All used chemicals in present work, were bought from Merck and Sigma-Aldrich companies. In order to show the correct construction of the Alg@SBA-15/Fe3O4 catalyst and its characteristics, several analyses were used. A Shimadzu IR-470 spectrometer was used to get Fourier-transform infrared (FT-IR) spectra of the samples. Energy dispersive X-ray analysis (EDX) of the neat materials and prepared samples was performed employing a Numerix DXP-X10P and TESCAN, MIRA II. The morphology and surface property of neat materials and prepared compounds were examined with the help of images obtained from FESEM (model KYKY-EM8000). By employing a Lakeshore 7407, the magnetic behavior of the samples was studied at ambient temperature. By utilizing an STA504 device, thermal stability of compounds was assessed by TGA. The produced samples' X-ray diffraction (XRD) pattern was achieved utilizing an X-ray diffractometer (JEOL JDX-8030 (20 mA, 30 kV)). The N2 adsorption–desorption isotherm of this study was also obtained using Micromeritics ASAP 2010. Also, a, KQ-250 DE (40 kHz) device was utilized as an ultrasound cleaning bath.
Ir 470 spectrometer
Manufactured by Shimadzu
Sourced in Japan
The IR-470 is a Fourier Transform Infrared (FTIR) spectrometer from Shimadzu. It is designed to analyze the molecular composition and structure of a wide range of materials by measuring their infrared absorption or transmission spectra. The IR-470 provides accurate and reliable data for applications in various industries, including chemistry, materials science, and life sciences.
Automatically generated - may contain errors
Lab products found in correlation
Jdx 8030, by JEOL (5 mentions)
Avance drx 500 spectrometer, by Bruker (5 mentions)
Cm200, by Philips (3 mentions)
Avance drx 400 spectrometer, by Bruker (2 mentions)
Dxp x10p, by TESCAN (1 mentions)
Asap 2010, by Micromeritics (1 mentions)
Avance drx 300, by Bruker (1 mentions)
Cm120, by Philips (1 mentions)
Drx 500 spectrometer, by Bruker (1 mentions)
S 4160 microscope, by Hitachi (1 mentions)
D8 advance, by Bruker (1 mentions)
D8 advance x ray diffractometer, by Bruker (1 mentions)
Jms 700 high resolution mass spectrometer, by JEOL (1 mentions)
Em10c 100 kv, by Zeiss (1 mentions)
Avance drx 400, by Bruker (1 mentions)
Drx 300 avance spectrometer, by Bruker (1 mentions)
Nano zsp, by Malvern Panalytical (1 mentions)
Facscalibur, by BD (1 mentions)
Xd 3a, by Shimadzu (1 mentions)
Unity inova 500 mhz, by Bruker (1 mentions)
29 protocols using ir 470 spectrometer
1
Alg@SBA-15/Fe3O4 Catalyst Characterization
2
Comprehensive Characterization of Nanomaterials
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The solvents, chemicals, and reagents were purchased from various commercial companies such as Merck, Sigma-Aldrich, and Fluka and were used as received. Analytical thin-layer chromatography (TLC) was performed using Merck silica gel GF254 plates. IR spectra were measured with a Shimadzu IR-470 spectrometer. The NMR spectra were recorded with a Bruker DRX-300 AVANCE instrument (300 MHz for 1H and 75.4 MHz for 13C). X-ray diffraction (XRD) patterns of the solid powders were recorded with a JEOL JDX-8030 (30 kV, 20 mA). Thermal analysis was taken by Bahr-STA 504 instrument under the air atmosphere. Morphological investigations were studied by field-emission scanning electron microscopy (FE-SEM, MIRA 3
TESCAN). EDX analysis was recorded on Numerix DXP-X10P. The transmission electron microscopy (TEM) was provided on a Philips CM200.
TESCAN). EDX analysis was recorded on Numerix DXP-X10P. The transmission electron microscopy (TEM) was provided on a Philips CM200.
3
Synthesis and Characterization of Nanocatalysts
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All consumed chemicals, reagents and solvents were bought from Sigma Aldrich and Merck companies. Monitoring the progress of catalytic reactions was done by thin-layer chromatography (TLC). Melting points of all synthesized derivatives were measured with an Electrothermal 9100 apparatus. FT-IR spectra were recorded on a Shimadzu IR-470 spectrometer in the range of 400 to 4000 cm−1 by KBr pellets. 1H and 13C NMR spectra were recorded on a Bruker DRX-500 spectrometer at 500 and 125 MHz, respectively. Elemental analysis of prepared samples was performed by EDX analysis recorded on Numerix JEOL-JDX 8030 (30 kV, 20 mA). The XRD pattern of the fabricated composites were obtained by Bruker D8 Advance X-ray diffractometer. The morphology and structure of the nanocatalyst were studied by SEM, VEGA2 TESCAN instrument. TEM image was achieved by a Philips CM120 instrument. The magnetic properties of the prepared samples were identified at room temperature using VSM analysis, accomplished by LBKFB model-magnetic Kashan Kavir, thermogravimetric analysis (TGA) was performed using a Bahr-STA 504 instrument, and Eager 300 for EA1112 was used for CHNS analysis.
