XRD measurements were performed using a diffractometer with a Bragg-Brentano mounting employing Cu-Kα radiation (wavelength of 1.54 ) produced by a rotating anode. The scanning was set up and programmed in the following way:
test samples were analysed over a 2θ range from 30° to 55°, using an increment step size of 0.04°, with a counting time of 0.5 seconds at each step;
angular scans were run for each file between temperatures of T (minimum) = −180°C and T (max) = 100°C (cooling and heating).