The surface morphology of nanovehicles was examined by transmission electron microscopy (TEM) with JEM-1200EX (Tokyo, Japan). Fourier transform infrared (FT-IR) spectra were recorded on a Bruker IFS55 spectrometer (Bruker, Switzerland) in the range of 4000~400 cm-1. Samples were prepared by mixing sample powder with KBr and scanned at 2 cm-1 resolution. The JEOL JEM-2100 field emission transmission electron microscopy equipped with X-MAX80 (Oxford Instruments, UK) was used for energy dispersive X-ray spectroscopy (EDS) measurements. Thermal gravimetric analysis (TGA) was performed on a TGA-51 thermal gravimetric analyzer (Shimadzu Corp., Kyoto, Japan) at a heating rate of 15°C·min-1 from 30°C to 800°C under nitrogen atmosphere. The hydrodynamic diameter, polydispersity and zeta potentials of the NPs were measured by dynamic light scattering (DLS) analysis using Zetasizer Nano ZS (Malvern Instruments, UK). Conformational changes of native and reconstituted LDL were evaluated by circular dichroism. The purity and integrity of native and reconstituted LDL was confirmed by the standard SDS-PAGE analysis 45 (link).
X max 80
Manufactured by Oxford Instruments
Sourced in United Kingdom
The X-Max 80 is a compact energy-dispersive X-ray (EDX) spectrometer designed for materials analysis. It features an 80 mm² silicon drift detector (SDD) for high-resolution elemental analysis. The X-Max 80 is optimized for rapid, accurate detection and quantification of elements in a wide range of sample types.
Automatically generated - may contain errors
Lab products found in correlation
S 4800, by Hitachi (2 mentions)
Aztec software, by Oxford Instruments (2 mentions)
K alpha, by Thermo Fisher Scientific (2 mentions)
Vega3, by TESCAN (2 mentions)
Ifs 55 spectrometer, by Bruker (1 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
Spectrum two ft ir spectrometer, by PerkinElmer (1 mentions)
X max 80t, by Oxford Instruments (1 mentions)
Tecnai g2, by Thermo Fisher Scientific (1 mentions)
Z100 testing machine, by Zwick Roell (1 mentions)
D8 advance, by Bruker (1 mentions)
Jsm 7100f, by JEOL (1 mentions)
Lyra 3 xmh, by TESCAN (1 mentions)
Jsm 6490lv, by JEOL (1 mentions)
Optima 4300 dv, by PerkinElmer (1 mentions)
Fe sem jsm7100f, by JEOL (1 mentions)
Inca 350, by Oxford Instruments (1 mentions)
Fesem gemini 500, by Zeiss (1 mentions)
Fei quanta 200 feg, by Thermo Fisher Scientific (1 mentions)
Advance 3 spectrometer, by Bruker (1 mentions)
28 protocols using x max 80
1
Characterization of Nanovehicles by Diverse Techniques
2
Comprehensive Analysis of Electrolyte and Cathode
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A scanning electron microscope (Hitachi S-4800) equipped with an EDS detector (Oxford Instruments X-Max 80) was used to examine the microstructure and elemental mapping of the MgCl2-PEO electrolyte. Raman spectroscopy (Micro-Raman inVia, Renishaw) was used to characterize the composition of MgCl2-WIS and MgCl2-PEO with a 632.8-nm laser. FTIR was performed using the PerkinElmer Spectrum Two FT-IR Spectrometer. The 1H NMR spectra were acquired on a Bruker Avance III 600-MHz NMR spectrometer using deuterium oxide as the field frequency lock. The ionic conductivities of the electrolytes were measured using a conductivity bench meter (FiveEasy FE30). A high-resolution transmission electron microscope (FEI Tecnai G2) equipped with an EDS detector (Oxford Instruments X-Max 80T) was used to chemically probe the CuHCF cathode for elemental mapping.
