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Formvar nickel grid

The Formvar nickel grid is a laboratory equipment used in electron microscopy. It serves as a supporting structure for specimens during examination under an electron microscope. The grid is made of nickel and coated with a thin layer of Formvar, a type of polymer film. This design provides a stable and durable platform for mounting and analyzing samples.

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2 protocols using formvar nickel grid

1

Transmission Electron Microscopy of OMVs

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The OMVs isolated from cultures grown with and without ampicillin, amikacin, chloramphenicol, colistin, meropenem, minocycline, imipenem, polymyxin B, and tigecycline were fixed in 2% paraformaldehyde and 2.5% glutaraldehyde in PBS and thoroughly mixed for TEM analysis. Fixed samples were washed in 0.1 M sodium cacodylate (pH 7.24), postfixed with buffered 2% OsO4, washed with water, and dehydrated in a graded ethanol series (25 to 100%) with 25% increments. The samples were filtered in a graded series of Epon resin (Ted Pella Inc., Redding, CA, USA) for 2 days, embedded in fresh Epon resin, and polymerized at 60°C for 48 h. Purified OMV pellets were resuspended in 2% paraformaldehyde and allowed to free-float onto a 200-mesh carbon-coated Formvar nickel grid (Electron Microscopy Sciences, Hsin An Instruments Co. Ltd., Taiwan) for 5 min. The excess solution was dried off with filter paper, and the sample grid was then floated on a 10-μL droplet of 1% aqueous uranyl acetate for 30 s. The stain was removed with filter paper, and the sample was air dried. Finally, the samples were imaged using a Hitachi (Tokyo, Japan) HT7700 transmission electron microscope.
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2

TEM Negative Staining Protocol

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TEM samples were prepared by applying 20 μl of each unpelleted sample (diluted 1:10 with ultrapure water) onto a 200-mesh carbon-coated Formvar nickel grid (Electron Microscopy Sciences) and allowed to sediment on the carbon film for 2 min, followed by negative staining with a 5% (w/v) uranyl acetate solution for 1 min. Excess solutions were removed with filter paper. Samples were imaged with a JEOL JEM-1011 transmission electron microscope (Jeol) at 80 kV. All representative TEM micrographs in this publication have been chosen from 5 to 20 images.
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