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5 protocols using tecnai g2 s twin transmission electron microscope

1

Comprehensive Nanomaterial Characterization Techniques

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Transmission electron microscopy (TEM) was undertaken using an FEI Tecnai G2 S-Twin transmission electron microscope. Scanning electron microscopy (SEM) was done using a JEOL JSM-7500F field emission scanning electron microscope. Energy-dispersive X-ray spectroscopy (EDS) was done on a Merlin Compact scanning electron microscope. X-ray diffraction (XRD) patterns were measured on D8 Focus diffractometer with Cu-Kα radiation (λ = 0.15405 nm). Fourier transform infrared (FTIR) spectroscopy was undertaken on a Bruker Tensor 27 FTIR spectrometer using KBr pellets. All fluorescence spectra were recorded on a FLS 920P Edinburgh instrument. N2 adsorption–desorption was measured on a Micromeritics ASAP 2020 HD88 apparatus. UV-vis spectra were recorded on a Shimadzu UV-3600 spectrometer. X-ray photoelectron spectroscopy (XPS) was carried out on an Axis Ultra DLD X-ray photoelectron spectrometer.
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2

Characterizing PLGA-BSA Nanoparticles

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The hydrodynamic diameters and zeta potentials of the PLGA and BSA were measured using ZetaSizer Nano ZS90 (Malvern Instruments Ltd., Malvern, UK). The morphology of nanoparticles was observed using a Tecnai G2 S-Twin transmission electron microscope (FEI Company, Hillsboro, OR, USA). The number of BSA nanoparticles was determined through the nanoparticle tracking analysis (NTA) technique of NanoSight NS300 (Malvern Panalytical Ltd., Malvern, UK).
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3

Nanomaterial Characterization Protocol

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UV-Vis absorption spectra were measured by using a TU-1901 dual beam UV-Vis spectrophotometer. Transmission electron microscopy (TEM) micrographs were obtained using a FEI Tecnai G2 S-twin transmission electron microscope. The sample for the X-ray diffraction (XRD) assay was obtained by depositing the product solution on glass slides and vacuum drying at 80 °C. Fourier-transform infrared (FT-IR) spectra were recorded on a Vertex Perkin-Elmer 580BIR spectrophotometer (Bruker). Up conversion emission spectra were recorded on an Edinburgh FLS 980 apparatus, from 400 to 700 nm, using a 980 nm laser diode module as the irradiation source. The N2 adsorption–desorption isotherm and pore-size distribution were observed on a Micromeritics Tristar 3000 instrument.
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4

Comprehensive Characterization of Nanomaterials

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All reagents were obtained from commercial sources and used as received without further purification. The FT-IR spectra were recorded in the frequency range 4000–600 cm−1 on a Bruker Tensor 27 FT-IR spectrophotometer with a standard Pike ATR cell. A Shimadzu UV 2450 spectrometer was used to record the UV-vis spectra in solution. Powder X-ray diffraction (PXRD) experiments were conducted on a Bruker D8 ADVANCE diffractometer with Cu Kα radiation at the 2θ range of 5–50°. Photoluminescence spectra were obtained using a Shimadzu RF-6000 spectrofluorometer at room temperature. Transmission electron microscopy (TEM) was undertaken using an FEI Tecnai G2 S-Twin transmission electron microscope. Scanning electron microscopy (FESEM) was done using a JEOL JSM-7500F field emission scanning electron microscope. Energy dispersive X-ray spectroscopy (EDS) was done using a Merlin Compact scanning electron microscope. The metal content analysis was performed on an atomic absorption spectrometer (AAS) using PerkinElmer PinAAcle 900F. X-ray photoelectron spectroscopy (XPS) was recorded using a JEOL JPS-9010MC with a twin anode (Mg Kα source, 1253.6 eV and Al Kα source, 1486.6 eV) at 12 kV and 25 mA. Gas adsorption–desorption was measured using a MicrotracBEL/BELSORP-mini II at the desired temperature.
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5

Characterization of Magnetic Nanoparticles and Polymer Microspheres

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The chemical structure of Fe3O4-OA NPs and PEG-modified microspheres was determined by a Perkin Elmer 2000 FTIR instrument (Perkin Elmer, Germany). A Tecnai G2S-Twin transmission electron microscope (FEI, United States) was used to record the size and shape of the Fe3O4-OA NPs. The magnetic properties were determined in a Quantum Design-MPMS-XL7 vibrating sample magnetometer (VSM) system (United States) at 300 K. A Philips XL30 ESEM-FEG instrument (Philips, Japan) was used to observe the surface morphology of microspheres. Elemental mapping was carried out by an XL-30W/TMP scanning electron microscope (Philips, Japan). Static water contact angles were measured using a VCA 2000 contact angle system (AST, United States). The percentage of grafting was measured using a TGA500 thermogravimetry analyzer (TA Instruments, United States). Each sample was heated from room temperature to 600°C at 10°C min−1.
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