mm. Energy Dispersive Spectroscopy (EDS) analysis were performed using Oxford Instruments X-Max and an INCA software. Micro-Raman spectra were recorded at room temperature with a Jobin-Yvon Labram HR micro analytical spectrometer. The spectra were generated with 17 mW, 632.8 nm, He–Ne laser excitation. A Biochrom Ultrospec 2000 UV-vis-NIR spectrophotometer was used to record the optical transmittance spectra of the films and of the EC devices in their colored and bleached states.
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7

Characterization of TiO2 Powder

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XPS characterized on an ULVAC‐PHI instrument. Scanning electron microscopy (SEM) images were acquired on a Hitachi S4800 FE‐SEM system. TEM analyses were performed on a Hitachi HD‐2000 Scanning‐TEM system and a Hitachi H‐9500 TEM system, coupled with the use of carbon‐coated copper grids. TiO2 powder samples were dissolved with ethyl alcohol, followed by dropped on the copper grids. TEM specimens were obtained after dried at room temperature.
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