3
Comprehensive Materials Characterization Protocol
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The morphology, microstructure, and chemical composition of the samples were studied using Mira 3 Tescan scanning electron microscope with an EDX Oxford Instruments X-max 80 energy dispersive detector for X-ray spectroscopy. X-ray phase analysis was carried out on a Bruker Advance D8 diffractometer in the range of angles from 25° to 85° with a step of 0.02° and an exposure of 1.5 s at each step. The wavelength was 1.5406 Å. The lattice parameters were measured by the Le Bail method using software TOPASS. The particle size (PS) distribution of the powders was studied using a Fritsch Analysette 22 NanoTec plus laser diffraction unit. To calculate the particle size distribution, the Fraunhofer model was used. The electrical conductivity was measured using an AKIP-2101 voltmeter, a GPD-74303S current source, and a FLUKE-289 multimeter. Mechanical compression tests of the specimens were carried out on a Zwick/Roell Z100 testing machine.
4
Synthesis of Fe-Doped Hexagonal BaTiO3
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High quality 6H-BaTiO3-δ polycrystalline samples with c = 10, 20% Fe3+ ions substituted for Ti4+ were synthesized according to the procedure thoroughly explained in Ref. 28 . For each composition, after heat treatment at 1250°C, a part of the sample was additionally annealed in oxygen atmosphere at 1500°C, typically for 5–10 hours. We label the non-annealed and annealed samples with FcBTO and FcBTOa, respectively. The variations of the annealing time showed no significant influence on the magnetic properties28 . X-ray powder diffraction (XRD) was used to verify the single-phase hexagonal structure of all our samples. The elemental analysis was performed by Energy Dispersion X-Ray Spectroscopy (EDX) on polished ceramic surfaces with JSM-7100 F (Jeol) field-emission scanning electron microscope equipped with an x-ray detector (X-Max 80, Oxford Instrument). Ten EDX characterizations were performed on each sample and were statistically treated to obtain average values and standard deviations. The iron concentration in the nominally 10%-doped samples was found at 10.3 ± 0.5%, while in 20%-doped samples it amounted to 19.9 ± 0.6%. For all our samples the analytically determined compositions thus correspond to the nominal compositions within the small error bars.
5
Elemental Analysis of Specimens Using SEM
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The research was carried out in the laboratory of micro- and nano-research of the Far East Geological Institute FEB RAS on two analytical scanning electron microscopes:
JSM-6490 LV (Jeol, Japan), equipped with an INCA energy dispersive X-ray spectrometer, X-max 80 and INCA Wave dispersive spectrometer (Oxford Instruments, Great Britain).
Lyra 3 XMH (Tescan, Czech Republic)—a dual-beam microscope (a combination of electron and ion columns in the single chamber) with a Schottky cathode (with field emission), equipped with an energy dispersive X-ray spectrometer AZtec, X-max 80 Standart.
6
Microscopic Analysis of Crustacean Structures
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Eggs and pleopods were dehydrated with an ethanol series (30, 50, 70, 95, and 100% ethanol) and then for 5 h in a critical point dryer CPD 020 (Balzers Union, Balzers, Liechtenstein). Finally, samples were gold-coated with an SCD 040 (Balzers Union). Observations and imaging were performed using a Quanta 200 microscope (FEI-Thermo Fisher, Hillsboro, OR, United States). The chemical composition of the mineral crust present on egg and pleopod surfaces was also analyzed with an X-ray Energy Dispersive Spectrometer (EDX) using an X-Max 80 (Oxford Instruments, Oxford, United Kingdom) and displayed with AZtec software (Oxford Instruments, Oxford, United Kingdom).
7
Chemical Analysis of Rare-Earth Oxides
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Chemical analysis of Gd3+, Zr4+, and Mg2+ was carried out by inductively coupled plasma atomic emission spectroscopy on an Optima 4300 DV Perkin Elmer spectrometer (Waltham, MA, USA); the oxygen content was calculated according to the cationic composition. Preliminarily, the ceramic samples were ground and then dissolved in a mixture of sulfuric acid and ammonium sulfate in the ratio of 3:2 by weight.