4
Moxifloxacin-Excipient Interaction Analysis
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To analyze the possible interaction of Moxifloxacin (Mox) with formulation excipients, pure Mox, drug excipients (Cholestrol), synthesized amphiphilic molecule (DC-Met-10), and drug-loaded niosomal formulations (Mox-Met-Lip, SUL-Met-Lip, and empty vesicle (Met-Lip)) were mixed with a KBr disc and pressed to form a self-supporting disk. Spectra were scanned in the range of 400–4000 cm−1 with an IR-470 spectrometer (Shimadzu, Kyoto, Japan) [7 (link)].
5
Characterization of Nanocomposite Catalyst
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All solvents, chemicals, and reagents were purchased from Merck, Sigma and Aldrich. Thin-layer chromatography (TLC) was used to monitor the progress of catalytic reactions. Melting points were measured with an Electrothermal 9100 apparatus. FT‐IR spectra were recorded on a Shimadzu IR‐470 spectrometer using KBr pellets. Elemental analysis of the nanocatalyst was carried out by EDX analysis recorded on Numerix JEOL-JDX 8030 (30 kV, 20 mA). XRD pattern of nanocomposite was recorded on an X′ Pert Pro X-ray diffractometer operating at 40 mA current and 40 kV. 1H and 13C NMR spectra were recorded on a Bruker DRX‐500 Avance spectrometer at 500 and 125 MHz, respectively. The morphology and structure of the nanocatalyst were examined by FE-SEM, MIRA3 TESCAN. TEM measurements were carried out on a Zeiss-EM10C-100 kV analyzer to prove the core–shell structure of the nanocomposite. The magnetic properties of the samples were detected at room temperature using a VSM of Meghnatis Daghigh Kavir.
6
Characterization of Silver Nanoparticles
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The powder of plant extract, AgNPs, CS-AgNPs or Cefotaxime-CS-AgNPs were collected using centrifuge at 15,000×g for 20 min. Consequently, the residue was then washed with de-ionized water to eliminate unattached biological components. Also, the samples were performed on a Shimadzu IR-470 Spectrometer (Shimadzu, Japan). The AgNPs, CS-AgNPs or Cefotaxime-CS-AgNPs peaks of FTIR were evaluated and expressed in wave numbers (cm−1). Cefotaxime was also analyzed.31 (link)
7
Nanoparticle Surface Analysis by FTIR
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Fourier transformed infrared (FT-IR, IR-470 spectrometer (Shimadzu, Kyoto, Japan)) analysis was performed in order to elucidate the possible drug entrapment and surface functionalization. The powdered nanoparticles (2 mg) were mixed with KBr and subjected to high pressure of 200 Psi to obtain self-supporting disks.
8
Comprehensive Characterization of Solid Samples
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The solvents, chemicals and reagents were purchased from Merck, Fluka and Aldrich chemical companies and were used without further purification. The melting points were measured on an Electrothermal 9100 apparatus. The IR spectra were recorded on a Shimadzu IR-470 spectrometer in KBr pellets procedures. Scanning electron microscopy (SEM) images were taken with VEGA2 TESCAN, the statistical data of particle sizes from FE-SEM imaging was obtained by Digimizer software. The X-ray (EDX) analysis was recorded with a Numerix DXP–X10P. Thermal analysis was performed by Bahr-STA 504 instrument in the air atmosphere. XRD patterns of the solid powders were developed using a JEOL JDX–8030 (30 kV, 20 mA), the NMR spectra were recorded by Bruker DRX-300 Advance instrument (300 MHz for HNMR and 75.4 MHz for CNMR) while DMSO was used as a solvent. The chemical shifts are given in parts per million (ppm), and the coupling constants (J) are reported in hertz (Hz) scales. Merck starch gel GF254 plates were used for the analytical thin-layer chromatography (TLC) procedure.
9
FT-IR Analysis of Drug-Loaded Nanoparticles
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Fourier transformed infrared (FT-IR, IR-470 spectrometer (Shimadzu, Kyoto, Japan)) analysis was performed in order to elucidate the possible drug entrapment and surface functionalization. Small amounts of powdered nanoparticles were mixed with KBr and subjected to a high pressure of 200 Psi to obtain self-supporting disks.
10
Characterization of Nanocatalysts
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Pure materials such as solvents, metallic salts and chemical compounds were procured from Merck companies. The FE-SEM images were taken by using a Hitachi S-4160 microscope. The FT-IR spectrum was acquired using a Shimadzu IR-470 spectrometer with a KBr pellet. X-ray diffraction (XRD) was performed by using a D8 Advance model made via Bruker. Numerix DXP-X10P reported the EDX analysis of the nanocatalyst.
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