Jsm 6700f microscope

Powder X-ray diffraction (PXRD) (Fangyuan Instrument Co., Ltd., Dandong, China) was tested on a DX2700 diffractometer with a Cu Kα radiation source (λ = 1.5406 nm), with a measurement in 2θ range: 5° to 80°. Scanning electron microscopy (SEM) (Electronics Co., Ltd., Tokyo, Japan) analysis was accomplished on a JEOL JSM-6700F microscope. Transmission electron microscopy (TEM) (Electronics Co., Ltd., Japan) and energy dispersive spectroscopy (EDS) (Electronics Co., Ltd., Japan) characterization were performed on a JEOL JEM-2100F microscope at 200 kV. X-ray photoelectron spectroscopy (XPS) (ThermoFisher, Waltham, MA, USA) analysis was performed on an EscaLab 250Xi electronic spectrometer. Raman spectra were measured using a micro-Raman spectrometer (Renishaw, Wotton-under-Edge, UK) with a laser wavelength of 532 nm at 0.2 mW. A C20001C contact angle meter (Zhongchen Digital Technology Equipment Co., Ltd., Shanghai, China) was used to characterize the surface wettability of samples. UV-vis spectra were recorded in the range of 250–550 nm on a T6-NC (Persee, Beijing, China) spectrophotometer. A JW-BK222 (jingweigaobo, Beijing, China) automated sorption system was used for nitrogen adsorption–desorption measurement. Specific surface area data were obtained by the Brunauer–Emmet–Teller (BET) method.

Field Emission Scanning Electron Microscopy (FESEM) micrographs were taken from a JEOL JSM-6700F microscope. Scanning Electron Microscopy (SEM) micrographs were obtained using a Hitachi SU3500 microscope. Infrared Spectroscopy (IR) spectra were taken by a Nicolet iS5 Attenuated Total Reflectance spectrometer. IR spectra taken using the KBr pellet method used a Jasco FT/IR-4100 infrared spectrometer. Thermogravimetric Analysis (TGA) was measured using a SII TG/DTA7200 instrument. Dynamic Light Scattering (DLS) spectra were taken by an Otsuka ELSZ-2000 Particle size Analyzer. Brunauer–Emmett–Teller Surface Area Analysis (BET) was taken from a Quantachrome NOVA 4200e Surface Area and Pore Size Analyzer. All samples were dried in vacuum at 70 °C for 24 h before BET analysis. X-ray photoelectron spectroscopy (XPS) spectra were taken by a JEOL JPS-9010MC XPS instrument with monochromatic AlKα-radiation. CasaXPS Version 2.3.15 was used for analyzing the C 1s narrow XPS profile. The water contact angle was controlled to drop 1 μm water by DropMaster DM 300. FAMAS was used to analyze the water contact angle images.

The Ag/Ag₂S/CdS heterostructures were characterized using various techniques such as X-ray diffraction (XRD) with a Bruker D2 phaser system (Billerica, MA, USA), field-emission scanning electron microscopy (FESEM) with a JEOL JSM 6700F microscope (Tokyo, Japan), field-emission transmission electron microscopy (FETEM) with a JEOL 2100F microscope (Tokyo, Japan), X-ray photoelectron spectroscopy (XPS) with a ULVAC-PHI PHI 5000 Versaprobe II system (Chigasaki, Japan), photoluminescence spectroscopy (PL) with an MRI532S instrument from Protrustech (Tainan, Taiwan), and UV–vis spectrophotometry with a U-2900 instrument from Hitachi (Tokyo, Japan). These techniques were employed to study the crystal structure, morphology, microstructures, chemical composition, and optical properties of the Ag/Ag₂S/CdS heterostructures.

Voucher specimens were deposited in the herbaria of Beijing Forestry University, Beijing, China (BJFC) and in the Centre for Forest Mycology Research, U.S. Forest Service, Madison, USA (CFMR). Freehand sections were made from dried basidiomata and mounted in 2% (w/v) potassium hydroxide (KOH), 1% phloxine (w/v) or Melzer’s reagent. Microscopic examinations were carried out with a Nikon Eclipse 80i microscope (Nikon Corporation, Japan) at magnifications up to 1000×. Drawings were made with the aid of a drawing tube. All measurements were carried out with sections mounted in Melzer’s reagent. Ornamentations were excluded from the measurements of basidiospores. Scanning electron micrographs (SEM) were taken with a JEOL JSM-6700F microscope (JEOL, Japan). Dried specimens were mounted directly in gold and platinum and examined and photographed at 10.0 kV. Colour names and codes follow Kornerup and Wanscher (1978) . Herbarium code designations are from Index Herbariorum (Thiers, continuously updated ).

The ¹H NMR spectroscopy were applied on a Bruker DRX-400 spectrometer using D₂O with concentration of 10 mg/ml. Scanning electron microscopy (SEM) images were obtained on a JSM-6700F microscope (JEOL, Japan), and the morphologies of the hydrogel surfaces were observed at an accelerating voltage of 10 kV. The freeze-dried samples were sputter-coated with a thin layer of Pt for 90 s to make the conductive sample before testing. The compressive profiles of GelMA@OSA and GelMA@OSA-ALN hydrogels were measured with a beam velocity of 1 mm/min using a testing machine of Instron 3,365. The diameter and thickness of cylindrical samples were 10 mm and 5 mm, respectively. Five samples were measured for each group. Confocal laser scanning microscopy (CLSM) image was obtained on a Zeiss LSM 510 microscope. The ALN release was measured by high performance liquid chromatography (HPLC) on a Shimadzu LC-20AT system with UV detection at 266 nm.

X‐ray diffraction (XRD) patterns were obtained on a Bruker D2 Phaser X‐Ray Diffractometer with Ni filtered Cu Kα radiation (λ = 1.5406 Å) at a voltage of 30 kV and a current of 10 mA. Field‐emission scanning electron microscope (FESEM) images were obtained by a JEOL JSM‐6700F microscope operated at 5 kV. Transmission electron microscope (TEM) images were recorded by JEOL JEM‐2010 and JEOL JEM‐2100F microscopes. Thermogravimetric analysis (TGA) was carried out under air flow of 200 mL min⁻¹ with a temperature ramp of 10 °C min⁻¹. Nitrogen sorption measurement was acquired on Autosorb 6B at –196 °C.