Jsm it200 intouchscope
The JSM-IT200 InTouchScope is a compact scanning electron microscope (SEM) designed for ease of use and versatility. It features a small footprint and intuitive touchscreen interface, enabling efficient imaging and analysis of a wide range of samples.
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7 protocols using jsm it200 intouchscope
Visualizing Cryogel Structure and Porosity
Comprehensive Characterization of Photocatalytic Materials
The photocatalyst crystal structures were indicated by X-ray diffraction (XRD) analysis (Bruker MeasSrv (D2-205,530)/D2-205,530) with CuKa1 radiation (wavelength = 1.54060 A°) at 30 kV voltage and 10 mA current. The wide-angle diffraction pattern was taken over a 2θ angle range extending from 20° to 80°.
FT-IR spectra of photocatalysts ZnO, TiO2, NZB, and NTB were scanned from 4000 cm−1 to 500 cm−1 on a Bruker Vector 22 (AVATAR 360, Nicolet, Madison, USA) with KBr powder (sample/KBr = 1/200).
Nitrogen adsorption/desorption isotherms were determined by a Belsorp Mini II (Japan) at 77 K. BET and BJH isotherm models are used to determine specific surface area and physical characteristics of pores.
X-ray photoelectron spectroscopy (XPS) was investigated by K-ALPHA (Thermo Fisher Scientific, USA) with monochromatic X-ray Al K-ALPHA radiation − 10 to 1350 eV at pressure 10−9 mbar with full-spectrum pass energy 200 eV and narrow-spectrum 50 eV.
To investigate the optical characteristics, the diffuse absorbance spectra of samples were measured by JASCO V-570 UV–vis absorption spectrophotometer in the range from 250 and 850 nm.
Scanning Electron Microscopy Sample Preparation
SEM Analysis of UV-Irradiated HaCaT Cells with EBND
HaCaT cells (8 × 104 cells/mL) were seeded into 35 mm dishes with a cover glass and cultivated for 24 h. Cells were then cultivated with EBND at 125 µg/mL for 2 h. After the medium was removed, cells were air-dried and irradiated with UVA for 5 min (10 J/cm2), and then re-soaked in the medium with EBND. Cells were further cultivated for 48 h. At the end of cultivation, HaCaT cells were pre-fixed for 30 min in 2.5% glutaraldehyde solution in PBS (-). After being washed with PBS (-), specimens were further fixed with 1% osmium tetroxide (OsO4) for 1 h. Samples were then dehydrated with ascending grades of ethanol. The specimens were substituted by t-butylalcohol and freeze-dried with a vacuum evaporator. The dried samples were mounted on stubs followed by ion coating. The preparations were examined at 10–15 kV using an SEM (JSM-IT200 InTouchScope™, JEOL Ltd., Tokyo, Japan) [9 (link)].
Topographical Characterization of Substrates
Electrochemical Sensor Characterization of PDA-NPs
Sulfur Nanoparticle Morphology Analysis
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