Lynxeye xe t detector

The thermal behavior of DEX-loaded nanoparticles, PLGA, dexamethasone, and the physical mixture was analyzed by a DSC 1 Star System equipped with Star Software (Mettler Toledo, Greifensee, Switzerland) and a DSC131 Evo (SETARAM Instrumentation, Caluire-etCuire, Lyon, France). Weighed samples of 6–11 mg were placed into 100 μL aluminum crucibles and the samples were scanned from 25 °C to 300 °C at a constant heating rate of 20 °C/min.
X-ray powder diffraction measurements were performed on the D8 Advance diffractometer with a LYNXEYE-XE-T detector (Bruker AXS, Karlsruhe, Germany) operating in 1D mode. Low-background quartz sample holders were carefully filled with the powder samples. XRD patterns within the range 2° to 75° 2θ were recorded at room temperature using CuKα radiation (λ = 1.5418 Å) with the following measurement conditions: tube voltage of 40 kV, tube current of 40 mA, step-scan mode with a step size of 0.02° 2θ, and counting time of 0.5 s/step.

In-house X-ray diffractometry (XRD) was performed with a Bruker D8 Advance diffractometer equipped with a Cu X-ray source in the Bragg–Brentano configuration and variable primary divergence slit. The detector was an energy-dispersive position-sensitive LynxEye XE-T detector (Bruker-AXS). The Rietveld refinement was performed for the Co₃O₄ spinel and the CeO₂ structure taking into account the zero error, sample displacement and the instrumental broadening as determined from the NIST CeO₂ reference.

The X-ray diffraction
patterns were recorded with a Bruker D8 Advance using a Cu X-ray source
in the Bragg–Brentano configuration with a variable primary
divergence slit using an energy-dispersive position-sensitive LynxEye
XE-T detector (Bruker). The powder measurements and the quantification
of the crystallinity were conducted by mixing a CeO₂ reference
(NIST SRM674b) and our powder sample in a 1:1 mass ratio. After rigorous
blending, the mixtures were deposited in a Si low background sample
holder. The mass fraction of the X-ray amorphous phase was calculated
via Rietveld refinement, in which the zero error, sample displacement,
lattice parameters, and size-induced broadening were taken into account.
The Rietveld refinement was jointly performed for the diffractograms
of the two Co₂FeO₄ samples mixed with the CeO₂ standard as well as for the pure CeO₂ standard
measured alone using the same structural parameters for the CeO₂ as well as the zero error and the background signals from
the sample holder.
To record the diffractograms of Co₂FeO₄ before and after OER, the samples were prepared on
a carbon foil (0.125 mm, 99.95% purity, GoodFellow) and measured with
a Bruker D8 Advance in parallel beam configuration with a Goebel mirror
and an equatorial Soller slit (0.3°). The applied electrochemical
protocol is described in Section 2.3.