S 4800 2 sem
The S-4800-II SEM is a scanning electron microscope (SEM) manufactured by Hitachi. It is a versatile instrument designed for high-resolution imaging and analysis of a wide range of samples. The S-4800-II SEM utilizes a field emission electron source to provide high-brightness electron beams, enabling detailed examination of specimens at the nanometer scale.
Lab products found in correlation
8 protocols using s 4800 2 sem
Nanomaterial Characterization by Electron Microscopy
Lyophilization of LZ Hydrogels
Osmium Coating for SEM Imaging
was performed with a Hitachi S4800–II SEM. Electrospun samples
were coated with 50 nm of osmium from an osmium tetroxide source using
a Filgen Osmium Coater. This coating helped prevent charging of the
sample inside the SEM.
Freeze-drying of LZ Hydrogels
Organoid Analysis by Microscopy
Cell viability was also assessed after 14 and 21 days using Live/Dead assay kit (Life Technologies, Paisley, UK), in which cells were stained with calcein acetoxymethyl (0.1 μg/ml) and propidium iodide (1 μg/ml) and viewed by fluorescence microscopy.
Scanning Electron Microscopy Specimen Preparation
Microstructural Analysis of Gel Samples
Characterization of COA/NAVI Particles
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