Europe uv 1650pc spectrophotometer

As an initial step, the Shimadzu Europe—UV-1650PC Spectrophotometer (Tokyo, Japan) was utilized to conduct the UV–vis spectral characterization of galangin and GAL/β-CD by continuous scanning (200–500 nm). The crystals formed by the synthesized complexes were examined by applying X-ray diffractometric analysis (XRD-6000, ADX-2700, USA) under the conditions of 30 mA current and 40 kV voltage. Diffraction patterns were analyzed for particles subjected to a Cu Kα incident beam at λ = 1.540 A° and 2θ = 5–40°. An FTIR 8400S device (Tensor 27, Amsterdam, The Netherlands) was utilized to conduct the Fourier spectroscopic analysis by applying the attenuated total reflection mode under conditions of a 4000–400 cm⁻¹ spectral range and 4 cm⁻¹ resolution. A Brookhaven Zeta PALS device supplied by Milton Keynes, UK, was employed for the characterization of additional properties of the synthesized nanoparticles (i.e., zeta potential and particle size). The produced complex was also characterized in terms of morphology by using FESEM analysis with MIRA 3 TESCAN (Brno, Czech Republic). This characterization, in addition to the distribution pattern of the complex, was confirmed by TEM examination (Zwiss, Oberkochen, Germany) working at 400 kV.

Initial examinations of the TMZ, PLGA, and TMZ-PLGA-NPs were achieved by utilizing UV–Vis spectral measurements (Shimadzu Europe-UV-1650PC Spectrophotometer, Tokyo, Japan) with continuous scanning at 200–900 nm. An FT-IR spectrophotometric examination was performed on an FTIR 8400S instrument (Tensor 27, Netherlands) with a spectral range of 4000–400 cm⁻¹ and a resolution of 4 cm⁻¹. The machine was operated in the attenuated total reflection mode. The prepared NPs were analyzed using an X-ray diffractometer (XRD-6000, ADX-2700, Stoughton, MA, USA) at a current of 30 mA and a voltage of 40 kV. The NPs’ diffraction patterns were characterized under a Cu Kα incident beam (λ = 1.542 A^o) at 2θ = 5–40°, whereas a Brookhaven Zeta PALS machine (Milton Keynes, UK) was employed to assess the zeta potential and investigate the particle size. A field emission scanning electron microscope (FESEM) (MIRA 3 TESCAN, Brno, Czech Republic) was employed to morphologically characterize the prepared formulation. The morphology as well as the distribution of the preparations were also examined through TEM visualization (Zeiss, Germany) at a voltage of 400 kV.