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Ec 400

Manufactured by JEOL

The JEOL EC-400 is a high-resolution scanning electron microscope (SEM) capable of producing detailed images of small-scale structures and features. It utilizes an electron beam to scan the surface of a sample, providing a magnified view at a high level of detail. The EC-400 is designed for a wide range of applications in materials science, nanotechnology, and other research fields requiring advanced microscopic analysis.

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2 protocols using ec 400

1

NMR and Mass Spectrometry Characterization

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The 1H, 13C NMR spectra were recorded on JEOL EC-400, EC-500, and EC-600 spectrometers using a residual solvent peak as a reference. Compounds for HRMS were analyzed by positive mode electrospray ionization (CI or ESI) using an Agilent QTOF mass spectrometer in the Mass Spectrometry Facility (MSF) of the Department of Chemistry and Biochemistry of University of Texas–Austin. Column chromatography was performed using 60 A silica gel. Reagents and starting materials were purchased from commercial vendors and used without further purification unless noted otherwise.
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2

Comprehensive NMR and Mass Spectrometry Analysis

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The 1H and 13C NMR spectra were recorded on JEOL EC-400, EC-500, and EC-600 spectrometers using the residual solvent peak as a reference. Compounds for HRMS were analyzed by positive-mode electrospray ionization (CI or ESI) using Agilent QTOF mass spectrometer in the Mass Spectrometry Facility (MSF) of the Department of Chemistry and Biochemistry of the University of Texas, Austin. IR spectra were obtained using a ThermoScientific Nicolet iS10 FT-IR spectrometer. Column chromatography was performed using 60 Å silica gel. Reagents and starting materials were purchased from commercial vendors and used without further purification. Ozonolysis was conducted using Ozone Solution OZV-8 ozone generator and oxygen (oxygen, Matheson, 99.98%). The amount of ozone was regulated by flow rate and the 10-position switch integrated into the device (intensity 1–10).
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