The secondary structure of haem (5 mg/mL) was analysed using VERTEX 70 FTIR spectroscopy (BRUKER, Karlsruhe, Germany). The dispersion medium was deionised water. Scanning was performed using a scanning infrared spectrometer at points between 400 and 4000 cm−1. Subsequently, data between 1600 and 1700 cm−1 were extracted for a Gaussian fit using Peakfit 4.12 software (Systat Software Inc., California, USA). The contents of the α-helix, β-sheet, β-turn and random coil were then calculated (Zhao, et al., 2021 (link)).
Vertex 70 ftir spectroscopy
Manufactured by Bruker
Sourced in Germany
The VERTEX 70 is a Fourier Transform Infrared (FTIR) spectrometer designed for laboratory use. It provides high-resolution infrared spectroscopy capabilities to support various analytical applications. The instrument's core function is to measure the absorption or transmission of infrared radiation by a sample, generating a spectrum that can be used to identify and quantify the chemical components present.
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Lab products found in correlation
2 protocols using vertex 70 ftir spectroscopy
1
Haem Secondary Structure Analysis
2
Comprehensive Material Characterization Protocol
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Morphological analysis was carried out on a SUPRA 55vp ZEISS field emission scanning electron microscopy (Oberkochen, Germany), while element mapping were obtained using a corresponding energy dispersive X-ray (EDX) spectra. Elemental analysis was carried out on Elementar vario MICRO cube elemental analyzer (Frankfurt, Germany). Carbon, hydrogen, nitrogen, and sulfur content (% CHNS) was determined by combustible analysis using a thermal conductivity detector. Differential scanning calorimetry (DSC), thermogravimetry analysis (TGA), and derivative thermogravimetry (DTG) were heated under nitrogen to 800 °C at a heating rate of 10 °C min−1 using a simultaneous thermal analyzer Setaram Labsys Evolution (Lyons, France). Fourier-transform infrared spectroscopy (FT-IR) was performed using a Bruker VERTEX-70 FT-IR spectroscopy (Ettlingen, Germany), between 650 cm−1 to 4000 cm−1. Raman spectra was acquired using a Horiba Scientific Raman microscope (Paris, France) at an excitation laser wavelength of 532 nm with a 50X objective.
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