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Jsm it200 intouchscope

Manufactured by JEOL
Sourced in Japan

The JSM-IT200 InTouchScope is a compact scanning electron microscope (SEM) designed for ease of use and versatility. It features a small footprint and intuitive touchscreen interface, enabling efficient imaging and analysis of a wide range of samples.

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7 protocols using jsm it200 intouchscope

1

Visualizing Cryogel Structure and Porosity

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The porosity and internal structure of the cryogels were visualized using optical microscopy (EVOS FL Auto 2 Cell Imaging System, Bothell, WA, USA), confocal laser scanning microscopy (Carl Zeiss, LSM 780, Jena, Germany), and scanning electron microscopy (Jeol, JSM-IT200 InTouchScope, Tokyo, Japan). For confocal imaging, cryogel slices (1 mm thick) were incubated with 1 mL of 50 mM Rhodamine B for 30 min in the dark followed by an extensive wash with DI water. Excitation and emission wavelengths were chosen according to the manufacturer’s instructions. For SEM imaging, freeze-dried cryogel slices without coating were used. Pictures were taken at variable accelerating voltage and magnifications.
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2

Comprehensive Characterization of Photocatalytic Materials

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The composition of elements and surface configuration of samples were studied by utilizing a JSM-IT200 In Touch Scope with a fully integrated EDS which includes “live EDS analysis” (JSM-IT200, JEOL, Akishima, Tokyo).
The photocatalyst crystal structures were indicated by X-ray diffraction (XRD) analysis (Bruker MeasSrv (D2-205,530)/D2-205,530) with CuKa1 radiation (wavelength = 1.54060 A°) at 30 kV voltage and 10 mA current. The wide-angle diffraction pattern was taken over a 2θ angle range extending from 20° to 80°.
FT-IR spectra of photocatalysts ZnO, TiO2, NZB, and NTB were scanned from 4000 cm−1 to 500 cm−1 on a Bruker Vector 22 (AVATAR 360, Nicolet, Madison, USA) with KBr powder (sample/KBr = 1/200).
Nitrogen adsorption/desorption isotherms were determined by a Belsorp Mini II (Japan) at 77 K. BET and BJH isotherm models are used to determine specific surface area and physical characteristics of pores.
X-ray photoelectron spectroscopy (XPS) was investigated by K-ALPHA (Thermo Fisher Scientific, USA) with monochromatic X-ray Al K-ALPHA radiation − 10 to 1350 eV at pressure 10−9 mbar with full-spectrum pass energy 200 eV and narrow-spectrum 50 eV.
To investigate the optical characteristics, the diffuse absorbance spectra of samples were measured by JASCO V-570 UV–vis absorption spectrophotometer in the range from 250 and 850 nm.
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3

Scanning Electron Microscopy Sample Preparation

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Membrane specimens were mounted on aluminum stubs with carbon tape and sputter coated with gold (Structure Probe, West Chester, PA). Images were acquired using SEM (JEOL, JSM- IT200 InTouchScope™ Tokyo, Japan) at two different magnifications of 100 × and 330×. The SEM images were captured at an accelerating voltage of 10 kV. The raw images were transferred to ImageJ software (National Institutes of Health, Bethesda, Maryland, USA) for rescaling.
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4

SEM Analysis of UV-Irradiated HaCaT Cells with EBND

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One piece of dried half-cup EBN material was mounted on a stub and then coated with a thin layer of platinum in an ion sputter (E-1030, HITACHI, Tokyo, Japan). For the 2.5% EBN and EBND solutions, 1.5 µL solutions were dropped on cover glasses and air-dried overnight. The cover glasses were then mounted on the stub followed by ion coating the same as the dried half-cup EBN.
HaCaT cells (8 × 104 cells/mL) were seeded into 35 mm dishes with a cover glass and cultivated for 24 h. Cells were then cultivated with EBND at 125 µg/mL for 2 h. After the medium was removed, cells were air-dried and irradiated with UVA for 5 min (10 J/cm2), and then re-soaked in the medium with EBND. Cells were further cultivated for 48 h. At the end of cultivation, HaCaT cells were pre-fixed for 30 min in 2.5% glutaraldehyde solution in PBS (-). After being washed with PBS (-), specimens were further fixed with 1% osmium tetroxide (OsO4) for 1 h. Samples were then dehydrated with ascending grades of ethanol. The specimens were substituted by t-butylalcohol and freeze-dried with a vacuum evaporator. The dried samples were mounted on stubs followed by ion coating. The preparations were examined at 10–15 kV using an SEM (JSM-IT200 InTouchScope™, JEOL Ltd., Tokyo, Japan) [9 (link)].
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5

Topographical Characterization of Substrates

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Height maps for all substrates were obtained using confocal laser scanning profilometry (VK-X200, Keyence, Osaka, Japan). The profilometry data were processed using the Keyence Multifile Analyzer software and plotted using MATLAB (version 2020a, The Mathworks, Natick, MA, USA). The 2D contact guidance cues were characterized using confocal microscopy (TCS SP8X confocal microscope, 10× 0.4 NA objective, Leica, Wetzlar, Germany). The 2.5D contact guidance cues were inspected using scanning electron microscopy (SEM) (JSM-IT200 InTouchScope, Jeol, Tokyo, Japan) to qualitatively evaluate the fabrication process. For SEM imaging, samples were sputter-coated with a 10 nm layer of gold (108auto, Cressington, Watford, UK) and affixed to SEM chucks using double-sided carbon tape.
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6

Electrochemical Sensor Characterization of PDA-NPs

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The electrochemical detection system was completed by the transducer (the electrode sensor) and the detector. The transducer was a disposable SPCE with a three-electrode system including a 3-mm working carbon electrode, a carbon counter electrode, and a silver/silver chloride reference electrode. The PalmSens4 potentiostat with PS Trace 5.8 software (PalmSens BV Co., Ltd., Houten, The Netherlands) was used for all electrochemical experiments. The characterization of PDA-NPs was carried out by an Eppendorf BioSpectrometer® fluorescence (Hamburg, Germany), a Bruker TENSOR II ATR-FTIR spectrometer (Bruker, Germany), a transmission electron microscope (TEM, FEI, TECNAI G2 20, Nieuw-Vennep, The Netherlands), a scanning electron microscope (SEM, Jeol, JSM-IT200 InTouchScope™, Tokyo, Japan) and a dynamic light scattering (DLS, Malvern, UK).
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7

Sulfur Nanoparticle Morphology Analysis

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To investigate the morphology of the synthesized sulfur nanoparticles, SEM analysis was performed using a JSM-IT200 InTouchScope™ from JEOL, USA set at a power of 15 kV and magnification of 750-10,000 times (Khairan et al., 2019) .
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