Energy dispersive X-ray spectroscopy (EDS) in the SEM was used to analyze the composition of pelletized samples. Samples were examined by using INCA Energy 350 + XEDS detector, based an Oxford Instruments X-Max 80 (Abingdon, Oxfordshire, UK) system. Typical detection limits in point analysis for different elements range between 0.3–0.5 at.%. The analytical data were normalized to 100 mas.%.
The oxygen content in some phases was determined by carbothermal reduction of oxide with subsequent analysis of the absorption of infrared radiation using an oxygen/hydrogen analyzer LECO-OH836 (St. Joseph, MI, USA). LECO Combustion Analysis can detect low level of oxygen with detection limit of 100 ppm and observed precision of 2.5%
Energy dispersive X-ray spectroscopy (EDS) in the SEM was used to analyze the composition of pelletized samples. Samples were examined by using INCA Energy 350 + XEDS detector, based an Oxford Instruments X-Max 80 (Abingdon, Oxfordshire, UK) system. Typical detection limits in point analysis for different elements range between 0.3–0.5 at.%. The analytical data were normalized to 100 mas.%.
The oxygen content in some phases was determined by carbothermal reduction of oxide with subsequent analysis of the absorption of infrared radiation using an oxygen/hydrogen analyzer LECO-OH836 (St. Joseph, MI, USA). LECO Combustion Analysis can detect low level of oxygen with detection limit of 100 ppm and observed precision of 2.5%
8
Characterizing Burrow Wall Mineralogy
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The mineral composition and clast arrangement of the burrow wall, fill, and host rock was assessed using petrographic thin sections studied with an optical microscope. However, the feather-like structures and wall-lining were difficult to identify under the microscope and were therefore analyzed in thin sections using a thermal field emission scanning electron microscope (JEOL FE-SEM: JSM-7100F) in the EPMA lab at Institute of Earth Sciences, Academia Sinica, Taipei, Taiwan. Chemical identification was carried out using an Energy Dispersive X-ray Spectrometer (EDS: Oxford Instruments X-max80 with INCA-350), equipped on the FE-SEM. Each sample was mounted, polished, and analyzed with FE-SEM and EDS under low vacuum conditions (50 Pa), using an acceleration voltage of 15 kV and beam current of 0.12 nA. The duration of EDS counting time was 15 s for each spot.
9
Microstructural Characterization via SEM and EDS
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Microstructural characterization was conducted utilizing scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) (FESEM Gemini 500 by Zeiss, Oberkochen, Germany; EDS detector X-Max80 by Oxford Instruments, Abingdon, Oxfordshire, UK). The samples were not coated due to subsequent surface sensitive measurements. Utilization of an acceleration voltage of 1 kV yielded high-quality secondary electron images without inducing surface charging. However, for acquiring backscattered images, 15 kV acceleration voltage was used in variable-pressure mode. This reduced vacuum condition facilitated charge equalization at the surface through interactions with gas molecules.
10
Fracture Surface Analysis of Dental Restorations
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Visual inspection as well as microscopic analyses was performed. The fractured surfaces were first analyzed under a light microscope (Wild M3, Wild Heerbrugg, Heerbrugg, Switzerland). Photographs were taken at 8 × magnification. A preliminary classification of the surfaces as adhesive, cohesive or a combination was done at this stage. Three representative surfaces from each group were then selected for further analysis in high resolution scanning electron microscopy (FEI Quanta 200 FEG, FEI Company, Hillsboro, OR) operating between 5 and 10 kV at 44–45 × magnification. The selection was made by two investigators independently and consensus was reached through comparison and discussion. Before analysis, a photograph of the crown placed in the holding device was taken to facilitate orientation to focus analysis on areas where light microscopy had suggested possible core exposure. Surface mapping with analysis of atomic composition was performed (Oxford Instruments X-MAX 80, Abingdon, UK) at selected areas as described above.
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